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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Statistical parameter estimation theory : principles and simulation studies |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
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UA library record |
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Bals, S.; Stes, A.; Celis, V. |
Klassieke toetsing in de praktijk |
2009 |
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UA library record |
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Van Grieken, R.; Janssens, K. |
Cultural heritage conservation and environmental impact assessment by non-destructive testing and micro-analysis |
2005 |
|
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UA library record |
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Adams, F.; Gijbels, R.; van Grieken, R.; Kim, Y.-sang |
Inorganic mass spectrometry |
1999 |
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UA library record |
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Camuffo, D.; Pagan, E.; Schellen, H.; Van Grieken, R.; Bencs, L.; et al. |
Church heating and cultural heritage conservation : guide to the analysis of pros and cons of various heating systems |
2006 |
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UA library record |
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Swerling, G.; Travaglini, B.; Van Grieken, R.; Spolnik, Z.; Bencs, L.; [et al.]; European Project Freindly-Heating |
Il riscaldamento nelle chiese e la conservazione dei beni culturali = Church heating and the preservation of the cultural heritage |
2006 |
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UA library record |
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Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. |
Electron microscopy: principles and fundamentals |
1997 |
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UA library record |
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Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. |
Handbook of microscopy: applications in materials science, solid-state physics and chemistry |
1997 |
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UA library record |
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Bafekry, A.; Stampfl, C.; Ghergherehchi, M. |
Strain, electric-field and functionalization induced widely tunable electronic properties in MoS2/BC3, /C3N and / C3N4 van der Waals heterostructures |
2020 |
Nanotechnology (Bristol. Print) |
|
19 |
UA library record; WoS full record; WoS citing articles |
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Steiner, R.E.; Barshick, C.M.; Bogaerts, A. |
Glow discharge optical spectroscopy and mass spectrometry |
2009 |
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UA library record |
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Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. |
Determination of the silver sulphide cluster size distribution via computer simulations |
2000 |
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UA library record; WoS full record; |
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Van Grieken, R.E.; Markowicz, A.A. |
Handbook of X-ray spectrometry |
2002 |
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UA library record |
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Vincze, L.; Janssens, K.; Vekemans, B.; Adams, F. |
Monte Carlo simulation of X-ray fluorescence and scattering tomography experiments |
1999 |
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UA library record; WoS full record; WoS citing articles |
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Lamoen, D.; Michel, K.H. |
Molecular structure, crystal field and orientational order in solid C60 |
1994 |
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UA library record; WoS full record; |
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Lujan, G.S.; Magnus, W.; Soree, B.; Pourghaderi, M.A.; Veloso, A.; van Dal, M.J.H.; Lauwers, A.; Kubicek, S.; De Gendt, S.; Heyns, M.; De Meyer, K.; |
A new method to calculate leakage current and its applications for sub-45nm MOSFETs |
2005 |
Solid-State Device Research (ESSDERC), European Conference
T2 – ESSDERC 2005 : proceedings of 35th European Solid-State Device Research Conference, September 12-16, 2005, Grenoble, France |
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UA library record; WoS full record |
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Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
High resolution electron microscopy from imaging towards measuring |
2001 |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
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UA library record |
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Janssens, K.H.A.; Adams, F.C.V.; Rindby, A. |
Microscopic X-ray fluorescence analysis |
2000 |
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UA library record |
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Vertes, A.; Gijbels, R.; Adams, F. |
Laser ionization mass analysis |
1993 |
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UA library record |
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Tsuji, K.; Injuk, J.; Van Grieken, R. |
X-ray spectrometry: recent technological advances |
2004 |
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UA library record |
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Vávra, O.; Gaži, S.; Golubović, D.S.; Vávra, I.; Dérer, J.; Verbeeck, J.; Van Tendeloo, G.; Moshchalkov, V.V. |
0 and π phase Josephson coupling through an insulating barrier with magnetic impurities |
2006 |
Physical review : B : condensed matter and materials physics |
74 |
27 |
UA library record; WoS full record; WoS citing articles |
|
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Van Tendeloo, G.; Bals, S.; Van Aert, S.; Verbeeck, J.; van Dyck, D. |
Advanced electron microscopy for advanced materials |
2012 |
Advanced materials |
24 |
107 |
UA library record; WoS full record; WoS citing articles |
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Iyikanat, F.; Sahin, H.; Senger, R.T.; Peeters, F.M. |
Ag and Au atoms intercalated in bilayer heterostructures of transition metal dichalcogenides and graphene |
2014 |
APL materials |
2 |
10 |
UA library record; WoS full record; WoS citing articles |
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Lentijo-Mozo, S.; Tan, R.P.; Garcia-Marcelot, C.; Altantzis, T.; Fazzini, P.F.; Hungria, T.; Cormary, B.; Gallagher, J.R.; Miller, J.T.; Martinez, H.; Schrittwieser, S.; Schotter, J.; Respaud, M.; Bals, S.; Van Tendeloo, G.; Gatel, C.; Soulantica, K. |
Air- and water-resistant noble metal coated ferromagnetic cobalt nanorods |
2015 |
ACS nano |
9 |
25 |
UA library record; WoS full record; WoS citing articles |
|
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Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D. |
An alternative approach to determine attainable resolution directly from HREM images |
2013 |
Ultramicroscopy |
133 |
|
UA library record; WoS full record |
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Ludu, A.; Van Deun, J.; Milošević, M.V.; Cuyt, A.; Peeters, F.M. |
Analytic treatment of vortex states in cylindrical superconductors in applied axial magnetic field |
2010 |
Journal of mathematical physics |
51 |
10 |
UA library record; WoS full record; WoS citing articles |
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Pfannmöller, M.; Heidari, H.; Nanson, L.; Lozman, O.R.; Chrapa, M.; Offermans, T.; Nisato, G.; Bals, S. |
Quantitative Tomography of Organic Photovoltaic Blends at the Nanoscale |
2015 |
Nano letters |
15 |
26 |
UA library record; WoS full record; WoS citing articles |
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de Backer, A.; Martinez, G.T.; Rosenauer, A.; Van Aert, S. |
Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations |
2013 |
Ultramicroscopy |
134 |
48 |
UA library record; WoS full record; WoS citing articles |
|
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Van Aert, S. |
Atomen in 3D : Antwerpenaren brengen atomaire structuur nanodeeltjes in beeld |
2011 |
Chemie magazine |
7 |
|
UA library record |
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Mueller, K.; Krause, F.F.; Béché, A.; Schowalter, M.; Galioit, V.; Loeffler, S.; Verbeeck, J.; Zweck, J.; Schattschneider, P.; Rosenauer, A. |
Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction |
2014 |
Nature communications |
5 |
197 |
UA library record; WoS full record; WoS citing articles |
|
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Dendooven, J.; Devloo-Casier, K.; Ide, M.; Grandfield; Kurttepeli; Ludwig, K.F.; Bals, S.; Van der Voort, P.; Detavernier, C. |
Atomic layer deposition-based tuning of the pore size in mesoporous thin films studied by in situ grazing incidence small angle X-ray scattering |
2014 |
Nanoscale |
6 |
41 |
UA library record; WoS full record; WoS citing articles |
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