Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Vincze, L.; Janssens, K.; Vekemans, B.; Adams, F. |
Monte Carlo simulation of X-ray fluorescence and scattering tomography experiments |
1999 |
|
|
|
UA library record; WoS full record; WoS citing articles |
Van Grieken, R.; Jaenicke, R.; Koutsenogii, K.P.; Khodzher, T.V.; Kulipanov, G.N. |
Atmospheric aerosols in the Asian part of the former Soviet Union |
1999 |
|
|
|
UA library record; WoS full record |
Oleshko, V.P.; Gijbels, R.H.; van Daele, A.J.; Jacob, W.A. |
On estimation of the dielectric function of Ag(Br,I) nanocrystals by cryo-EELS (addendum) |
1999 |
Nanostructered materials |
11 |
|
UA library record |
de Raedt, I.; Janssens, K.; Veeckman, J. |
Echt of namaak? Venetiaans glas uit het oude Antwerpen |
1999 |
De wetenschappelijke bibliotheek |
67 |
|
UA library record |
Vekemans, B.; Vincze, L.; Vittiglio, G.; Janssens, K.; Adams, F. |
Fluorescent tomography of phantom samples at the beamline L |
1999 |
HASYLAB Jahresbericht |
|
|
UA library record |
Claes, M.; van Ham, R.; Janssens, K.; Van Grieken, R.; Klockenkämper, R.; von Bohlen, A. |
Micro-analysis of artists' pigments by grazing-emission X-ray fluorescence spectrometry |
1999 |
Advances in X-ray analysis |
41 |
|
UA library record |
Vincze, L.; Janssens, K.; Adams, F.; Rindby, A.; Engström, P.; Riekel, C. |
Optimization of tapered capillary optics for use at the microfocus beamline (ID 13) at the European Synchroton Radiation Facility |
1999 |
Advances in X-ray analysis |
41 |
|
UA library record |
Janssens, K. |
Special issue: Proceedings of the 15th International Congress on X-ray Optics and Microanalysis |
1999 |
Journal of analytical atomic spectroscopy |
14 |
|
UA library record |
Dekov, V.; Subramanian, V.; Van Grieken, R. |
Chemical composition of riverine suspended matter and sediments from the Indian sub-continent |
1999 |
Mitteilungen aus dem Geologisch-Paläontologischen Institut der Universität Hamburg |
82 |
|
UA library record |
Adriaens, A.; Goossens, D.; Pijpers, A.; Van Tendeloo, G.; Gijbels, R. |
Dissolution study of potassium feldspars using hydrothermally treated sanidine as an example |
1999 |
Surface and interface analysis |
27 |
4 |
UA library record; WoS full record; WoS citing articles |
de Vyt, A.; Gijbels, R.; Davock, H.; van Roost, C.; Geuens, I. |
Characterization of AgxAuy nano particles by TEM and STEM |
1999 |
Journal of analytical atomic spectrometry |
14 |
2 |
UA library record; WoS full record; WoS citing articles |
Bogaerts, A.; Gijbels, R.; Goedheer, W. |
Comparison between a radio-frequency and direct current glow discharge in argon by a hybrid Monte Carlo-fluid model for electrons, argon ions and fast argon atoms |
1999 |
Spectrochimica acta: part B : atomic spectroscopy |
54 |
11 |
UA library record; WoS full record; WoS citing articles |
Bogaerts, A. |
Comprehensive modelling network for dc glow discharges in argon |
1999 |
Plasma sources science and technology |
8 |
27 |
UA library record; WoS full record; WoS citing articles |
Bogaerts, A. |
The glow discharge: an exciting plasma |
1999 |
Journal of analytical atomic spectrometry |
14 |
29 |
UA library record; WoS full record; WoS citing articles |
Bogaerts, A.; Gijbels, R.; Goedheer, W. |
Hybrid modeling of a capacitively coupled radio frequency glow discharge in argon: combined Monte Carlo and fluid model |
1999 |
Japanese journal of applied physics |
38 |
45 |
UA library record; WoS full record; WoS citing articles |
Bogaerts, A.; Yan, M.; Gijbels, R.; Goedheer, W. |
Modeling of ionization of argon in an analytical capacitively coupled radio-frequency glow discharge |
1999 |
Journal of applied physics |
86 |
18 |
UA library record; WoS full record; WoS citing articles |
Bogaerts, A.; Gijbels, R. |
Monte Carlo model for the argon ions and fast argon atoms in a radio-frequency discharge |
1999 |
IEEE transactions on plasma science |
27 |
15 |
UA library record; WoS full record; WoS citing articles |
Bogaerts, A.; Gijbels, R. |
New developments and applications in GDMS |
1999 |
Fresenius' journal of analytical chemistry |
364 |
17 |
UA library record; WoS full record; WoS citing articles |
Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals |
1999 |
Journal of the American Society for Mass Spectrometry |
10 |
4 |
UA library record; WoS full record; WoS citing articles |
Bogaerts, A.; Gijbels, R. |
Role of Ar2+ and Ar+2 ions in a direct current argon glow discharge: a numerical description |
1999 |
Journal of applied physics |
86 |
50 |
UA library record; WoS full record; WoS citing articles |
Berezhnoi, S.; Kaganovich, I.; Misina, M.; Bogaerts, A.; Gijbels, R. |
Semianalytical description of nonlocal secondary electrons in a radio-frequency capacitively coupled plasma at intermediate pressures |
1999 |
IEEE transactions plasma science |
27 |
7 |
UA library record; WoS full record; WoS citing articles |
van Vaeck, L.; Adriaens, A.; Gijbels, R. |
Static secondary ion mass spectrometry (S-SIMS): part 1: methodology and structural interpretation |
1999 |
Mass spectrometry reviews |
18 |
112 |
UA library record; WoS full record; WoS citing articles |
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1999 |
Journal of analytical atomic spectrometry |
14 |
10 |
UA library record; WoS full record; WoS citing articles |
Conard, T.; de Witte, H.; Loo, R.; Verheyen, P.; Vandervorst, W.; Caymax, M.; Gijbels, R. |
XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers |
1999 |
Thin solid films : an international journal on the science and technology of thin and thick films |
343/344 |
1 |
UA library record; WoS full record; WoS citing articles |
Seo, J.W.; Schryvers, D.; Vermeulen, W.; Richard, O.; Potapov, P. |
Electron microscopy investigation of ternary \gamma-brass-type precipitation in a Ni39.6Mn47.5Ti12.9 alloy |
1999 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
79 |
3 |
UA library record; WoS full record; WoS citing articles |
De Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. |
Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers |
1999 |
Microelectronic engineering |
45 |
|
UA library record; WoS full record |
Shevchenko, V.P.; Van Grieken, R.E.; van Malderen, H.; Lisitzin, A.P.; Kuptsov, V.M.; Serova, V.V. |
Composition of individual aerosol particles in the marine boundary layer over seas of the Western Russian Arctic |
1999 |
Doklady earth sciences |
366 |
|
UA library record; WoS full record; WoS citing articles |
Pokatilov, E.P.; Fomin, V.M.; Balaban, S.N.; Gladilin, V.N.; Klimin, S.N.; Devreese, J.T.; Magnus, W.; Schoenmaker, W.; Collaert, N.; van Rossum, M.; de Meyer, K. |
Distribution of fields and charge carriers in cylindrical nanosize silicon-based metal-oxide-semiconductor structures |
1999 |
Journal Of Applied Physics |
85 |
16 |
UA library record; WoS full record; WoS citing articles |
Cloetens, P.; Ludwig, W.; Baruchel, J.; van Dyck, D.; van Landuyt, J.; Guigay, J.P.; Schlenker, M. |
Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays |
1999 |
Applied physics letters |
75 |
481 |
UA library record; WoS full record; WoS citing articles |
Ahenach, J.; Cool, P.; Vansant, E.F.; Lebedev, O.; van Landuyt, J. |
Influence of water on the pillaring of montmorillonite with aminopropyltriethoxysilane |
1999 |
Physical chemistry, chemical physics |
1 |
10 |
UA library record; WoS full record; WoS citing articles |