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Record |
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Author |
Vincze, L.; Vekemans, B.; Brenker, F.E.; Falkenberg, G.; Rickers, K.; Somogyi, A.; Kersten, M.; Adams, F. |
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Title |
Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging |
Type |
A1 Journal article |
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Year  |
2004 |
Publication |
Analytical chemistry |
Abbreviated Journal |
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Volume |
76 |
Issue |
22 |
Pages |
6786-6791 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
000225076400034 |
Publication Date |
2004-11-12 |
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Series Editor |
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Series Volume |
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Edition |
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ISSN |
0003-2700; 5206-882x |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:49817 |
Serial |
8669 |
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| Permanent link to this record |
