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Electron-diffraction structure refinement of Ni4Ti3 precipitates in Ni52Ti48”. Tirry W, Schryvers D, Jorissen K, Lamoen D, Acta crystallographica: section B: structural science 62, 966 (2006). http://doi.org/10.1107/S0108768106036457
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Electron-energy-loss spectra of NiO”. Dobysheva LV, Potapov PL, Schryvers D, Physical review : B : condensed matter and materials physics 69, 184404 (2004). http://doi.org/10.1103/PhysRevB.69.184404
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Electron-irradiation-facilitated production of chemically homogenized nanotwins in nanolaminated carbides”. Zhang H, Jin Q, Hu T, Liu X, Zhang Z, Hu C, Zhou Y, Han Y, Wang X, Journal of Advanced Ceramics 12, 1288 (2023). http://doi.org/10.26599/JAC.2023.9220757
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Electron-irridation-induced martensitic transformation in a Ni63Al37 observed in-situ by HREM”. Muto S, Schryvers D, MRS Japan: shape memory materials 18, 853 (1993)
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Electron-microscopy and the structural studies of superconducting materials and fullerites”. Van Tendeloo G, Amelinckx S, NATO Advanced Study Institutes series: series E : applied sciences T2 –, NATO Advanced Study Institute on Materials and crystallographic Aspects, of HT(c)-Superconductivity, May 17-30, 1993, Erice, Italy , 521 (1994)
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Electron-microscopy investigation of superconducting la2cu(o, f)4+y oxyfluoride”. Weill, Chevalier, Chambon, Tressaud, Darriet, Etourneau, Van Tendeloo G, European journal of solid state and inorganic chemistry 30, 1095 (1993)
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Electronic and chemical properties of nickel oxide thin films and the intrinsic defects compensation mechanism”. Poulain R, Lumbeeck G, Hunka J, Proost J, Savolainen H, Idrissi H, Schryvers D, Gauquelin N, Klein A, ACS applied electronic materials 4, 2718 (2022). http://doi.org/10.1021/ACSAELM.2C00230
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Electronic band structures and native point defects of ultrafine ZnO nanocrystals”. Zeng Y-J, Schouteden K, Amini MN, Ruan S-C, Lu Y-F, Ye Z-Z, Partoens B, Lamoen D, Van Haesendonck C, ACS applied materials and interfaces 7, 10617 (2015). http://doi.org/10.1021/acsami.5b02545
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Electronic Coupling between Graphene and Topological Insulator Induced Anomalous Magnetotransport Properties”. Zhang L, Lin B-C, Wu Y-F, Wu H, Huang T-W, Chang C-R, Ke X, Kurttepeli M, Tendeloo GV, Xu J, Yu D, Liao Z-M, ACS nano 11, 6277 (2017). http://doi.org/10.1021/acsnano.7b02494
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Electronic reconstruction at n-type SrTiO3/LaAlO3 interfaces”. Verbeeck J, Bals S, Lamoen D, Luysberg M, Huijben M, Rijnders G, Brinkman A, Hilgenkamp H, Blank DHA, Van Tendeloo G, Physical review : B : condensed matter and materials physics 81, 085113 (2010). http://doi.org/10.1103/PhysRevB.81.085113
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Electronic structure and band gap of zinc spinel oxides beyond LDA : ZnAl2O4, ZnGa2O4 and ZnIn2O4”. Dixit H, Tandon N, Cottenier S, Saniz R, Lamoen D, Partoens B, van Speybroeck V, Waroquier M, New journal of physics 13, 063002 (2011). http://doi.org/10.1088/1367-2630/13/6/063002
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Electronic structure of Pd nanoparticles on carbon nanotubes”. Felten A, Ghijsen J, Pireaux J-J, Drube W, Johnson RL, Liang D, Hecq M, Van Tendeloo G, Bittencourt C, Micron 40, 74 (2009). http://doi.org/10.1016/j.micron.2008.01.013
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Electronic structure of transparent oxides with the Tran-Blaha modified Becke-Johnson potential”. Dixit H, Saniz R, Cottenier S, Lamoen D, Partoens B, Journal of physics : condensed matter 24, 205503 (2012). http://doi.org/10.1088/0953-8984/24/20/205503
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Electronic structure, screening and charging effects at a metal/organic tunneling junction: a first principles study”. Lamoen D, Ballone P, Parrinello M, Physical review B 54, 5097 (1996)
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Electronically coupled complementary interfaces between perovskite band insulators”. Huijben M, Rijnders G, Blank DHA, Bals S, Van Aert S, Verbeeck J, Van Tendeloo G, Brinkman A, Hilgenkamp H, Nature materials 5, 556 (2006). http://doi.org/10.1038/nmat1675
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Electronically decoupled stacking fault tetrahedra embedded in Au(111) films”. Schouteden K, Amin-Ahmadi B, Li Z, Muzychenko D, Schryvers D, Van Haesendonck C, Nature communications 7, 14001 (2016). http://doi.org/10.1038/ncomms14001
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Electrophoretic deposition as a fabrication method for Li-ion battery electrodes and separators : a review”. Hajizadeh A, Shahalizade T, Riahifar R, Yaghmaee MS, Raissi B, Gholam S, Aghaei A, Rahimisheikh S, Ghazvini AS, Journal of power sources 535, 231448 (2022). http://doi.org/10.1016/J.JPOWSOUR.2022.231448
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Electrorheological fluids with high shear stress based on wrinkly tin titanyl oxalate”. Wu J, Zhang L, Xin X, Zhang Y, Wang H, Sun A, Cheng Y, Chen X, Xu G, ACS applied materials and interfaces 10, 6785 (2018). http://doi.org/10.1021/ACSAMI.8B00869
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Electrostatic force-driven oxide heteroepitaxy for interface control”. Ren Z, Wu M, Chen X, Li W, Li M, Wang F, Tian H, Chen J, Xie Y, Mai J, Li X, Lu X, Lu Y, Zhang H, Van Tendeloo G, Zhang Z, Han G, Advanced materials 30, 1707017 (2018). http://doi.org/10.1002/ADMA.201707017
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Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X‐ray Spectroscopy”. De Backer A, Zhang Z, van den Bos KHW, Bladt E, Sánchez‐Iglesias A, Liz‐Marzán LM, Nellist PD, Bals S, Van Aert S, Small methods , 2200875 (2022). http://doi.org/10.1002/smtd.202200875
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Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination”. Şentürk DG, De Backer A, Van Aert S, Ultramicroscopy 259, 113941 (2024). http://doi.org/10.1016/j.ultramic.2024.113941
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Element Specific Monolayer Depth Profiling”. Macke S, Radi A, Hamann-Borrero JE, Verna A, Bluschke M, Brück S, Goering E, Sutarto R, He F, Cristiani G, Wu M, Benckiser E, Habermeier H-U, Logvenov G, Gauquelin N, Botton GA, Kajdos AP, Stemmer S, Sawatzky GA, Haverkort MW, Keimer B, Hinkov V, Advanced Materials 26, 6554 (2014). http://doi.org/10.1002/adma.201402028
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ELNES study of carbon K-edge spectra of plasma deposited carbon films”. Hamon A-L, Verbeeck J, Schryvers D, Benedikt J, van den Sanden RMCM, Journal of materials chemistry 14, 2030 (2004). http://doi.org/10.1039/b406468m
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Elucidation of the Growth Mechanism of Sputtered 2D Hexagonal Boron Nitride Nanowalls”. Hoang D-Q, Pobedinskas P, Nicley SS, Turner S, Janssens SD, Van Bael MK, D'Haen J, Haenen K, Crystal growth &, design 16, 3699 (2016). http://doi.org/10.1021/ACS.CGD.6B00191
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EM characterization of precipitates in as-cast and annealed Ni45.5Ti45.5Nb9 shape memory alloys”. Shi H, Frenzel J, Schryvers D, Materials science forum 738/739, 113 (2013). http://doi.org/10.4028/www.scientific.net/MSF.738-739.113
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EM investigation of precursors and precipitation in a Ni39.6Mn47.5Ti12.9 alloy”. Seo JW, Schryvers D, Vermeulen W, Richard O, Potapov P, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 79, 1279 (1999)
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EM study of sensitisation of silver halide grains”. Buschmann V, Schryvers D, van Landuyt J, van Roost C, Icem 13 (1994)
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EM study of twinning in the Ni5Al3 bainitic phase”. Schryvers D, Ma Y, Toth L, Tanner LE, Twinning in advanced materials , 395 (1993)
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EM, XPS and LEED study of deposition of Ag on hydrogenated Si substrate prepared by wet chemical treatments”. Zhang XB, Vasiliev AL, Van Tendeloo G, He Y, Yu L-M, Thiry PA, Surface science : a journal devoted to the physics and chemistry of interfaces 340, 317 (1995). http://doi.org/10.1016/0039-6028(95)00699-0
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Skorikov A, Heyvaert W, Albrecht W, Pelt DM, Bals S (2021) EMAT Simulated 3D Nanoparticle Structures Dataset
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