NANOlab Center of Excellence literature database -- Query Results

	NANOlab Center of Excellence literature database Home \| Show All \| Simple Search \| Advanced Search	Login Quick Search: Field: contains: ...
	1–1 of 1 record found matching your query (RSS):

Select All Deselect All

<< 1 >>

|

|

Details

	Record						Links
	Author	Vincze, L.; Vekemans, B.; Brenker, F.E.; Falkenberg, G.; Rickers, K.; Somogyi, A.; Kersten, M.; Adams, F.
	Title	Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging			Type	A1 Journal article
	Year	2004	Publication	Analytical chemistry	Abbreviated Journal
	Volume	76	Issue	22	Pages	6786-6791
	Keywords	A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
	Abstract
	Address
	Corporate Author				Thesis
	Publisher		Place of Publication		Editor
	Language		Wos	000225076400034	Publication Date	2004-11-12
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	0003-2700; 5206-882x	ISBN		Additional Links	UA library record; WoS full record; WoS citing articles
	Impact Factor		Times cited		Open Access
	Notes				Approved	no
	Call Number	UA @ admin @ c:irua:49817			Serial	8669
Permanent link to this record

Select All Deselect All

<< 1 >>

|

|

Details

All Found Records Selected Records:

Save Citations: Format:

Export Records: Format:

CQL Search | Library Search | Show Record | Extract Citations