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  Author Title Year Publication Volume Times cited Additional Links Links
Van Tendeloo, G.; Krekels, T. Identification of new superconducting compounds by electron microscopy 2000 UA library record
Devreese, J.T.; Verbist, G.; Peeters, F.M. Large bipolarons and high-Tc materials 1995 UA library record pdf
Vandelannoote, R.; Blommaert, W.; Van 't dack, L.; van Grieken, R.; Gijbels, R. Multi-element trace analysis of geothermal waters : problems, characteristics and applicability 1985 UA library record
Neyts, E.; Mao, M.; Eckert, M.; Bogaerts, A. Modeling aspects of plasma-enhanced chemical vapor deposition of carbon-based materials 2012 UA library record
Gijbels, R.; van Grieken, R.; Blommaert, W.; Vandelannoote, R.; Van 't dack, L. Application of trace element analysis to geothermal waters 1977 UA library record
Somsen, C.; Kästner, J.; Wassermann, E.F.; Boullay, P.; Schryvers, D. Microstructure of quenched Ni-rich Ni-Ti shape memory alloys 2001 Journal de physique: 4 T2 – 8th European Symposium on Martensitic Transformations (ESOMAT2000), SEP 04-08, 2000, COMO, ITALY 11 2 UA library record; WoS full record; WoS citing articles pdf doi
de Bleecker, K.; Bogaerts, A.; Goedheer, W.J.; Gijbels, R. Modelling of formation and transport of nanoparticles in silane discharges 2004 UA library record
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. Complex structural and analytical characterization of silver halide photographic systems by means of analytical electron microscopy 1994 UA library record; WoS full record;
Van Tendeloo, G.; Hervieu, M.; Chaillout, C. Defect structure of Hg-based ceramic superconductors (invited) 1994 Sciences UA library record; WoS full record;
Schryvers, D.; Van Tendeloo, G.; van Landuyt, J.; Le Tanner HREM imaging analysis in the study of pretransition and nucleation phenomena in alloys (Invited) 1994 UA library record; WoS full record;
Bernaerts, D.; Zhang, X.; Zhang, X.; Van Tendeloo, G.; Vanlanduyt, J.; Amelinckx, S. HREM study of Rb6C60 and helical shaped carbon nanotubules 1994 Sciences UA library record; WoS full record;
Cao, S.; Nishida, M.; Somsen, C.; Eggeler, G.; Schryvers, D. 3D FIB/SEM study of Ni4Ti3 precipitates in Ni-Ti alloys with different thermal-mechanical histories 2009 1 UA library record; WoS full record; WoS citing articles doi
Tirry, W.; Schryvers, D. 3D strain fields surrounding Ni4Ti3: direct measurement and correlation with the R-phase 2009 UA library record; WoS full record doi
Idrissi, H.; Schryvers, D.; Salje, E.K.H.; Zhang, H.; Carpenter, M.A.; Moya, X. Pinning of the martensitic microstructures by dislocations in Cu74.08Al23.13Be2.79 2009 2 UA library record; WoS full record; WoS citing articles url doi
Tian, H.; Schryvers, D.; Shabalovskaya, S.; van Humbeeck, J. TEM study of the mechanism of Ni ion release from Nitinol wires with original oxides 2009 1 UA library record; WoS full record; WoS citing articles url doi
Delville, R.; James, R.D.; Salman, U.; Finel, A.; Schryvers, D. Transmission electron microscopy study of low-hysteresis shape memory alloys 2009 3 UA library record; WoS full record; WoS citing articles doi
Houssa, M.; van den Broek, B.; Scalise, E.; Pourtois, G.; Afanas'ev, V.V.; Stesmans, A. Theoretical study of silicene and germanene 2013 Graphene, Ge/iii-v, And Emerging Materials For Post Cmos Applications 5 6 UA library record; WoS full record; WoS citing articles pdf doi
Loo, R.; Arimura, H.; Cott, D.; Witters, L.; Pourtois, G.; Schulze, A.; Douhard, B.; Vanherle, W.; Eneman, G.; Richard, O.; Favia, P.; Mitard, J.; Mocuta, D.; Langer, R.; Collaert, N. Epitaxial CVD growth of ultra-thin Si passivation layers on strained Ge fin structures 2017 Semiconductor Process Integration 10 UA library record; WoS full record pdf doi
Pourtois, G.; Dabral, A.; Sankaran, K.; Magnus, W.; Yu, H.; de de Meux, A.J.; Lu, A.K.A.; Clima, S.; Stokbro, K.; Schaekers, M.; Houssa, M.; Collaert, N.; Horiguchi, N. Probing the intrinsic limitations of the contact resistance of metal/semiconductor interfaces through atomistic simulations 2017 Semiconductors, Dielectrics, And Metals For Nanoelectronics 15: In Memory Of Samares Kar 1 UA library record; WoS full record; WoS citing articles pdf doi
Goux, L.; Fantini, A.; Govoreanu, B.; Kar, G.; Clima, S.; Chen, Y.-Y.; Degraeve, R.; Wouters, D.J.; Pourtois, G.; Jurczak, M. Asymmetry and switching phenomenology in TiN\ (Al2O3) \ HfO2 \ Hf systems 2012 ECS solid state letters 1 11 UA library record; WoS full record; WoS citing articles doi
Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S. Electron microscopy of fullerenes and fullerene related structures 1994 UA library record
Delabie, A.; Jayachandran, S.; Caymax, M.; Loo, R.; Maggen, J.; Pourtois, G.; Douhard, B.; Conard, T.; Meersschaut, J.; Lenka, H.; Vandervorst, W.; Heyns, M.; Epitaxial chemical vapor deposition of silicon on an oxygen monolayer on Si(100) substrates 2013 ECS solid state letters 2 12 UA library record; WoS full record; WoS citing articles url doi
Sankaran, K.; Clima, S.; Mees, M.; Pourtois, G. Exploring alternative metals to Cu and W for interconnects applications using automated first-principles simulations 2015 ECS journal of solid state science and technology 4 19 UA library record; WoS full record; WoS citing articles url doi
Neyts, E.C.; Bogaerts, A. Modeling the growth of SWNTs and graphene on the atomic scale 2012 ECS transactions 45 2 UA library record; WoS full record; WoS citing articles doi
Loo, R.; Arimura, H.; Cott, D.; Witters, L.; Pourtois, G.; Schulze, A.; Douhard, B.; Vanherle, W.; Eneman, G.; Richard, O.; Favia, P.; Mitard, J.; Mocuta, D.; Langer, R.; Collaert, N. Epitaxial CVD Growth of Ultra-Thin Si Passivation Layers on Strained Ge Fin Structures 2018 ECS journal of solid state science and technology 7 5 UA library record; WoS full record; WoS citing articles url doi
Dabral, A.; Pourtois, G.; Sankaran, K.; Magnus, W.; Yu, H.; de de Meux, A.J.; Lu, A.K.A.; Clima, S.; Stokbro, K.; Schaekers, M.; Collaert, N.; Horiguchi, N.; Houssa, M. Study of the intrinsic limitations of the contact resistance of metal/semiconductor interfaces through atomistic simulations 2018 ECS journal of solid state science and technology 7 2 UA library record; WoS full record; WoS citing articles doi
Dhayalan, S.K.; Kujala, J.; Slotte, J.; Pourtois, G.; Simoen, E.; Rosseel, E.; Hikavyy, A.; Shimura, Y.; Loo, R.; Vandervorst, W. On the evolution of strain and electrical properties in as-grown and annealed Si:P epitaxial films for source-drain stressor applications 2018 ECS journal of solid state science and technology 7 4 UA library record; WoS full record; WoS citing articles url doi
Borah, R.; Verbruggen, S.W. Effect of size distribution, skewness and roughness on the optical properties of colloidal plasmonic nanoparticles 2022 Colloids and surfaces: A: physicochemical and engineering aspects 640 UA library record; WoS full record; WoS citing articles pdf url doi
Soldatov, A.; Yalovega, G.; Smolentsev, G.; Kravtsova, A.; Lamoen, D.; Balasubramanian, C.; Marcelli, A.; Cinque, G.; Bellucci, S. ALN nanoparticles XANES analysis: local atomic and electronic structure 2007 Nuclear Instruments & Methods In Physics Research Section A-Accelerators Spectrometers Detectors And Associated Equipment 575 3 UA library record; WoS full record; WoS citing articles doi
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling 2000 UA library record
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