Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
De wael, A.; De Backer, A.; Jones, L.; Nellist, P.D.; Van Aert, S. |
Hybrid statistics-simulations based method for atom-counting from ADF STEM images |
2017 |
Ultramicroscopy |
177 |
8 |
UA library record; WoS full record; WoS citing articles |
van den Bos, K.H.W.; Altantzis, T.; De Backer, A.; Van Aert, S.; Bals, S. |
Recent breakthroughs in scanning transmission electron microscopy of small species |
2018 |
Advances in Physics: X |
3 |
8 |
UA library record; WoS full record; WoS citing articles |
Albrecht, W.; Arslan Irmak, E.; Altantzis, T.; Pedrazo‐Tardajos, A.; Skorikov, A.; Deng, T.‐S.; van der Hoeven, J.E.S.; van Blaaderen, A.; Van Aert, S.; Bals, S. |
3D Atomic‐Scale Dynamics of Laser‐Light‐Induced Restructuring of Nanoparticles Unraveled by Electron Tomography |
2021 |
Advanced Materials |
|
8 |
UA library record; WoS full record; WoS citing articles |
Pedrazo-Tardajos, A.; Arslan Irmak, E.; Kumar, V.; Sánchez-Iglesias, A.; Chen, Q.; Wirix, M.; Freitag, B.; Albrecht, W.; Van Aert, S.; Liz-Marzán, L.M.; Bals, S. |
Thermal Activation of Gold Atom Diffusion in Au@Pt Nanorods |
2022 |
ACS nano |
|
8 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. |
Model-based electron microscopy : from images toward precise numbers for unknown structure parameters |
2012 |
Micron |
43 |
7 |
UA library record; WoS full record; WoS citing articles |
van den Broek, W.; Van Aert, S.; Goos, P.; van Dyck, D. |
Throughput maximization of particle radius measurements by balancing size and current of the electron probe |
2011 |
Ultramicroscopy |
111 |
7 |
UA library record; WoS full record; WoS citing articles |
Yu, C.-P.; Friedrich, T.; Jannis, D.; Van Aert, S.; Verbeeck, J. |
Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM |
2022 |
Microscopy and microanalysis |
|
7 |
UA library record; WoS full record; WoS citing articles |
Schryvers, D.; Cao, S.; Tirry, W.; Idrissi, H.; Van Aert, S. |
Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materials |
2013 |
Science and technology of advanced materials |
14 |
6 |
UA library record; WoS full record; WoS citing articles |
van Dyck, D.; Van Aert, S.; Croitoru, M. |
Atomic resolution electron tomography: a dream? |
2006 |
International journal of materials research |
97 |
6 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; Chen, J.H.; van Dyck, D. |
Linear versus non-linear structural information limit in high-resolution transmission electron microscopy |
2010 |
Ultramicroscopy |
110 |
6 |
UA library record; WoS full record; WoS citing articles |
Van den Broek, W.; Rosenauer, A.; Van Aert, S.; Sijbers, J.; van Dyck, D. |
A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM |
2014 |
Ultramicroscopy |
141 |
6 |
UA library record; WoS full record; WoS citing articles |
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. |
Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design |
2016 |
Ultramicroscopy |
170 |
6 |
UA library record; WoS full record; WoS citing articles |
Fatermans, J.; den Dekker, A. J.; Müller-Caspary, K.; Lobato, I.; O’Leary, C. M.; Nellist, P. D.; Van Aert, S. |
Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images |
2018 |
Physical review letters |
121 |
6 |
UA library record; WoS full record; WoS citing articles |
Amini, M.N.; Altantzis, T.; Lobato, I.; Grzelczak, M.; Sánchez-Iglesias, A.; Van Aert, S.; Liz-Marzán, L.M.; Partoens, B.; Bals, S.; Neyts, E.C. |
Understanding the Effect of Iodide Ions on the Morphology of Gold Nanorods |
2018 |
Particle and particle systems characterization |
35 |
6 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; Turner, S.; Delville, R.; Schryvers, D.; Van Tendeloo, G.; Ding, X.; Salje, E.K.H. |
Functional twin boundaries |
2013 |
Phase transitions |
86 |
5 |
UA library record; WoS full record; WoS citing articles |
Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. |
Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? |
2012 |
Ultramicroscopy |
114 |
5 |
UA library record; WoS full record; WoS citing articles |
De Backer, A.; Zhang, Z.; van den Bos, K.H.W.; Bladt, E.; Sánchez‐Iglesias, A.; Liz‐Marzán, L.M.; Nellist, P.D.; Bals, S.; Van Aert, S. |
Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X‐ray Spectroscopy |
2022 |
Small methods |
|
5 |
UA library record; WoS full record; WoS citing articles |
Klingstedt, M.; Sundberg, M.; Eriksson, L.; Haigh, S.; Kirkland, A.; Grüner, D.; de Backer, A.; Van Aert, S.; Tarasaki, O. |
Exit wave reconstruction from focal series of HRTEM images, single crystal XRD and total energy studies on SbxWO3+y (x\sim0.11) |
2012 |
Zeitschrift für Kristallographie |
227 |
4 |
UA library record; WoS full record; WoS citing articles |
Molina-Luna, L.; Duerrschnabel, M.; Turner, S.; Erbe, M.; Martinez, G.T.; Van Aert, S.; Holzapfel, B.; Van Tendeloo, G. |
Atomic and electronic structures of BaHfO3-doped TFA-MOD-derived YBa2Cu3O7−δthin films |
2015 |
Superconductor science and technology |
28 |
4 |
UA library record; WoS full record; WoS citing articles |
Varambhia, A.M.; Jones, L.; De Backer, A.; Fauske, V.T.; Van Aert, S.; Ozkaya, D.; Nellist, P.D. |
Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM |
2016 |
Particle and particle systems characterization |
33 |
4 |
UA library record; WoS full record; WoS citing articles |
Martinez, G.T.; van den Bos, K.H.W.; Alania, M.; Nellist, P.D.; Van Aert, S. |
Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy |
2018 |
Ultramicroscopy |
187 |
4 |
UA library record; WoS full record; WoS citing articles |
Pullini, D.; Sgroi, M.; Mahmoud, A.; Gauquelin, N.; Maschio, L.; Lorenzo-Ferrari, A.M.; Groenen, R.; Damen, C.; Rijnders, G.; van den Bos, K.H.W.; Van Aert, S.; Verbeeck, J. |
One step toward a new generation of C-MOS compatible oxide p-n junctions: Structure of the LSMO/ZnO interface elucidated by an experimental and theoretical synergic work |
2017 |
ACS applied materials and interfaces |
9 |
4 |
UA library record; WoS full record; WoS citing articles |
van den Bos, K.H.W.; Janssens, L.; De Backer, A.; Nellist, P.D.; Van Aert, S. |
The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials |
2019 |
Ultramicroscopy |
203 |
4 |
UA library record; WoS full record; WoS citing articles |
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
A method to determine the local surface profile from reconstructed exit waves |
2011 |
Ultramicroscopy |
111 |
3 |
UA library record; WoS full record; WoS citing articles |
Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. |
How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? |
2017 |
Ultramicroscopy |
181 |
3 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; De Backer, A.; Jones, L.; Martinez, G.T.; Béché, A.; Nellist, P.D. |
Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy |
2019 |
Physical review letters |
122 |
3 |
UA library record; WoS full record; WoS citing articles |
De Backer, A.; Bals, S.; Van Aert, S. |
A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection |
2023 |
Ultramicroscopy |
|
3 |
UA library record; WoS full record; WoS citing articles |
Lu, J.; Martinez, G.T.; Van Aert, S.; Schryvers, D. |
Lattice deformations in quasi-dynamic strain glass visualised and quantified by aberration corrected electron microscopy |
2014 |
Physica status solidi: B: basic research |
251 |
2 |
UA library record; WoS full record; WoS citing articles |
Schryvers, D.; Shi, H.; Martinez, G.T.; Van Aert, S.; Frenzel, J.; Van Humbeeck, J. |
Nano- and microcrystal investigations of precipitates, interfaces and strain fields in Ni-Ti-Nb by various TEM techniques |
2013 |
Materials science forum
T2 – 9th European Symposium on Martensitic Transformations (ESOMAT 2012), SEP 09-16, 2012, St Petersburg, RUSSIA |
738/739 |
2 |
UA library record; WoS full record; WoS citing articles |
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. |
Atom-counting in High Resolution Electron Microscopy: TEM or STEM – that's the question |
2016 |
Ultramicroscopy |
174 |
2 |
UA library record; WoS full record; WoS citing articles |