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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Zhang, H.; Wang, W.; Li, X.; Han, L.; Yan, M.; Zhong, Y.; Tu, X. |
Plasma activation of methane for hydrogen production in a N2 rotating gliding arc warm plasma : a chemical kinetics study |
2018 |
Chemical engineering journal |
345 |
25 |
UA library record; WoS full record; WoS citing articles |
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van Landuyt, J. |
High resolution electron microscopy for materials |
1992 |
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7 |
UA library record; WoS full record; WoS citing articles |
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Goessens, C.; Schryvers, D.; de Keyzer, R.; van Landuyt, J. |
In situ HREM study of electron irradiation effects in AgCl microcrystals |
1992 |
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UA library record |
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van Vaeck, L.; Gijbels, R. |
Identification des substances inorganiques et organiques en surface des solides par la microsonde laser |
1992 |
|
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UA library record |
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Idrissi, H.; Schryvers, D. |
Investigation of the elementary mechanisms controlling dislocation/twin boundary interactions in fcc metals and alloys : from conventional to advanced TEM characterization |
2012 |
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UA library record |
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Adams, F.; Gijbels, R.; van Grieken, R.; Kim, Y.-sang |
Inorganic mass spectrometry |
1999 |
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UA library record |
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Adams, F.; Gijbels, R.; Van Grieken, R.; Dachang, Z. |
Inorganic mass spectrometry |
1993 |
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UA library record |
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Caen, J.; Schalm, O.; van der Snickt, G.; van der Linden, V.; Frederickx, P.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. |
Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration |
2005 |
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UA library record |
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van Vaeck, L.; van Espen, P.; Gijbels, R.; Baykut, G.; Laukien, F.H. |
A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source |
2000 |
European mass spectrometry |
6 |
10 |
UA library record; WoS full record; WoS citing articles |
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Adelmann, C.; Wen, L.G.; Peter, A.P.; Pourtois, G.; et al. |
Alternative metals for advanced interconnects |
2014 |
2014 Ieee International Interconnect Technology Conference / Advanced Metallization Conference (iitc/amc) |
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UA library record; WoS full record; |
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Sankaran, K.; Clima, S.; Mees, M.; Adelmann, C.; Tokei, Z.; Pourtois, G. |
Exploring alternative metals to Cu and W for interconnects : an ab initio Insight |
2014 |
2014 Ieee International Interconnect Technology Conference / Advanced Metallization Conference (iitc/amc) |
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UA library record; WoS full record; |
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Lujan, G.S.; Magnus, W.; Soree, B.; Pourghaderi, M.A.; Veloso, A.; van Dal, M.J.H.; Lauwers, A.; Kubicek, S.; De Gendt, S.; Heyns, M.; De Meyer, K.; |
A new method to calculate leakage current and its applications for sub-45nm MOSFETs |
2005 |
Solid-State Device Research (ESSDERC), European Conference
T2 – ESSDERC 2005 : proceedings of 35th European Solid-State Device Research Conference, September 12-16, 2005, Grenoble, France |
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UA library record; WoS full record |
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Carrillo-Nuñez, H.; Magnus, W.; Peeters, F.M. |
A non-linear variational principle for the self-consistent solution of Poisson's equation and a transport equation in the local density approximation |
2010 |
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UA library record; WoS full record; |
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Tokei, Z.; Lanckmans, F.; van den Bosch, G.; Van Hove, M.; Maex, K.; Bender, H.; Hens, S.; van Landuyt, J. |
Reliability of copper dual damascene influenced by pre-clean |
2002 |
Analysis Of Integrated Circuits |
|
5 |
UA library record; WoS full record; WoS citing articles |
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Van de Put, M.; Thewissen, M.; Magnus, W.; Sorée, B.; Sellier, J.M. |
Spectral force approach to solve the time-dependent Wigner-Liouville equation |
2014 |
2014 International Workshop On Computational Electronics (iwce) |
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UA library record; WoS full record; |
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Dong, H.M.; Qin, H.; Zhang, J.; Peeters, F.M.; Xu, W. |
Terahertz absorption window in bilayer graphene |
2009 |
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UA library record; WoS full record; |
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Verreck, D.; Van de Put, M.L.; Verhulst, A.S.; Sorée, B.; Magnus, W.; Dabral, A.; Thean, A.; Groeseneken, G. |
15-band spectral envelope function formalism applied to broken gap tunnel field-effect transistors |
2015 |
18th International Workshop On Computational Electronics (iwce 2015) |
|
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UA library record; WoS full record |
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Moors, K.; Sorée, B.; Magnus, W. |
Analytic solution of Ando's surface roughness model with finite domain distribution functions |
2015 |
18th International Workshop On Computational Electronics (iwce 2015) |
|
|
UA library record; WoS full record |
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Moors, K.; Sorée, B.; Magnus, W. |
Modeling and tackling resistivity scaling in metal nanowires |
2015 |
International Conference on Simulation of Semiconductor Processes and Devices : [proceedings]
T2 – International Conference on Simulation of Semiconductor Processes and, Devices (SISPAD), SEP 09-11, 2015, Washington, DC |
|
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UA library record; WoS full record |
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Van de Put, M.L.; Vandenberghe, W.G.; Magnus, W.; Sorée, B.; Fischetti, M.V. |
Modeling of inter-ribbon tunneling in graphene |
2015 |
18th International Workshop On Computational Electronics (iwce 2015) |
|
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UA library record; WoS full record |
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Brammertz, G.; Buffiere, M.; Verbist, C.; Bekaert, J.; Batuk, M.; Hadermann, J.; et al. |
Process variability in Cu2ZnSnSe4 solar cell devices: Electrical and structural investigations |
2015 |
The conference record of the IEEE Photovoltaic Specialists Conference
T2 – IEEE 42nd Photovoltaic Specialist Conference (PVSC), JUN 14-19, 2015, New Orleans, LA |
|
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UA library record; WoS full record |
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Verreck, D.; Verhulst, A.S.; Sorée, B.; Collaert, N.; Mocuta, A.; Thean, A.; Groeseneken, G. |
Non-uniform strain in lattice-mismatched heterostructure tunnel field-effect transistors |
2016 |
Solid-State Device Research (ESSDERC), European Conference
T2 – 46th European Solid-State Device Research Conference (ESSDERC) / 42nd, European Solid-State Circuits Conference (ESSCIRC), SEP 12-15, 2016, Lausanne, SWITZERLAND |
|
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UA library record; WoS full record |
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Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
High resolution electron microscopy from imaging towards measuring |
2001 |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
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UA library record |
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Moors, K.; Soree, B.; Tokei, Z.; Magnus, W. |
Electron relaxation times and resistivity in metallic nanowires due to tilted grain boundary planes |
2015 |
On Ultimate Integration On Silicon (eurosoi-ulis) |
|
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UA library record; WoS full record; WoS citing articles |
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Verhulst, A.S.; Verreck, D.; Smets, Q.; Kao, K.-H.; Van de Put, M.; Rooyackers, R.; Sorée, B.; Vandooren, A.; De Meyer, K.; Groeseneken, G.; Heyns, M.M.; Mocuta, A.; Collaert, N.; Thean, A.V.-Y. |
Perspective of tunnel-FET for future low-power technology nodes |
2014 |
2014 Ieee International Electron Devices Meeting (iedm) |
|
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UA library record; WoS full record |
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Liu, Y.; Brelet, Y.; He, Z.; Yu, L.; Mitryukovskiy, S.; Houard, A.; Forestier, B.; Couairon, A.; Mysyrowicz, A. |
Ciliary white light generated during femtosecond laser ablation on transparent dielectrics |
2013 |
2013 Conference On And International Quantum Electronics Conference Lasers And Electro-optics Europe (cleo Europe/iqec) |
|
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UA library record; WoS full record |
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Verreck, D.; Verhulst, A.S.; Van de Put, M.L.; Sorée, B.; Magnus, W.; Collaert, N.; Mocuta, A.; Groeseneken, G. |
Self-consistent 30-band simulation approach for (non-)uniformly strained confined heterostructure tunnel field-effect transistors |
2017 |
Simulation of Semiconductor Processes and, Devices (SISPAD)AND DEVICES (SISPAD 2017) |
|
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UA library record; WoS full record |
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Bizindavyi, J.; Verhulst, A.S.; Sorée, B.; Groeseneken, G. |
Impact of calibrated band-tails on the subthreshold swing of pocketed TFETs |
2018 |
Conference digest
T2 – 76th Device Research Conference (DRC), JUN 24-27, 2018, Santa Barbara, CA |
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UA library record; WoS full record |
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Bizindavyi, J.; Verhulst, A.S.; Smets, Q.; Verreck, D.; Sorée, B.; Groeseneken, G. |
Band-Tails Tunneling Resolving the Theory-Experiment Discrepancy in Esaki Diodes |
2018 |
IEEE journal of the Electron Devices Society |
6 |
5 |
UA library record; WoS full record; WoS citing articles |
|
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Gijbels, R. |
The many faces of TOF-SIMS for the characterization of solid (sub)surfaces |
2003 |
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UA library record |
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