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Elemental analysis of aerosol-size fractions by proton-induced X-ray-emission”. Johansson TB, Nelson JW, Van Grieken RE, Winchester JW, Transactions of the American Nuclear Society 17, 103 (1973)
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Leaf area-length allometry and its implications in leaf shape evolution”. Shi P, Liu M, Ratkowsky DA, Gielis J, Su J, Yu X, Wang P, Zhang L, Lin Z, Schrader J, Trees: structure and function 33, 1073 (2019). http://doi.org/10.1007/S00468-019-01843-4
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A generalized performance equation and its application in measuring the Gini index of leaf size inequality”. Lian M, Shi P, Zhang L, Yao W, Gielis J, Niklas KJ, Trees: structure and function 37, 1555 (2023). http://doi.org/10.1007/S00468-023-02448-8
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A general-purpose interface between fortran and the low-level functions of the ibm-pc”. Janssens K, van Espen P, Trends in analytical chemistry 7, 128 (1988). http://doi.org/10.1016/0165-9936(88)87009-2
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Mitigation strategies for radiation damage in the analysis of ancient materials”. Bertrand L, Schoeeder S, Anglos D, Breese MBH, Janssens K, Moini M, Simon A, Trends in analytical chemistry 66, 128 (2015). http://doi.org/10.1016/J.TRAC.2014.10.005
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Recent trends in quantitative aspects of microscopic X-ray fluorescence analysis”. Janssens K, de Nolf W, van der Snickt G, Vincze L, Vekemans B, Terzano R, Brenker FE, Trends in analytical chemistry 29, 464 (2010). http://doi.org/10.1016/J.TRAC.2010.03.003
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Present and future applications of beam techniques in environmental microanalysis”. Jambers W, Van Grieken R, Trends in analytical chemistry 15, 114 (1996). http://doi.org/10.1016/0165-9936(95)00098-4
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Dunaliella microalgae for nutritional protein : an undervalued asset”. Sui Y, Vlaeminck SE, Trends in biotechnology : regular edition 38, 10 (2020). http://doi.org/10.1016/J.TIBTECH.2019.07.011
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Dehazing redox homeostasis to foster purple bacteria biotechnology”. Alloul A, Blansaer N, Cabecas Segura P, Wattiez R, Vlaeminck SE, Leroy B, Trends in biotechnology : regular edition 41, 106 (2023). http://doi.org/10.1016/J.TIBTECH.2022.06.010
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Nanodiamond-based nanolubricants : investigation of friction surfaces”. Shenderova O, Vargas A, Turner S, Ivanov DM, Ivanov MG, Tribology transactions 57, 1051 (2014). http://doi.org/10.1080/10402004.2014.933933
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RSV frequency in children below 2 years hospitalized for lower respiratory tract infections”. Hacimustafaoglu M, Celebi S, Bozdemir SE, Ozgur T, Ozcan I, Guray A, Çakir D, Turkish Journal Of Pediatrics 55, 130 (2013)
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Stable anisotropic single-layer of ReTe₂, : a first principles prediction”. Yagmurcukardes M, Turkish Journal of Physics 44, 450 (2020). http://doi.org/10.3906/FIZ-2004-17
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EM study of twinning in the Ni5Al3 bainitic phase”. Schryvers D, Ma Y, Toth L, Tanner LE, Twinning in advanced materials , 395 (1993)
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The Fresnel effect of a defocused biprism on the fringes in inelastic holography”. Verbeeck J, Bertoni G, Schattschneider P, Ultramicroscopy T2 –, 16th International Microscopy Congress, SEP 03-08, 2006, Sapporo, JAPAN 108, 263 (2008). http://doi.org/10.1016/j.ultramic.2007.06.007
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The evolution of HVEM application in antwerp”. van Landuyt J, Ultramicroscopy T2 –, 2nd Osaka International Symp.on High-Voltage Electron Microscopy : New Directions and Future Aspects of High Voltage Electron Microscopy, November 8-10, 1990, Osaka University, Osaka, Japan 39, 287 (1991). http://doi.org/10.1016/0304-3991(91)90208-N
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3D imaging of nanomaterials by discrete tomography”. Batenburg KJ, Bals S, Sijbers J, Kübel C, Midgley PA, Hernandez JC, Kaiser U, Encina ER, Coronado EA, Van Tendeloo G, Ultramicroscopy 109, 730 (2009). http://doi.org/10.1016/j.ultramic.2009.01.009
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Accuracy and precision in model based EELS quantification”. Bertoni G, Verbeeck J, Ultramicroscopy 108, 782 (2008). http://doi.org/10.1016/j.ultramic.2008.01.004
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Accurate segmentation of dense nanoparticles by partially discrete electron tomography”. Roelandts T, Batenburg KJ, Biermans E, Kübel C, Bals S, Sijbers J, Ultramicroscopy 114, 96 (2012). http://doi.org/10.1016/j.ultramic.2011.12.003
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Acquisition of the EELS data cube by tomographic reconstruction”. van den Broek W, Verbeeck J, de Backer S, Scheunders P, Schryvers D, Ultramicroscopy 106, 269 (2006). http://doi.org/10.1016/j.ultramic.2005.09.001
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Advanced reconstruction algorithms for electron tomography : from comparison to combination”. Goris B, Roelandts T, Batenburg KJ, Heidari Mezerji H, Bals S, Ultramicroscopy 127, 40 (2013). http://doi.org/10.1016/j.ultramic.2012.07.003
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An alternative approach to determine attainable resolution directly from HREM images”. Wang A, Turner S, Van Aert S, van Dyck D, Ultramicroscopy 133, 50 (2013). http://doi.org/10.1016/j.ultramic.2013.05.008
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Applying an information transmission approach to extract valence electron information from reconstructed exit waves”. Xu Q, Zandbergen HW, van Dyck D, Ultramicroscopy 111, 912 (2011). http://doi.org/10.1016/j.ultramic.2011.01.032
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Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations”. de Backer A, Martinez GT, Rosenauer A, Van Aert S, Ultramicroscopy 134, 23 (2013). http://doi.org/10.1016/j.ultramic.2013.05.003
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Atomic resolution mapping of phonon excitations in STEM-EELS experiments”. Egoavil R, Gauquelin N, Martinez GT, Van Aert S, Van Tendeloo G, Verbeeck J, Ultramicroscopy 147, 1 (2014). http://doi.org/10.1016/j.ultramic.2014.04.011
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Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging”. Chen JH, van Dyck D, op de Beeck M, van Landuyt J, Ultramicroscopy 69, 219 (1997)
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Correction of non-linear thickness effects in HAADF STEM electron tomography”. van den Broek W, Rosenauer A, Goris B, Martinez GT, Bals S, Van Aert S, van Dyck D, Ultramicroscopy 116, 8 (2012). http://doi.org/10.1016/j.ultramic.2012.03.005
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Creating arrays of electron vortices”. Niermann T, Verbeeck J, Lehmann M, Ultramicroscopy 136, 165 (2014). http://doi.org/10.1016/j.ultramic.2013.10.002
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Deconvolution of core electron energy loss spectra”. Verbeeck J, Bertoni G, Ultramicroscopy 109, 1343 (2009). http://doi.org/10.1016/j.ultramic.2009.06.010
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Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography”. Kruse P, Schowalter M, Lamoen D, Rosenauer A, Gerthsen D, Ultramicroscopy 106, 105 (2006). http://doi.org/10.1016/j.ultramic.2005.06.057
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Direct space structure solution from precession electron diffraction data: resolving heavy and light scatterers in Pb13Mn9O25”. Hadermann J, Abakumov AM, Tsirlin AA, Filonenko VP, Gonnissen J, Tan H, Verbeeck J, Gemmi M, Antipov EV, Rosner H, Ultramicroscopy 110, 881 (2010). http://doi.org/10.1016/j.ultramic.2010.03.012
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