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Van Tendeloo, G.; Lebedev, O.I.; Verbist, K.; Abakumov, A.M.; Shpanchenko, R.V.; Antipov, E.V.; Blank, D.H.A. The local structure of YBCO based materials by TEM 1999 UA library record; WoS full record;
Van Aert, S. Statistical parameter estimation theory : a tool for quantitative electron microscopy 2012 UA library record
Van Tendeloo, G. TEM characterization of structural defects 1996 UA library record; WoS full record;
Lubk, A.; Vogel, K.; Wolf, D.; Krehl, J.; Röder, F.; Clark, L.; Guzzinati, G.; Verbeeck, J. Fundamentals of Focal Series Inline Electron Holography 2016 Advances in imaging and electron physics T2 – Advances in imaging and electron physics / Hawkes, P.W. [edit.] UA library record pdf url doi
Goessens, C.; Schryvers, D.; van Landuyt, J.; Geuens, I.; Gijbels, R.; Jacob, W.; de Keyzer, R. A temperature study of mixed AgBr-AgBrI tabular crystals 1995 3 UA library record; WoS full record; WoS citing articles
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. Statistical experimental design for quantitative atomic resolution transmission electron microscopy 2004 13 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data 2008 UA library record doi
Van Tendeloo, G. Art, science and sustainability = Kunst, wetenschap en duurzaamheid 2016 UA library record
Bals, S.; Stes, A.; Celis, V. Klassieke toetsing in de praktijk 2009 UA library record
Idrissi, H.; Schryvers, D. Investigation of the elementary mechanisms controlling dislocation/twin boundary interactions in fcc metals and alloys : from conventional to advanced TEM characterization 2012 UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Efficient fitting algorithm 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Introduction 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. High resolution electron microscopy from imaging towards measuring 2001 ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 UA library record doi
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. Atom column detection 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Atom counting 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. General conclusions and future perspectives 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. Image-quality evaluation and model selection with maximum a posteriori probability 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Optimal experiment design for nanoparticle atom counting from ADF STEM images 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Statistical parameter estimation theory : principles and simulation studies 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
Fredrickx, P.; Wouters, J.; Schryvers, D. The application of transmission electron microscopy (TEM) in the research of inorganic colorants in stained glass windows and parchment illustrations 2003 UA library record
van Landuyt, J.; Van Tendeloo, G. Charcaterization by high-resolution transmission electron microscopy 1998 UA library record; WoS full record;
Hervieu, M.; Martin, C.; Van Tendeloo, G.; Mercey, B.; Maignan, A.; Jirak, Z.; Raveau, B. Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties 2000 UA library record
Raveau, B.; Hervieu, M.; Michel, C.; Martin, C.; Maignan, A.; Van Tendeloo, G. Crystal chemistry of mercury based layered cuprates and oxycarbonates 1995 UA library record
Lebedev, O.; Van Tendeloo, G.; Marezio, M.; Licci, F.; Gilioli, E.; Gauzzi, A.; Prodi, A. The crystal structure of YSr2Cu3O6+x determined by HREM 2002 UA library record
Colomer, J.-F.; Van Tendeloo, G. Electron diffraction and microscopy of single-walled carbon nanotube bundles 2003 UA library record
Amelinckx, S.; Nistor, L.C.; Van Tendeloo, G. Electron microscopic study of long period ordering in complex oxides 1994 UA library record
Van Tendeloo, G.; Amelinckx, S. Electron microscopy of fullerenes and related materials 2000 UA library record
Van Tendeloo, G.; Goessens, C.; Schryvers, D.; van Haverbergh, J.; de Veirman, A.; van Landuyt, J. Electron microscopy of interfaces in new materials 1991 UA library record
Van Tendeloo, G.; Amelinckx, S. Electron microscopy of C60 and C70 fullerites 1993 UA library record
van Landuyt, J. High resolution electron microscopy for materials 1992 7 UA library record; WoS full record; WoS citing articles
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