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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Szalóki, I.; Török, S.B.; Injuk, J.; Van Grieken, R.E. |
X-ray spectrometry |
2002 |
Analytical chemistry |
74 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Szalóki, I.; Török, S.B.; Ro, C.-U.; Injuk, J.; Van Grieken, R.E. |
X-ray spectrometry |
2000 |
Analytical chemistry |
72 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
New developments and applications in GDMS |
1999 |
Fresenius' journal of analytical chemistry |
364 |
17 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Gijbels, R.; Bogaerts, A. |
Recent trends in solids mass spectrometry: GDMS and other methods |
1997 |
Fresenius' journal of analytical chemistry |
359 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
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Bogaerts, A.; Gijbels, R. |
Three-dimensional modeling of a direct current glow discharge in argon: is it better than one-dimensional modeling? |
1997 |
Fresenius' journal of analytical chemistry |
359 |
9 |
UA library record; WoS full record; WoS citing articles |
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Janssens, K.; Vincze, L.; Vekemans, B.; Williams, C.T.; Radtke, M.; Haller, M.; Knöchel, A. |
The non-destructive determination of REE in fossilized bone using synchrotron radiation induced K-line X-ray microfluorescence analysis |
1999 |
Fresenius' journal of analytical chemistry |
363 |
|
UA library record; WoS full record; WoS citing articles |
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Hołynska, B.; Olko, M.; Ostachowicz, B.; Ostachowicz, J.; Wegrzynek, D.; Claes, M.; Van Grieken, R.; de Bokx, P.; Kump, P.; Necemer, M. |
Performance of total reflection and grazing emission X-ray fluorescence spectrometry for the determination of trace metals in drinking water in relation to other analytical techniques |
1998 |
Fresenius' journal of analytical chemistry |
362 |
|
UA library record; WoS full record; WoS citing articles |
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Kempenaers, L.; Janssens, K.; Vincze, L.; Vekemans, B.; Somogyi, A.; Drakopoulos, M.; Simionovici, A.S.; Adams, F. |
A Monte Carlo model for studying the microheterogeneity of trace elements in reference materials by means of synchrotron microscopic X-ray fluorescence |
2002 |
Analytical chemistry |
74 |
21 |
UA library record; WoS full record; WoS citing articles |
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|
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Robben, J.; Dufour, D.; Gijbels, R. |
Design and development of a new program for data processing of mass spectra acquired by means of a high-resolution double-focusing glow-discharge mass spectrometer |
2001 |
Fresenius' journal of analytical chemistry |
370 |
2 |
UA library record; WoS full record; WoS citing articles |
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Lenaerts, J.; Verlinden, G.; Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Geuens, I. |
Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary ion-mass spectrometry (SIMS) |
2001 |
Fresenius' journal of analytical chemistry |
370 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
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Kempenaers, L.; de Koster, C.; van Borm, W.; Janssens, K. |
Micro-heterogeneity study of trace elements in BCR CRM 680 by means of synchrotron micro-XRF |
2001 |
Fresenius' journal of analytical chemistry |
369 |
15 |
UA library record; WoS full record; WoS citing articles |
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Ro, C.-U.; Osán, J.; Szalóki, I.; de Hoog, J.; Worobiec, A.; Van Grieken, R. |
A Monte Carlo program for quantitative electron-induced x-ray analysis of individual particles |
2003 |
Analytical chemistry |
75 |
|
UA library record; WoS full record; WoS citing articles |
|
|
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Ro, C.-U.; Kim, H.K.; Van Grieken, R. |
An expert system for chemical speciation of individual particles using low-Z particle electron probe X-ray microanalysis data |
2004 |
Analytical chemistry |
76 |
|
UA library record; WoS full record; WoS citing articles |
|
|
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Jambers, W.; de Bock, L.; Van Grieken, R. |
Applications of micro-analysis to individual environmental particles |
1996 |
Fresenius' journal of analytical chemistry |
355 |
|
UA library record; WoS full record; WoS citing articles |
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Schelles, W.; de Gendt, S.; Maes, K.; Van Grieken, R. |
The use of a secondary cathode to analyse solid non-conducting samples with direct current glow discharge mass spectrometry: potential and restrictions |
1996 |
Fresenius' journal of analytical chemistry |
355 |
|
UA library record; WoS full record; WoS citing articles |
|
|
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Eyckmans, K.; de Hoog, J.; van der Auwera, L.; Van Grieken, R. |
Speciation of aerosols by combining bulk ion chromatography and thin-window electron probe micro analysis |
2003 |
International journal of environmental analytical chemistry |
83 |
|
UA library record; WoS full record; WoS citing articles |
|
|
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Bings, N.H.; Bogaerts, A.; Broekaert, J.A.C. |
Atomic spectroscopy |
2004 |
Analytical chemistry |
76 |
32 |
UA library record; WoS full record; WoS citing articles |
|
|
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Szalóki, I.; Osán, J.; Van Grieken, R.E. |
X-ray spectrometry |
2004 |
Analytical chemistry |
76 |
|
UA library record; WoS full record; WoS citing articles |
|
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van Put, A.; Vertes, A.; Wegrzynek, D.; Treiger, B.; Van Grieken, R. |
Quantitative characterization of individual particle surfaces by fractal analysis of scanning electron microscope images |
1994 |
Fresenius' journal of analytical chemistry |
350 |
|
UA library record; WoS full record; WoS citing articles |
|
|
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Adriaensen, L.; Vangaever, F.; Gijbels, R. |
Metal-assisted secondary ion mass spectrometry: the influence of Ag and Au deposition on molecular ion yields |
2004 |
Analytical chemistry |
76 |
67 |
UA library record; WoS full record; WoS citing articles |
|
|
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Vincze, L.; Vekemans, B.; Brenker, F.E.; Falkenberg, G.; Rickers, K.; Somogyi, A.; Kersten, M.; Adams, F. |
Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging |
2004 |
Analytical chemistry |
76 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
van Straaten, M.; Gijbels, R.; Vertes, A. |
Influence of axial and radial diffusion processes on the analytical performance of a glow discharge cell |
1992 |
Analytical chemistry |
64 |
43 |
UA library record; WoS full record; WoS citing articles |
|
|
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Adams, F.C.; Van Grieken, R.E. |
Absorption correction for X-ray-fluorescence analysis of aerosol loaded filters |
1975 |
Analytical chemistry |
47 |
|
UA library record; WoS full record; WoS citing articles |
|
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Markowicz, A.A.; Storms, H.M.; Van Grieken, R.E. |
Absorption correction in electron probe x-ray microanalysis of thin samples |
1986 |
Analytical chemistry |
58 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Dyck, P.M.; Van Grieken, R.E. |
Absorption correction via scattered radiation in energy-dispersive X-ray fluorescence analysis for samples of variable composition and thickness |
1980 |
Analytical chemistry |
52 |
|
UA library record; WoS full record; WoS citing articles |
|
|
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Markowicz, A.A.; Van Grieken, R.E. |
Atomic number correction in electron probe X-ray microanalysis of curved samples and particles |
1984 |
Analytical chemistry |
56 |
|
UA library record; WoS full record; WoS citing articles |
|
|
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Markowicz, A.A.; Storms, H.M.; Van Grieken, R.E. |
Bremsstrahlung background in electron-probe X-ray-microanalysis of thin films |
1985 |
Analytical chemistry |
57 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Smits, J.A.; Van Grieken, R.E. |
Characterization of a 2,2'-diaminodiethylamine-cellulose filter toward metal cation extraction |
1980 |
Analytical chemistry |
52 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Grieken, R.E.; Bresseleers, C.M.; Vanderborght, B.M. |
Chelex-100 ion-exchange filter membranes for preconcentration in x-ray-fluorescence analysis of water |
1977 |
Analytical chemistry |
49 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Markowicz, A.A.; Van Grieken, R.E. |
Composition dependence of Bremsstrahlung background in electron-probe x-ray microanalysis |
1984 |
Analytical chemistry |
56 |
|
UA library record; WoS full record; WoS citing articles |
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