|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
Schowalter, M.; Lamoen, D.; Kruse, P.; Gerthsen, D.; Rosenauer, A. |
First-principles calculations of the mean inner Coulomb potential for sphalerite type II.VI semiconductors |
2004 |
Applied Physics Letters |
85 |
16 |
UA library record; WoS full record; WoS citing articles |
|
|
Verbeeck, J.; Sc hattschneider, P.; Rosenauer, A. |
Image simulation of high resolution energy filtered TEM images |
2009 |
Ultramicroscopy |
109 |
36 |
UA library record; WoS full record; WoS citing articles |
|
|
Rossi, E.H.M.; Van Tendeloo, G.; Rosenauer, A. |
Influence of strain, specimen orientation and background estimation on composition evaluation of InAs/GaAs by TEM |
2007 |
Philosophical magazine |
87 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R.; Waag, A. |
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography |
2005 |
Applied Physics Letters |
86 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. |
Modified atomic scattering amplitudes and size effects on the 002 and 220 electron structure factors of multiple Ga1-xInxAs/GaAs quantum wells |
2009 |
Journal of applied physics |
105 |
|
UA library record; WoS full record |
|
|
Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis |
2003 |
Institute of physics conference series |
|
|
UA library record; WoS full record; |
|
|
Müller, K.; Schowalter, M.; Rosenauer, A.; Jansen, J.; Tsuda, K.; Titantah, J.T.; Lamoen, D. |
Refinement of chemically sensitive structure factors using parallel and convergent beam electron nanodiffraction |
2010 |
Journal of physics : conference series |
209 |
|
UA library record |
|
|
Müller, K.; Schowalter, M.; Jansen, J.; Tsuda, K.; Titantah, J.; Lamoen, D.; Rosenauer, A. |
Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data |
2009 |
Ultramicroscopy |
109 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
Piscopiello, E.; Rosenauer, A.; Passaseo, A.; Montoya Rossi, E.H.; Van Tendeloo, G. |
Segregation in InxGa1-xAs/GaAs Stranski-Krastanow layers grown by metal-organic chemical vapour deposition |
2005 |
Philosophical magazine |
85 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. |
Size effects and strain state of Ga1-xInxAs/GaAs multiple quantum wells: Monte Carlo study |
2008 |
Physical review : B : condensed matter and materials physics |
78 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
Schowalter, M.; Rosenauer, A.; Titantah, J.T.; Lamoen, D. |
Temperature-dependent Debye-Waller factors for semiconductors with the wurtzite-type structure |
2009 |
Acta crystallographica: section A: foundations of crystallography |
65 |
23 |
UA library record; WoS full record; WoS citing articles |
|
|
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. |
Temperature effect on the 002 structure factor of ternary Ga1-xInxAs crystals |
2007 |
Physical review : B : condensed matter and materials physics |
76 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
Grieb, T.; Krause, F.F.; Mahr, C.; Zillmann, D.; Müller-Caspary, K.; Schowalter, M.; Rosenauer, A. |
Optimization of NBED simulations for disc-detection measurements |
2017 |
Ultramicroscopy |
181 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
Carmesin, C.; Schowalter, M.; Lorke, M.; Mourad, D.; Grieb, T.; Müller-Caspary, K.; Yacob, M.; Reithmaier, J.P.; Benyoucef, M.; Rosenauer, A.; Jahnke, F. |
Interplay of morphology, composition, and optical properties of InP-based quantum dots emitting at the 1.55 \mum telecom wavelength |
2017 |
Physical review B |
96 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
Grieb, T.; Tewes, M.; Schowalter, M.; Müller-Caspary, K.; Krause, F.F.; Mehrtens, T.; Hartmann, J.-M.; Rosenauer, A. |
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation |
2018 |
Ultramicroscopy |
184 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
Mahr, C.; Müller-Caspary, K.; Graf, M.; Lackmann, A.; Grieb, T.; Schowalter, M.; Krause, F.F.; Mehrtens, T.; Wittstock, A.; Weissmueller, J.; Rosenauer, A. |
Measurement of local crystal lattice strain variations in dealloyed nanoporous gold |
2018 |
Materials research letters |
6 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
Grieb, T.; Krause, F.F.; Schowalter, M.; Zillmann, D.; Sellin, R.; Müller-Caspary, K.; Mahr, C.; Mehrtens, T.; Bimberg, D.; Rosenauer, A. |
Strain analysis from nano-beam electron diffraction : influence of specimen tilt and beam convergence |
2018 |
Ultramicroscopy |
190 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
Müller-Caspary, K.; Duchamp, M.; Roesner, M.; Migunov, V.; Winkler, F.; Yang, H.; Huth, M.; Ritz, R.; Simson, M.; Ihle, S.; Soltau, H.; Wehling, T.; Dunin-Borkowski, R.E.; Van Aert, S.; Rosenauer, A. |
Atomic-scale quantification of charge densities in two-dimensional materials |
2018 |
Physical review B |
98 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. |
Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose |
2019 |
Ultramicroscopy |
203 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. |
Electron Bessel beam diffraction patterns, line scan of Si/SiGe multilayer |
2019 |
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UA library record |
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