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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Velazco, A.; Béché, A.; Jannis, D.; Verbeeck, J. |
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings |
2022 |
Ultramicroscopy |
232 |
18 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Jannis, D.; Hofer, C.; Gao, C.; Xie, X.; Béché, A.; Pennycook, Tj.; Verbeeck, J. |
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications |
2022 |
Ultramicroscopy |
233 |
31 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Jannis, D.; Velazco, A.; Béché, A.; Verbeeck, J. |
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process |
2022 |
Ultramicroscopy |
|
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Ghidelli, M.; Orekhov, A.; Bassi, A.L.; Terraneo, G.; Djemia, P.; Abadias, G.; Nord, M.; Béché, A.; Gauquelin, N.; Verbeeck, J.; Raskin, J.-p.; Schryvers, D.; Pardoen, T.; Idrissi, H. |
Novel class of nanostructured metallic glass films with superior and tunable mechanical properties |
2021 |
Acta Materialia |
|
27 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Idrissi, H.; Béché, A.; Gauquelin, N.; Ul-Haq, I.; Bollinger, C.; Demouchy, S.; Verbeeck, J.; Pardoen, T.; Schryvers, D.; Cordier, P. |
On the formation mechanisms of intragranular shear bands in olivine by stress-induced amorphization |
2022 |
Acta materialia |
239 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Guzzinati, G.; Béché, A.; McGrouther, D.; Verbeeck, J. |
Prospects for out-of-plane magnetic field measurements through interference of electron vortex modes in the TEM |
2019 |
Journal of optics |
21 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
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Cooper, D.; Denneulin, T.; Barnes, J.-P.; Hartmann, J.-M.; Hutin, L.; Le Royer, C.; Béché, A.; Rouvière, J.-L. |
Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy |
2012 |
Applied Physics Letters |
112 |
14 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. |
Spectroscopic coincidence experiments in transmission electron microscopy |
2019 |
Applied physics letters |
114 |
18 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Tan, H.; Egoavil, R.; Béché, A.; Martinez, G.T.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Rotella, H.; Boullay, P.; Pautrat, A.; Prellier, W. |
Mapping electronic reconstruction at the metal-insulator interface in LaVO3/SrVO3 heterostructures |
2013 |
Physical review : B : condensed matter and materials physics |
88 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Lubk, A.; Béché, A.; Verbeeck, J. |
Electron Microscopy of Probability Currents at Atomic Resolution |
2015 |
Physical review letters |
115 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Kleibert, A.; Balan, A.; Yanes, R.; Derlet, P.M.; Vaz, C.A.F.; Timm, M.; Fraile Rodríguez, A.; Béché, A.; Verbeeck, J.; Dhaka, R.S.; Radovic, M.; Nowak, U.; Nolting, F. |
Direct observation of enhanced magnetism in individual size- and shape-selected 3d transition metal nanoparticles |
2017 |
Physical review B |
95 |
21 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Savchenko, T.M.; Buzzi, M.; Howald, L.; Ruta, S.; Vijayakumar, J.; Timm, M.; Bracher, D.; Saha, S.; Derlet, P.M.; Béché, A.; Verbeeck, J.; Chantrell, R.W.; Vaz, C.A.F.; Nolting, F.; Kleibert, A. |
Single femtosecond laser pulse excitation of individual cobalt nanoparticles |
2020 |
Physical Review B |
102 |
1 |
UA library record; WoS full record |
|
|
|
Jones, E.; Cooper, D.; Rouvière, J.-L.; Béché, A.; Azize, M.; Palacios, T.; Gradecak, S. |
Towards rapid nanoscale measurement of strain in III-nitride heterostructures |
2013 |
Applied Physics Letters |
103 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Cooper, D.; Le Royer, C.; Béché, A.; Rouvière, J.-L. |
Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy |
2012 |
Applied Physics Letters |
100 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Rouvière, J.-L.; Béché, A.; Martin, Y.; Denneulin, T.; Cooper, D. |
Improved strain precision with high spatial resolution using nanobeam precession electron diffraction |
2013 |
Applied physics letters |
103 |
53 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. |
Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping |
2019 |
Applied physics letters |
114 |
17 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Cooper, D.; Rouvière, J.-L.; Béché, A.; Kadkhodazadeh, S.; Semenova, E.S.; Dunin-Borkowsk, R. |
Quantitative strain mapping of InAs/InP quantum dots with 1 nm spatial resolution using dark field electron holography |
2011 |
Applied physics letters |
99 |
26 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vanrompay, H.; Béché, A.; Verbeeck, J.; Bals, S. |
Experimental Evaluation of Undersampling Schemes for Electron Tomography of Nanoparticles |
2019 |
Particle and particle systems characterization |
36 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vega Ibañez, F.; Béché, A.; Verbeeck, J. |
Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (TEM)? |
2022 |
Microscopy and microanalysis |
|
3 |
UA library record; WoS full record; WoS citing articles |
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