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Author |
Title  |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Lebedev, O.I.; Van Tendeloo, G.; Collart, O.; Cool, P.; Vansant, E.F. |
Structure and microstructure of nanoscale mesoporous silica spheres |
2004 |
Solid state sciences |
6 |
42 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Kong, M.; Partoens, B.; Matulis, A.; Peeters, F.M. |
Structure and spectrum of two-dimensional clusters confined in a hard wall potential |
2004 |
Physical review : E : statistical physics, plasmas, fluids, and related interdisciplinary topics |
69 |
42 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Jembrih-Simbürger, D.; Neelmeijer, C.; Schalm, O.; Fredrickx, P.; Schreiner, M.; De Vis, K.; Mäder, M.; Schryvers, D.; Caen, J. |
The colour of silver stained glass : analytical investigations carried out with XRF, SEM/EDX, TEM and IBA |
2002 |
Journal of analytical atomic spectrometry |
17 |
42 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Chen, D.; Goris, B.; Bleichrodt, F.; Heidari Mezerji, H.; Bals, S.; Batenburg, K.J.; de With, G.; Friedrich, H. |
The properties of SIRT, TVM, and DART for 3D imaging of tubular domains in nanocomposite thin-films and sections |
2014 |
Ultramicroscopy |
147 |
42 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Dutta, S.; Sankaran, K.; Moors, K.; Pourtois, G.; Van Elshocht, S.; Bommels, J.; Vandervorst, W.; Tokei, Z.; Adelmann, C. |
Thickness dependence of the resistivity of platinum-group metal thin films |
2017 |
Journal of applied physics |
122 |
42 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Ke, X.; Bals, S.; Cott, D.; Hantschel, T.; Bender, H.; Van Tendeloo, G. |
Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts |
2010 |
Microscopy and microanalysis |
16 |
42 |
UA library record; WoS full record; WoS citing articles |
|
