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Analise de solos por meio de fluorescencia de raios-X nao-dispersiva”. Costa Dantas C, Da Silveira Dantas H, Van 't dack L, Van Grieken R, Química nova 4, 110 (1981)
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Analisis cuantitativo sin estandares de particulas individuales mediante microsonda de electrones”. Trincavelli JC, Van Grieken R page 273 (1996).
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Analiza pierwiastkowa zabytkowych obiektów szklanych”. Wagner B, Nowak A, Bulska E, Kunicki-Goldfinger J, Schalm O, Janssens K, Nauka i Zabytki , 71 (2008)
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Analogy between one-dimensional chain models and graphene”. Matulis A, Peeters FM, American journal of physics 77, 595 (2009). http://doi.org/10.1119/1.3127143
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Van Grieken R (1973) Analyse van ferro-metalen door activering met 14 MeV neutronen. 128 p
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Analyses of petrified wood by electron, X-ray and optical microprobes”. Kuczumov A, Vekemans B, Schalm O, Dorriné, W, Chevallier P, Dillmann P, Ro C-U, Janssens K, Van Grieken R, Journal of analytical atomic spectroscopy 14, 435 (1999). http://doi.org/10.1039/A806748A
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Analysis and comparison of the co2 and co dielectric barrier discharge solid products”. Belov I, Paulussen S, Bogaerts A, Hakone Xv: International Symposium On High Pressure Low Temperature Plasma Chemistry: With Joint Cost Td1208 Workshop: Non-equilibrium Plasmas With Liquids For Water And Surface Treatment (2016)
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Analysis and synthesis of supershaped dielectric lens antennas”. Bia P, Caratelli D, Mescia L, Gielis J, IET microwaves, antennas and propagation 9, 1497 (2015). http://doi.org/10.1049/IET-MAP.2015.0091
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Analysis of 3D elemental distribution in nanomaterials : towards higher throughput and dose efficiency”. Skorikov A, Batenburg KJ, Bals S, Journal of microscopy 289, 157 (2023). http://doi.org/10.1111/JMI.13167
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Analysis of biological materials from Tanzania by total reflection X-ray fluorescence (TXRF) analysis”. Koleleni YIA, Van Grieken R, Tanzania journal of science 16, 143 (1990)
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Analysis of C60 and C70 oxides by HPLC and low- and high-energy collision-induced dissocation tandem mass spectrometry”. van Cleempoel A, Gijbels R, van den Heuvel H, Claeys M, Proceedings Symposium on Recent Advances in the Chemistry and Physics of Fullerenes and Related Materials, 191th Meeting of the Electrochemical Society, Montreal, Canada, 4-9 May 1997 4, 783 (1997)
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Analysis of composite structure and primordial wood remains in petrified wood”. Nowak J, Nowak D, Chevallier P, Lekki J, Van Grieken R, Kuczumov A, Applied spectrsocopy 61, 889 (2007). http://doi.org/10.1366/000370207781540141
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Analysis of façon-de-Venise glass originating from Central and Western Europe”. Šmit Ž, Janssens K, Schalm O, Kos M page 165 (2005).
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Analysis of geothermal waters by spark source mass spectrometry”. Vandelannoote R, Blommaert W, Gijbels R, van Grieken R, Fresenius' Zeitschrift für analytische Chemie 309, 291 (1981). http://doi.org/10.1007/BF00488604
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Analysis of heterogeneous CaCO3-CaSO4 single particles using ultra-thin window EPMA”. Ro C-U, Oh K-Y, Van Grieken RE, (2000)
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Analysis of individual aerosol particles in Siberian region: provisional results”. van Malderen H, Van Grieken R, Khodzher TV, Bufetov NS, Koutsenogii KP, Atmospheric and oceanic optics 7, 622 (1994)
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Analysis of individual environmental particles using ultra-thin window EPXMA”. Ro C-U, Osán J, Van Grieken R, (1998)
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Analysis of individual microscopic particles by means of synchrotron radiation induced X-ray micro fluorescence”. Janssens K, Adams F, Rivers ML, Jones KW, Proceedings 27th MAS (1992)
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Analysis of indoor gaseous formic and acetic acid, using radial diffusive samplers”. Stranger M, Potgieter-Vermaak S, Sacco P, Quaglio F, Pagani D, Cocheo C, Godoi AFL, Van Grieken R, Environmental monitoring and assessment 149, 411 (2009). http://doi.org/10.1007/S10661-008-0217-6
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Analysis of internal stress build-up during deposition of nanocrystalline Ni thin films using transmission electron microscopy”. Lumbeeck G, Delvaux A, Idrissi H, Proost J, Schryvers D, Thin solid films : an international journal on the science and technology of thin and thick films 707, 138076 (2020). http://doi.org/10.1016/j.tsf.2020.138076
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Analysis of lateritic material from Cerro impacto by instrumental neutron activation employing a low-energy photon semiconductor and a high-energy Ge(Li) detector”. LaBrecque JJ, Beusen JM, Van Grieken RE, Applied spectroscopy 40, 140 (1986). http://doi.org/10.1366/0003702864509600
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Analysis of Malagasy medical herbs by X-ray fluorescence in total reflectivity”. Razafindramisa FL, Andriambololona R, Brunel M, Van Grieken RE, Journal de physique: 4 6, 833 (1996)
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Analysis of micro computed tomography images, a look inside historic enamelled metal objects”. van der Linden V, Van de Casteele E, Thomas MS, de Vos A, Janssen E, Janssens K, Applied physics A : materials science &, processing 98, 385 (2010). http://doi.org/10.1007/S00339-009-5394-9
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Analysis of nonconducting materials by dc glow discharge spectrometry”. Bogaerts A, Schelles W, van Grieken R Wiley, Chichester, page 293 (2003).
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Analysis of pattern formation in systems with competing range interactions”. Zhao HJ, Misko VR, Peeters FM, New journal of physics 14, 063032 (2012). http://doi.org/10.1088/1367-2630/14/6/063032
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Analysis of platinum powder by glow discharge mass spectrometry”. van Straaten M, Swenters K, Gijbels R, Verlinden J, Adriaenssens E, Journal of analytical atomic spectrometry 9, 1389 (1994). http://doi.org/10.1039/ja9940901389
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Analysis of rain water by differential-pulse stripping voltammetry in nitric acid medium”. Komy Z, Roekens E, Van Grieken R, Analytica chimica acta 204, 179 (1988). http://doi.org/10.1016/S0003-2670(00)86357-6
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Analysis of Short-Lived Reactive Species in Plasma–Air–Water Systems: The Dos and the Do Nots”. Gorbanev Y, Privat-Maldonado A, Bogaerts A, Analytical Chemistry 90, 13151 (2018). http://doi.org/10.1021/acs.analchem.8b03336
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Analysis of silver halide microcrystals using different modes of a scanning transmission electron microscope and digital image processing”. Geuens I, Gijbels R, Jacob WA, Verbeeck A, de Keyzer R, The journal of imaging science and technology 36, 534 (1992)
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Analysis of speleothems by electron and X-ray microprobes”. Kuczumow A, Vekemans B, Schalm O, Gysels K, Ro C-U, Van Grieken R, Journal of analytical atomic spectrometry 16, 90 (2001). http://doi.org/10.1039/B007725I
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