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Author Title Year Publication (down) Volume Times cited Additional Links
Turner, S.; Egoavil, R.; Batuk, M.; Abakumov, A.A.; Hadermann, J.; Verbeeck, J.; Van Tendeloo, G. Site-specific mapping of transition metal oxygen coordination in complex oxides 2012 Applied physics letters 101 12 UA library record; WoS full record; WoS citing articles
Rauwel, E.; Dubourdieu, C.; Holländer, B.; Rochat, N.; Ducroquet, F.; Rossell, M.D.; Van Tendeloo, G.; Pelissier, B. Stabilization of the cubic phase of HfO2 by Y addition in films grown by metal organic chemical vapor deposition 2006 Applied physics letters 89 78 UA library record; WoS full record; WoS citing articles
van Dyck, D.; Croitoru, M.D. Statistical method for thickness measurement of amorphous objects 2007 Applied physics letters 90 4 UA library record; WoS full record; WoS citing articles
Santiso, J.; Pardo, J.A.; Solis, C.; Garcia, G.; Figueras, A.; Rossell, M.D.; Van Tendeloo, G. Strain relaxation and oxygen superstructure modulation in epitaxial Sr4Fe6O13\pm\delta films 2005 Applied physics letters 86 5 UA library record; WoS full record; WoS citing articles
Leca, V.; Blank, D.H.A.; Rijnders, G.; Bals, S.; Van Tendeloo, G. Superconducting single-phase Sr1-xLaxCuO2 thin films with improved crystallinity grown by pulsed laser deposition 2006 Applied physics letters 89 32 UA library record; WoS full record; WoS citing articles
Chen, L.; Kirilenko, D.; Stesmans, A.; Nguyen, X.S.; Binnemans, K.; Goderis, B.; Vanacken, J.; Lebedev, O.; Van Tendeloo, G.; Moshchalkov, V.V. Symmetry and electronic states of Mn2+ in ZnS nanowires with mixed hexagonal and cubic stacking 2010 Applied physics letters 97 5 UA library record; WoS full record; WoS citing articles
Paul, M.; Kufer, D.; Müller, A.; Brück, S.; Goering, E.; Kamp, M.; Verbeeck, J.; Tian, H.; Van Tendeloo, G.; Ingle, N.J.C.; Sing, M.; Claessen, R. Fe3O4/ZnO : a high-quality magnetic oxide-semiconductor heterostructure by reactive deposition 2011 Applied physics letters 98 27 UA library record; WoS full record; WoS citing articles
Verbist, K.; Vasiliev, A.L.; Van Tendeloo, G. Y2O3 inclusions in YBa2Cu3O7-\delta thin films 1995 Applied physics letters 66 28 UA library record; WoS full record; WoS citing articles
Gontard, L.C.; Jinschek, J.R.; Ou, H.; Verbeeck, J.; Dunin-Borkowski, R.E. Three-dimensional fabrication and characterisation of core-shell nano-columns using electron beam patterning of Ge-doped SiO2 2012 Applied physics letters 100 11 UA library record; WoS full record; WoS citing articles
Du, G.H.; Yuan, Z.Y.; Van Tendeloo, G. Transmission electron microscopy and electron energy-loss spectroscopy analysis of manganese oxide nanowires 2005 Applied physics letters 86 46 UA library record; WoS full record; WoS citing articles
Bals, S.; Van Tendeloo, G.; Salluzzo, M.; Maggio-Aprile, I. Why are sputter deposited Nd1+xBa2-xCu3O7-\delta thin films flatter than NdBa2Cu3O7-\delta films? 2001 Applied physics letters 79 13 UA library record; WoS full record; WoS citing articles
Béché, A.; Goris, B.; Freitag, B.; Verbeeck, J. Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy 2016 Applied physics letters 108 40 UA library record; WoS full record; WoS citing articles
Balasubramaniam, Y.; Pobedinskas, P.; Janssens, S.D.; Sakr, G.; Jomard, F.; Turner, S.; Lu, Y.G.; Dexters, W.; Soltani, A.; Verbeeck, J.; Barjon, J.; Nesládek, M.; Haenen, K.; Thick homoepitaxial (110)-oriented phosphorus-doped n-type diamond 2016 Applied physics letters 109 20 UA library record; WoS full record; WoS citing articles
M. K. Kinyanjui, N. Gauquelin, E. Benckiser, H. –U. Habermeier, B. Keimer, U. Kaiser and G.A. Botton Local lattice distortion and anisotropic modulation in Epitaxially Strained LaNiO3/LaAlO3 hetero-structures 2014 Applied Physics Letters 104 22
H. Zhang, N. Gauquelin, G.A. Botton and J.Y.T. Wei Attenuation of superconductivity in manganite/cuprate heterostructures by epitaxially induced CuO intergrowths 2013 Applied Physics Letters 103 12
Jones, E.; Cooper, D.; Rouvière, J.-L.; Béché, A.; Azize, M.; Palacios, T.; Gradecak, S. Towards rapid nanoscale measurement of strain in III-nitride heterostructures 2013 Applied Physics Letters 103 6 UA library record; WoS full record; WoS citing articles
Cooper, D.; Rouvière, J.-L.; Béché, A.; Kadkhodazadeh, S.; Semenova, E.S.; Dunin-Borkowsk, R. Quantitative strain mapping of InAs/InP quantum dots with 1 nm spatial resolution using dark field electron holography 2011 Applied physics letters 99 26 UA library record; WoS full record; WoS citing articles
Cooper, D.; Le Royer, C.; Béché, A.; Rouvière, J.-L. Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy 2012 Applied Physics Letters 100 UA library record; WoS full record; WoS citing articles
Cooper, D.; Denneulin, T.; Barnes, J.-P.; Hartmann, J.-M.; Hutin, L.; Le Royer, C.; Béché, A.; Rouvière, J.-L. Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy 2012 Applied Physics Letters 112 14 UA library record; WoS full record; WoS citing articles
Rouvière, J.-L.; Béché, A.; Martin, Y.; Denneulin, T.; Cooper, D. Improved strain precision with high spatial resolution using nanobeam precession electron diffraction 2013 Applied physics letters 103 53 UA library record; WoS full record; WoS citing articles
Zhou, Y.; Ramaneti, R.; Anaya, J.; Korneychuk, S.; Derluyn, J.; Sun, H.; Pomeroy, J.; Verbeeck, J.; Haenen, K.; Kuball, M. Thermal characterization of polycrystalline diamond thin film heat spreaders grown on GaN HEMTs 2017 Applied physics letters 111 78 UA library record; WoS full record; WoS citing articles
Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. Spectroscopic coincidence experiments in transmission electron microscopy 2019 Applied physics letters 114 18 UA library record; WoS full record; WoS citing articles
Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping 2019 Applied physics letters 114 17 UA library record; WoS full record; WoS citing articles
Wang, J.; Gauquelin, N.; Huijben, M.; Verbeeck, J.; Rijnders, G.; Koster, G. Metal-insulator transition of SrVO 3 ultrathin films embedded in SrVO 3 / SrTiO 3 superlattices 2020 Applied Physics Letters 117 8 UA library record; WoS full record; WoS citing articles
Gao, C.; Hofer, C.; Jannis, D.; Béché, A.; Verbeeck, J.; Pennycook, T.J. Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science 2022 Applied physics letters 121 9 UA library record; WoS full record; WoS citing articles
Schalm, O.; Crabbé, A.; Storme, P.; Wiesinger, R.; Gambirasi, A.; Grieten, E.; Tack, P.; Bauters, S.; Kleber, C.; Favaro, M.; Schryvers, D.; Vincze, L.; Terryn, H.; Patelli, A. The corrosion process of sterling silver exposed to a Na2S solution: monitoring and characterizing the complex surface evolution using a multi-analytical approach 2016 Applied Physics A-Materials Science & Processing 122 9
Nistor, L.C.; van Landuyt, J.; Ralchenko, V.G.; Kononenko, T.V.; Obraztsova, E.D.; Strelnitsky, V.E. Direct observation of laser-induced crystallization of a-C : H films 1994 Applied physics A : materials science & processing 58 73 UA library record; WoS full record; WoS citing articles
Kalitzova, M.; Lebedev, O.I.; Zollo, G.; Gesheva, K.; Vlakhov, E.; Marinov, Y.; Ivanova, T.; Dynamics of nanoclustering in Te+ implanted Si after application of high frequency electromagnetic field and thermal annealing 2008 Applied physics A : materials science & processing 91 UA library record; WoS full record
Du, G.H.; Van Tendeloo, G. Formation of Mn304/C core-shell nanowires and a new MN-O phase by electron beam irradiation 2008 Applied physics A : materials science & processing 91 1 UA library record; WoS full record; WoS citing articles
Hendrich, C.; Favre, L.; Ievlev, D.N.; Dobrynin, A.N.; Bras, W.; Hörmann, U.; Piscopiello, E.; Van Tendeloo, G.; Lievens, P.; Temst, K. Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering 2007 Applied physics A : materials science & processing 86 11 UA library record; WoS full record; WoS citing articles