| |
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Pentcheva, E.N.; Petrov, P.S.; Van 't dack, L.; Gijbels, R. |
Études génétiques du système “eau thermale – gaz – roche” sous l'influence de phénomènes volcaniques récents |
1995 |
Doklady Bolgarskoi Akademii Nauk |
48 |
|
UA library record |
|
|
|
Pentcheva, E.N.; Swenters, K.; Van 't dack, L.; Verlinden, J.; Gijbels, R. |
Recherches microchimiques comparatives (SME et AAN) d'hydrothermes des granites de la Bulgarie du Sud |
1984 |
Doklady Bolgarskoi Akademii Nauk |
37 |
|
UA library record |
|
|
|
Pentcheva, E.N.; Veldeman, E.; Van 't dack, L.; Gijbels, R. |
Sur l'équilibre hydrogéochimique “solution – suspension” dans les systèmes hydrothermaux du socle cristallin |
1996 |
Doklady Bolgarskoi Akademii Nauk |
49 |
|
UA library record |
|
|
|
Gijbels, R. |
Chemical analysis in metal processing: overview and future needs in refined and ultrapure metals |
1991 |
Acta technica Belgica: metallurgie |
30 |
|
UA library record |
|
|
|
van Vaeck, L.; van Roy, W.; Gijbels, R. |
Laser ionization mass spectrometry for the characterization of solid materials |
1993 |
Analusis : chimie analytique, méthodes physiques d'analyse, composition de la matière |
21 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Vaeck, L.; Vanroy, W.; Gijbels, R. |
Laser ionization mass-spectrometry for the characterization of solid materials |
1992 |
Analusis : chimie analytique, méthodes physiques d'analyse, composition de la matière |
20 |
|
UA library record; WoS full record; |
|
|
|
Slanina, Z.; Martin, J.M.L.; François, J.P.; Gijbels, R. |
On the relative stabilities of the linear and triangular forms of B3N |
1993 |
Chemical physics |
178 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Vaeck, L.; Adriaens, A.; Gijbels, R. |
Static secondary ion mass spectrometry (S-SIMS): part 1: methodology and structural interpretation |
1999 |
Mass spectrometry reviews |
18 |
112 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Hellmuth, K.H.; Siitari-Kaupi, M.; Rauhala, E.; Johansson, B.; Zilliacus, R.; Gijbels, R.; Adriaens, A. |
Reactions of high FeO-olivine rock with groundwater and redox-sensitive elements studied by surface-analytical methods and autoradiography |
1994 |
Materials Research Society symposium proceedings |
333 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Straaten, M.; Swenters, K.; Gijbels, R.; Verlinden, J.; Adriaenssens, E. |
Analysis of platinum powder by glow discharge mass spectrometry |
1994 |
Journal of analytical atomic spectrometry |
9 |
17 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
Argon and copper optical emission spectra in a Grimm glow discharge source: mathematical simulations and comparison with experiment |
1998 |
Journal of analytical atomic spectrometry |
13 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
Calculation of cathode heating in analytical glow discharges |
2004 |
Journal of analytical atomic spectrometry |
19 |
21 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Okhrimovskyy, A.; Gijbels, R. |
Calculation of the gas flow and its effect on the plasma characteristics for a modified Grimm-type glow discharge cell |
2002 |
Journal of analytical atomic spectrometry |
17 |
39 |
UA library record; WoS full record; WoS citing articles |
|
|
|
de Vyt, A.; Gijbels, R.; Davock, H.; van Roost, C.; Geuens, I. |
Characterization of AgxAuy nano particles by TEM and STEM |
1999 |
Journal of analytical atomic spectrometry |
14 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Held, A.; Taylor, P.; Ingelbrecht, C.; de Bièvre, P.; Broekaert, J.; van Straaten, M.; Gijbels, R. |
Determination of scandium in high-purity titanium using inductively coupled plasma mass spectrometry and glow discharge mass spectrometry as part of its certification as a reference material |
1995 |
Journal of analytical atomic spectrometry |
10 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
Effects of adding hydrogen to an argon glow discharge: overview of relevant processes and some qualitative explanations |
2000 |
Journal of analytical atomic spectrometry |
15 |
58 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
Hybrid Monte Carlo-fluid model for a microsecond pulsed glow discharge |
2000 |
Journal of analytical atomic spectrometry |
15 |
23 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R.; Goedheer, W. |
Improved hybrid Monte Carlo-fluid model for the electrical characteristics in an analytical radiofrequency glow discharge in argon |
2001 |
Journal of analytical atomic spectrometry |
16 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
Modeling of a microsecond pulsed glow discharge: behavior of the argon excited levels and of the sputtered copper atoms and ions |
2001 |
Journal of analytical atomic spectrometry |
16 |
36 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R.; Jackson, G.P. |
Modeling of a millisecond pulsed glow discharge: investigation of the afterpeak |
2003 |
Journal of analytical atomic spectrometry |
18 |
42 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
Modeling of argon direct current glow discharges and comparison with experiment: how good is the agreement? |
1998 |
Journal of analytical atomic spectrometry |
13 |
24 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
Relative sensitivity factors in glow discharge mass spectrometry: the role of charge transfer ionization |
1996 |
Journal of analytical atomic spectrometry |
11 |
38 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
Similarities and differences between direct current and radio-frequency glow discharges: a mathematical simulation |
2000 |
Journal of analytical atomic spectrometry |
15 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1999 |
Journal of analytical atomic spectrometry |
14 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
Computer simulation of an analytical direct current glow discharge in argon: influence of the cell dimensions on the plasma quantities |
1997 |
Journal of analytical atomic spectrometry |
12 |
21 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Martin, J.M.L.; François, J.P.; Gijbels, R. |
A critical comparison of MINDO/3, MNDO, AM1 and PM3 for a model problem: carbon clusters C2-C10. An ad hoc reparametrization of MNDO well suited for the accurate prediction of their spectroscopic constants |
1991 |
Journal of computational chemistry |
12 |
76 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Oleshko, V.; Volkov, V.; Gijbels, R.; Jacob, W.; Vargaftik, M.; Moiseev, I.; Van Tendeloo, G. |
High-resolution electron microscopy and electron energy-loss spectroscopy of giant palladium clusters |
1995 |
Zeitschrift für Physik : D : atoms, molecules and clusters |
34 |
22 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Martin, J.M.L.; François, J.P.; Gijbels, R. |
Ab initio spectroscopy and thermochemistry of the BN molecule |
1991 |
Zeitschrift für Physik : D : atoms, molecules and clusters |
21 |
17 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Adriaensen, L.; Vangaever, F.; Gijbels, R. |
A comparative study of carbocyanine dyes measured with TOF-SIMS and other mass spectrometric techniques |
2004 |
Applied surface science |
231/232 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Ignatova, V.A.; Conard, T.; Möller, W.; Vandervorst, W.; Gijbels, R. |
Depth profiling of ZrO2/SiO2/Si stacks : a TOF-SIMS and computer simulation study |
2004 |
Applied surface science |
231/232 |
4 |
UA library record; WoS full record; WoS citing articles |
|
