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	Record						Links
	Author	Van Tendeloo, G.
	Title	TEM characterization of structural defects			Type	H1 Book chapter
	Year	1996	Publication		Abbreviated Journal
	Volume		Issue		Pages	473-507
	Keywords	H1 Book chapter; Electron microscopy for materials research (EMAT)
	Abstract
	Address
	Corporate Author				Thesis
	Publisher	Plenum Press	Place of Publication	New York	Editor
	Language		Wos	A1996BF84E00042	Publication Date	0000-00-00
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN		ISBN		Additional Links	UA library record; WoS full record;
	Impact Factor		Times cited		Open Access
	Notes				Approved	no
	Call Number	UA @ lucian @ c:irua:16865			Serial	3477
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