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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
|
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
Atom column detection |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
|
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Atom counting |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
|
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Efficient fitting algorithm |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
|
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
General conclusions and future perspectives |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
|
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
Image-quality evaluation and model selection with maximum a posteriori probability |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
|
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Introduction |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
|
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Optimal experiment design for nanoparticle atom counting from ADF STEM images |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
|
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Statistical parameter estimation theory : principles and simulation studies |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
|
Schryvers, D. |
Experimental studies on precursor phenomena in displacive phase transformations |
1997 |
Properties Of Complex Inorganic Solids |
|
1 |
UA library record; WoS full record; WoS citing articles |
|
Van Tendeloo, G.; Bernaerts, D.; Amelinckx, S. |
Reduced dimensionality in different forms of carbon |
1998 |
Fullerenes and carbon based materials |
|
|
UA library record; WoS full record; |
|
Schryvers, D.; Tanner, L.E. |
On the phase-like nature of the 7m structure in ni-al |
1994 |
|
|
1 |
UA library record; WoS full record; WoS citing articles |
|
Colomer, J.-F.; Henrard, L.; Lambin, P.; Van Tendeloo, G. |
Electron diffraction of nanotubes bundles : unique helicity and tube-tube atomically coherent packing |
2002 |
AIP conference proceedings
T2 – 16th International Winterschool on Electronic Properties of Novel, Materials, MAR 02-09, 2002, KIRCHBERG, AUSTRIA |
|
|
UA library record; WoS full record |
|
Van Tendeloo, G.; op de Beeck, M.; De Meulenaere, P.; van Dyck, D. |
Towards quantitative high resolution electron microscopy? |
1995 |
Institute of physics conference series |
147 |
|
UA library record; WoS full record; |
|
Verbist, K.; Lebedev, O.I.; Van Tendeloo, G.; Verhoeven, M.A.J.; Rijnders, A.J.H.M.; Blank, D.H.A. |
Study of ramp-type Josephson junctions by HREM |
1997 |
Electronic Applications; Vol 2: Large Scale And Power Applications |
|
|
UA library record; WoS full record; |
|
Rembeza, S.I.; Loginov, V.A.; Svistova, T.V.; Podkopaeva, O.I.; Rembeza, E.S.; van Landuyt, J. |
Laser thermotreatment of the SnO2layers |
1998 |
Eurosensors XII, vols 1 and 2 |
|
|
UA library record; WoS full record; |
|
Seo, J.W.; Schryvers, D.; Potapov, P. |
Electron microscopy study of ternary precipitates in Ni39.6Mn47.5Ti12.9 |
1998 |
|
|
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UA library record; WoS full record; |
|
Lebedev, O.; Van Tendeloo, G.; Amelinckx, S.; Leibold, B.; Habermeier, H.U. |
HREM investigation of La(1-x)Ca(x)MnO3-delta thin films |
1998 |
|
|
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UA library record; WoS full record; |
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Verbist, K.; Tafuri, F.; Granozio, F.M.; Di Chiara, S.; Van Tendeloo, G. |
Microstructure of artificial [100] 45 degrees twist grain boundaries in YBa2Cu3O7-delta |
1998 |
Electron Microscopy 1998, Vol 2: Materials Science 1 |
|
|
UA library record; WoS full record; |
|
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
Clustering of vacancies on {113} planes in Si layers close to Si-Si3N4 interfaces and further aggregation of self-interstitials inside vacancy clusters during electron irradiation |
1999 |
Institute of physics conference series
T2 – Conference on Microscopy of Semiconducting Materials, MAR 22-25, 1999, UNIV OXFORD, OXFORD, ENGLAND |
|
|
UA library record; WoS full record; |
|
Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K. |
Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation |
2001 |
Institute of physics conference series |
|
|
UA library record; WoS full record; |
|
Nistor, L.; Bender, H.; van Landuyt, J.; Nemeth, S.; Boeve, H.; De Boeck, J.; Borghs, G. |
HREM investigation of a Fe/GaN/Fe tunnel junction |
2001 |
Institute of physics conference series
T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, Univ of Oxford, Oxford, England |
|
|
UA library record; WoS full record; |
|
Hens, S.; Bender, H.; Donaton, R.A.; Maex, K.; Vanhaelemeersch, S.; van Landuyt, J. |
EFTEM study of plasma etched low-k Si-O-C dielectrics |
2001 |
Institute of physics conference series
T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, UNIV OXFORD, OXFORD, ENGLAND |
|
|
UA library record; WoS full record; |
|
Nistor, L.C.; Richard, O.; Zhao, O.; Bender, H.; Stesmans, A.; Van Tendeloo, G. |
A microstructural study of the thermal stability of atomic layer deposited Al2O3 thin films |
2003 |
Institute of physics conference series
T2 – Microscopy of semiconducting materials |
|
|
UA library record; WoS full record; |
|
Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis |
2003 |
Institute of physics conference series |
|
|
UA library record; WoS full record; |
|
Van Tendeloo, G.; Amelinckx, S. |
Electron-microscopy and the structural studies of superconducting materials and fullerites |
1994 |
NATO Advanced Study Institutes series: series E : applied sciences
T2 – NATO Advanced Study Institute on Materials and crystallographic Aspects, of HT(c)-Superconductivity, May 17-30, 1993, Erice, Italy |
|
|
UA library record; WoS full record; |
|
Kuriplach, J.; van Petegem, S.; Hou, M.; Van Tendeloo, G.; Schryvers, D.; et al. |
Positron annihilation study of nanocrystalline Ni3Al : simulations and measurements |
2001 |
Materials science forum
T2 – 12th International Conference on Positron Annihilation (ICPA-12), AUG 06-12, 2000, UNIV BUNDERSWEHR MUNCHEN, NEUBIBERG, GERMANY |
363-3 |
|
UA library record; WoS full record; WoS citing articles |
|
Van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; Van Roost, C.; De Keyzer, R.B. |
Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study |
2000 |
|
|
|
UA library record; WoS full record; |
|
Van Renterghem, W.; Karthauser, S.; Schryvers, D.; van Landuyt, J.; De Keyzer, R.; Van Roost, C. |
The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals |
2000 |
|
|
|
UA library record; WoS full record; |
|
Albrecht, W.; Van Aert, S.; Bals, S. |
Three-Dimensional Nanoparticle Transformations Captured by an Electron Microscope |
2021 |
Accounts Of Chemical Research |
54 |
12 |
UA library record; WoS full record; WoS citing articles |
|
Mosquera, J.; Wang, D.; Bals, S.; Liz-Marzan, L.M. |
Surfactant layers on gold nanorods |
2023 |
Accounts of chemical research |
56 |
8 |
UA library record; WoS full record; WoS citing articles |