| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Bogaerts, A.; van Straaten, M.; Gijbels, R. |
Description of the thermalization process of the sputtered atoms in a glow discharge using a 3-dimensional Monte Carlo method |
1995 |
Journal of applied physics |
77 |
87 |
UA library record; WoS full record; WoS citing articles |
| Bogaerts, A.; Gijbels, R.; Goedheer, W. |
Hybrid Monte Carlo-fluid model of a direct current glow discharge |
1995 |
Journal of applied physics |
78 |
117 |
UA library record; WoS full record; WoS citing articles |
| Hai, G.-Q.; Studart, N.; Peeters, F.M.; Koenraad, P.M.; Wolter, J.H. |
Intersubband-coupling and screening effects on the electron transport in a quasi-two-dimensional δ-doped semiconductor system |
1996 |
Journal of applied physics |
80 |
40 |
UA library record; WoS full record; WoS citing articles |
| Laffez, P.; Van Tendeloo, G.; Seshadri, R.; Hervieu, M.; Martin, C.; Maignan, A.; Raveau, B. |
Microstructural and physical properties of layered manganite oxides related to the magnetoresistive perovskites |
1996 |
Journal of applied physics |
80 |
36 |
UA library record; WoS full record; WoS citing articles |
| Bogaerts, A.; Gijbels, R. |
The role of fast argon ions and atoms in the ionization of argon in a direct current glow discharge: a mathematical simulation |
1995 |
Journal of applied physics |
78 |
60 |
UA library record; WoS full record; WoS citing articles |
| Bogaerts, A.; Gijbels, R. |
Role of sputtered Cu atoms and ions in a direct current glow discharge: combined fluid and Monte Carlo model |
1996 |
Journal of applied physics |
79 |
81 |
UA library record; WoS full record; WoS citing articles |
| Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; Hevesi, K.; Gensterblum, G.; Yu, L.M.; Pireaux, J.J.; Grey, F.; Bohr, J. |
Structural defects and epitaxial rotation of C60 and C70 (111) films on GeS(001) |
1996 |
Journal of applied physics |
80 |
6 |
UA library record; WoS full record; WoS citing articles |
| Chu, D.P.; Peeters, F.M.; Kolodinski, S.; Roca, E. |
Theoretical investigation of CoSi2/Si1-xGex detectors: influence of a Si tunneling barrier on the electro-optical characteristics |
1996 |
Journal of applied physics |
79 |
3 |
UA library record; WoS full record; WoS citing articles |
| Helm, M.; Hilber, W.; Fromherz, T.; Peeters, F.M.; Alavi, K.; Pathak, R.N. |
Bloch and localized electrons in semiconductor superlattices |
1994 |
Semiconductor science and technology |
9 |
1 |
UA library record; WoS full record; WoS citing articles |
| Peeters, F.M.; Devreese, J.T. |
Hot magneto-phonon and electro-phonon resonances in heterostructures |
1992 |
Semiconductor science and technology: B |
7 |
12 |
UA library record; WoS full record; WoS citing articles |
| Kastalsky, A.; Peeters, F.M.; Chan, W.K.; Florez, L.T.; Harbison, J.P. |
Novel nonlinear transport phenomena in a triangular quantum well |
1992 |
Semiconductor science and technology: B |
7 |
4 |
UA library record; WoS full record; WoS citing articles |
| Xu, W.; Peeters, F.M.; Devreese, J.T. |
Warm-electron transport in a two-dimensional semiconductor |
1992 |
Semiconductor science and technology |
7 |
3 |
UA library record; WoS full record; WoS citing articles |
| Janssens de Bisthoven, L.; Rochette, A.-J.; Verheyen, E.; Akpona, T.J.-D.; Verbist, B.; Vanderhaegen, K.; Naturinda, Z.; Van Passel, S.; Berihun, D.; Munishi, L.; Hugé, J. |
Conserving African biosphere reserves : a workshop on the valuation of ecosystem services in Man and the Biosphere Reserves |
2019 |
Oryx |
53 |
|
UA library record |
| Evans, T.; Kiflawi, I.; Luyten, W.; Van Tendeloo, G.; Woods, G.S. |
Conversion of platelets into dislocation loops and voidite formation in type IaB diamonds |
1995 |
Proceedings of the Royal Society of London: series A: mathematical and physical sciences |
449 |
32 |
UA library record; WoS full record; WoS citing articles |
| Velazco, A.; Nord, M.; Béché, A.; Verbeeck, J. |
Evaluation of different rectangular scan strategies for STEM imaging |
2020 |
Ultramicroscopy |
|
13 |
UA library record; WoS full record; WoS citing articles |
| Fatermans, J.; den Dekker, Aj.; Müller-Caspary, K.; Gauquelin, N.; Verbeeck, J.; Van Aert, S. |
Atom column detection from simultaneously acquired ABF and ADF STEM images |
2020 |
Ultramicroscopy |
219 |
9 |
UA library record; WoS full record; WoS citing articles |
| Prabhakara, V.; Jannis, D.; Guzzinati, G.; Béché, A.; Bender, H.; Verbeeck, J. |
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale |
2020 |
Ultramicroscopy |
219 |
4 |
UA library record; WoS full record; WoS citing articles |
| De wael, A.; De Backer, A.; Van Aert, S. |
Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations |
2020 |
Ultramicroscopy |
219 |
|
UA library record; WoS full record; WoS citing articles |
| Vohra, A.; Makkonen, I.; Pourtois, G.; Slotte, J.; Porret, C.; Rosseel, E.; Khanam, A.; Tirrito, M.; Douhard, B.; Loo, R.; Vandervorst, W. |
Source/drain materials for Ge nMOS devices: phosphorus activation in epitaxial Si, Ge, Ge1-xSnx and SiyGe1-x-ySnx |
2020 |
Ecs Journal Of Solid State Science And Technology |
9 |
|
UA library record; WoS full record; WoS citing articles |
| Velazco, A.; Béché, A.; Jannis, D.; Verbeeck, J. |
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings |
2022 |
Ultramicroscopy |
232 |
18 |
UA library record; WoS full record; WoS citing articles |
| Jannis, D.; Hofer, C.; Gao, C.; Xie, X.; Béché, A.; Pennycook, Tj.; Verbeeck, J. |
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications |
2022 |
Ultramicroscopy |
233 |
31 |
UA library record; WoS full record; WoS citing articles |
| Hofer, C.; Pennycook, T.J. |
Reliable phase quantification in focused probe electron ptychography of thin materials |
2023 |
Ultramicroscopy |
254 |
|
UA library record; WoS full record; WoS citing articles |
| Gorji, S.; Kashiwar, A.; Mantha, L.S.; Kruk, R.; Witte, R.; Marek, P.; Hahn, H.; Kübel, C.; Scherer, T. |
Nanowire facilitated transfer of sensitive TEM samples in a FIB |
2020 |
Ultramicroscopy |
219 |
|
UA library record |
| Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. |
Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution |
2022 |
Ultramicroscopy |
233 |
|
UA library record; WoS full record; WoS citing articles |
| Van Oijstaeijen, W.; Van Passel, S.; Cools, J.; Janssens de Bisthoven, L.; Huge, J.; Berihun, D.; Ejigu, N.; Nyssen, J. |
Farmers' preferences towards water hyacinth control : a contingent valuation study |
2020 |
Journal Of Great Lakes Research |
46 |
|
UA library record; WoS full record; WoS citing articles |
| Jannis, D.; Velazco, A.; Béché, A.; Verbeeck, J. |
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process |
2022 |
Ultramicroscopy |
|
4 |
UA library record; WoS full record; WoS citing articles |
| Hofer, C.; Gao, C.; Chennit, T.; Yuan, B.; Pennycook, T.J. |
Phase offset method of ptychographic contrast reversal correction |
2024 |
Ultramicroscopy |
|
|
UA library record; WoS full record |
| Sentürk, D.G.; De Backer, A.; Friedrich, T.; Van Aert, S. |
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors |
2022 |
Ultramicroscopy |
242 |
|
UA library record; WoS full record; WoS citing articles |
| De Backer, A.; Bals, S.; Van Aert, S. |
A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection |
2023 |
Ultramicroscopy |
|
3 |
UA library record; WoS full record; WoS citing articles |
| Zhang, Z.; Lobato, I.; De Backer, A.; Van Aert, S.; Nellist, P. |
Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions |
2023 |
Ultramicroscopy |
246 |
|
UA library record; WoS full record; WoS citing articles |
