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	Author	Ro, C.-U.; Kim, H.K.; Van Grieken, R.
	Title	An expert system for chemical speciation of individual particles using low-Z particle electron probe X-ray microanalysis data			Type	A1 Journal article
	Year	2004	Publication	Analytical chemistry	Abbreviated Journal
	Volume	76	Issue		Pages	1322-1327
	Keywords	A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
	Abstract
	Address
	Corporate Author				Thesis
	Publisher		Place of Publication		Editor
	Language		Wos	000189275100020	Publication Date	2004-02-27
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	0003-2700; 5206-882x	ISBN		Additional Links	UA library record; WoS full record; WoS citing articles
	Impact Factor		Times cited		Open Access
	Notes				Approved	no
	Call Number	UA @ admin @ c:irua:43879			Serial	7949
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