|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
Potapov, P.L.; Schryvers, D. |
Measuring the absolute position of EELS ionisation edges in a TEM |
2004 |
Ultramicroscopy |
99 |
29 |
UA library record; WoS full record; WoS citing articles |
|
|
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. |
Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? |
2003 |
Ultramicroscopy |
98 |
26 |
UA library record; WoS full record; WoS citing articles |
|
|
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
Optimal experimental design of STEM measurement of atom column positions |
2002 |
Ultramicroscopy |
90 |
35 |
UA library record; WoS full record; WoS citing articles |
|
|
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. |
Does a monochromator improve the precision in quantitative HRTEM? |
2001 |
Ultramicroscopy |
89 |
22 |
UA library record; WoS full record; WoS citing articles |
|
|
Gorji, S.; Kashiwar, A.; Mantha, L.S.; Kruk, R.; Witte, R.; Marek, P.; Hahn, H.; Kübel, C.; Scherer, T. |
Nanowire facilitated transfer of sensitive TEM samples in a FIB |
2020 |
Ultramicroscopy |
219 |
|
UA library record |
|
|
Leuthner, G.T.; Hummel, S.; Mangler, C.; Pennycook, T.J.; Susi, T.; Meyer, J.C.; Kotakoski, J. |
Scanning transmission electron microscopy under controlled low-pressure atmospheres |
2019 |
Ultramicroscopy |
203 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
Susi, T.; Madsen, J.; Ludacka, U.; Mortensen, J.J.; Pennycook, T.J.; Lee, Z.; Kotakoski, J.; Kaiser, U.; Meyer, J.C. |
Efficient first principles simulation of electron scattering factors for transmission electron microscopy |
2019 |
Ultramicroscopy |
197 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
Pennycook, T.J.; Martinez, G.T.; Nellist, P.D.; Meyer, J.C. |
High dose efficiency atomic resolution imaging via electron ptychography |
2019 |
Ultramicroscopy |
196 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
Grieb, T.; Tewes, M.; Schowalter, M.; Müller-Caspary, K.; Krause, F.F.; Mehrtens, T.; Hartmann, J.-M.; Rosenauer, A. |
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation |
2018 |
Ultramicroscopy |
184 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
Vatanparast, M.; Egoavil, R.; Reenaas, T.W.; Verbeeck, J.; Holmestad, R.; Vullum, P.E. |
Bandgap measurement of high refractive index materials by off-axis EELS |
2017 |
Ultramicroscopy |
182 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
Grieb, T.; Krause, F.F.; Mahr, C.; Zillmann, D.; Müller-Caspary, K.; Schowalter, M.; Rosenauer, A. |
Optimization of NBED simulations for disc-detection measurements |
2017 |
Ultramicroscopy |
181 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
Javon, E.; Lubk; Cours, R.; Reboh, S.; Cherkashin, N.; Houdellier, F.; Gatel, C.; Hytch, M.J. |
Dynamical effects in strain measurements by dark-field electron holography |
2014 |
Ultramicroscopy |
147 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
Niermann, T.; Verbeeck, J.; Lehmann, M. |
Creating arrays of electron vortices |
2014 |
Ultramicroscopy |
136 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
Béché, A.; Rouviere, J.L.; Barnes, J.P.; Cooper, D. |
Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography |
2013 |
Ultramicroscopy |
131 |
73 |
UA library record; WoS full record; WoS citing articles |
|
|
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
Direct structure inversion from exit waves : part 2 : a practical example |
2012 |
Ultramicroscopy |
116 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
Tan, H.; Verbeeck, J.; Abakumov, A.; Van Tendeloo, G. |
Oxidation state and chemical shift investigation in transition metal oxides by EELS |
2012 |
Ultramicroscopy |
116 |
413 |
UA library record; WoS full record; WoS citing articles |
|
|
Lobato, I.; van Dyck, D. |
Improved multislice calculations for including higher-order Laue zones effects |
2012 |
Ultramicroscopy |
119 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
Roelandts, T.; Batenburg, K.J.; Biermans, E.; Kübel, C.; Bals, S.; Sijbers, J. |
Accurate segmentation of dense nanoparticles by partially discrete electron tomography |
2012 |
Ultramicroscopy |
114 |
34 |
UA library record; WoS full record; WoS citing articles |
|
|
Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. |
Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? |
2012 |
Ultramicroscopy |
114 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
Goris, B.; van den Broek, W.; Batenburg, K.J.; Heidari Mezerji, H.; Bals, S. |
Electron tomography based on a total variation minimization reconstruction technique |
2012 |
Ultramicroscopy |
113 |
171 |
UA library record; WoS full record; WoS citing articles |
|
|
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
A method to determine the local surface profile from reconstructed exit waves |
2011 |
Ultramicroscopy |
111 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
Goris, B.; Bals, S.; van den Broek, W.; Verbeeck, J.; Van Tendeloo, G. |
Exploring different inelastic projection mechanisms for electron tomography |
2011 |
Ultramicroscopy |
111 |
21 |
UA library record; WoS full record; WoS citing articles |
|
|
Verbeeck, J.; Bertoni, G.; Lichte, H. |
A holographic biprism as a perfect energy filter? |
2011 |
Ultramicroscopy |
111 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
Xu, Q.; Zandbergen, H.W.; van Dyck, D. |
Applying an information transmission approach to extract valence electron information from reconstructed exit waves |
2011 |
Ultramicroscopy |
111 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
Heidari Mezerji, H.; van den Broek, W.; Bals, S. |
A practical method to determine the effective resolution in incoherent experimental electron tomography |
2011 |
Ultramicroscopy |
111 |
26 |
UA library record; WoS full record; WoS citing articles |
|
|
Béché, A.; Rouvière, J.L.; Barnes, J.P.; Cooper, D. |
Dark field electron holography for strain measurement |
2011 |
Ultramicroscopy |
111 |
31 |
UA library record; WoS full record; WoS citing articles |
|
|
van den Broek, W.; Van Aert, S.; Goos, P.; van Dyck, D. |
Throughput maximization of particle radius measurements by balancing size and current of the electron probe |
2011 |
Ultramicroscopy |
111 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
Van Aert, S.; Chen, J.H.; van Dyck, D. |
Linear versus non-linear structural information limit in high-resolution transmission electron microscopy |
2010 |
Ultramicroscopy |
110 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
Hadermann, J.; Abakumov, A.M.; Tsirlin, A.A.; Filonenko, V.P.; Gonnissen, J.; Tan, H.; Verbeeck, J.; Gemmi, M.; Antipov, E.V.; Rosner, H. |
Direct space structure solution from precession electron diffraction data: resolving heavy and light scatterers in Pb13Mn9O25 |
2010 |
Ultramicroscopy |
110 |
24 |
UA library record; WoS full record; WoS citing articles |
|
|
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
Direct structure inversion from exit waves: part 1: theory and simulations |
2010 |
Ultramicroscopy |
110 |
25 |
UA library record; WoS full record; WoS citing articles |
|