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Focused electron beam induced deposition as a tool to create electron vortices”. Béché, A, Winkler R, Plank H, Hofer F, Verbeeck J, Micron 80, 34 (2015). http://doi.org/10.1016/j.micron.2015.07.011
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Influence of mold preheating and silicon content on microstructure and casting properties of ductile iron in permanent mold”. Khalil-Allafi J, Amin-Ahmadi B, Journal of iron and steel research international 18, 34 (2011). http://doi.org/10.1016/S1006-706X(11)60034-4
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Atomic resolution of interfaces in ceramic-superconductors”. Van Tendeloo G, Krekels T, Amelinckx S, Hervieu M, Raveau B, Greaves C, , 35 (1995)
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A holographic method to measure the source size broadening in STEM”. Verbeeck J, Béché, A, van den Broek W, Ultramicroscopy 120, 35 (2012). http://doi.org/10.1016/j.ultramic.2012.05.007
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Statistical consequences of applying a PCA noise filter on EELS spectrum images”. Lichtert S, Verbeeck J, Ultramicroscopy 125, 35 (2013). http://doi.org/10.1016/j.ultramic.2012.10.001
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The ASTRA Toolbox: A platform for advanced algorithm development in electron tomography”. van Aarle W, Palenstijn WJ, De Beenhouwer J, Altantzis T, Bals S, Batenburg KJ, Sijbers J, Ultramicroscopy 157, 35 (2015). http://doi.org/10.1016/j.ultramic.2015.05.002
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A bimodal tomographic reconstruction technique combining EDS-STEM and HAADF-STEM”. Zhong Z, Goris B, Schoenmakers R, Bals S, Batenburg KJ, Ultramicroscopy 174, 35 (2017). http://doi.org/10.1016/j.ultramic.2016.12.008
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Controlling pore size and uniformity of mesoporous titania by early stage low temperature stabilization”. Herregods SJF, Mertens M, Van Havenbergh K, Van Tendeloo G, Cool P, Buekenhoudt A, Meynen V, Journal of colloid and interface science 391, 36 (2013). http://doi.org/10.1016/j.jcis.2012.07.098
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A temperature study of mixed AgBr-AgBrI tabular crystals”. Goessens C, Schryvers D, van Landuyt J, Geuens I, Gijbels R, Jacob W, de Keyzer R, , 36 (1992)
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Extended homologous series of Sn–O layered systems: A first-principles study”. Govaerts K, Partoens B, Lamoen D, Solid state communications 243, 36 (2016). http://doi.org/10.1016/j.ssc.2016.06.006
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Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure”. Alania M, Altantzis T, De Backer A, Lobato I, Bals S, Van Aert S, Ultramicroscopy 177, 36 (2016). http://doi.org/10.1016/j.ultramic.2016.11.002
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A mercury-based “1201-0201&rdquo, intergrowth HgBa2La2Cu2O8+x: a 53K superconductor”. Huvé, M, Martin C, Van Tendeloo G, Maignan A, Michel C, Hervieu M, Raveau B, Solid state communications 90, 37 (1994)
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Microstructure and precipitates in as-cast Co38Ni33Al29 shape memory alloy”. Bartova B, Schryvers D, Yang Z, Ignacova S, Sittner P, Scripta materialia 57, 37 (2007). http://doi.org/10.1016/j.scriptamat.2007.03.007
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Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study”. Van Renterghem W, Schryvers D, van Landuyt J, Bollen D, Van Roost C, De Keyzer RB, , 38 (2000)
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Two phase intergrowth in Bi2Sr2Ca0.6Y0.4Cu2Oy single crystals”. Zhang XF, Van Tendeloo G, Ge SL, Emmen JHPM, Brabers VAM, Physica: C : superconductivity 215, 39 (1993). http://doi.org/10.1016/0921-4534(93)90362-T
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Advanced reconstruction algorithms for electron tomography : from comparison to combination”. Goris B, Roelandts T, Batenburg KJ, Heidari Mezerji H, Bals S, Ultramicroscopy 127, 40 (2013). http://doi.org/10.1016/j.ultramic.2012.07.003
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Nanodiamonds do not provide unique evidence for a Younger Dryas impact”. Tian H, Schryvers D, Claeys P, Proceedings of the National Academy of Sciences of the United States of America 108, 40 (2011). http://doi.org/10.1073/pnas.1007695108
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Chronic interstitial nephritis in agricultural communities : a toxin-induced proximal tubular nephropathy”. Vervaet BA, Nast CC, Jayasumana C, Schreurs G, Roels F, Herath C, Kojc N, Samaee V, Rodrigo S, Gowrishankar R, European Medical Journal : Nephrology 8, 40 (2020)
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From spin induced ferroelectricity to dipolar glasses : spinel chromites and mixed delafossites”. Maignan A, Martin C, Singh K, Simon C, Lebedev OI, Turner S, Journal of solid state chemistry 195, 41 (2012). http://doi.org/10.1016/j.jssc.2012.01.063
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Non-ionic surfactant (C13EOm, m=6, 12 and 18) for large pore mesoporous molecular sieves preparation”. Blin JL, Becue A, Pauwels B, Van Tendeloo G, Su BL, Microporous and mesoporous materials 44/45, 41 (2001). http://doi.org/10.1016/S1387-1811(01)00167-6
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Dynamic scattering theory for dark-field electron holography of 3D strain fields”. Lubk A, Javon E, Cherkashin N, Reboh S, Gatel C, Hytch M, Ultramicroscopy 136, 42 (2014). http://doi.org/10.1016/j.ultramic.2013.07.007
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Intergrowth of components and ramps in coffin-shaped ZSM-5 zeolite crystals unraveled by focused ion beam-assisted transmission electron microscopy”. Lu J, Roeffaers MBJ, Bartholomeeusen E, Sels BF, Schryvers D, Microscopy and microanalysis 20, 42 (2014). http://doi.org/10.1017/S1431927613013731
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New intermediate defect configuration in Si studied by in situ HREM irradiation”. Fedina L, Gutakovskii A, Aseev A, van Landuyt J, Vanhellemont J, Conference series of the Institute of Physics 157, 43 (1997)
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Effect of mold hardness on microstructure and contraction porosity in ductile cast iron”. Khalil-Allafi J, Amin-Ahmadi B, Journal of iron and steel research international 18, 44 (2011). http://doi.org/10.1016/S1006-706X(11)60048-4
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HREM study of compounds in the Bi-rich part of the Ba-Bi-O system”. Nikolaichik VI, Amelinckx S, Klinkova LA, Barkovskii NV, Lebedev OI, Van Tendeloo G, Journal of solid state chemistry 163, 44 (2002). http://doi.org/10.1006/jssc.2001.9362
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Platinum and palladium on carbon nanotubes : experimental and theoretical studies”. Adjizian JJ, De Marco P, Suarez-Martinez I, El Mel AA, Snyders R, Gengler RYN, Rudolf P, Ke X, Van Tendeloo G, Bittencourt C, Ewels CP;, Chemical physics letters 571, 44 (2013). http://doi.org/10.1016/j.cplett.2013.03.079
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Electron diffraction and microscopy of single-walled carbon nanotube bundles”. Colomer J-F, Van Tendeloo G Kluwer, Boston, Mass., page 45 (2003).
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Microstructure and functional property changes in thin Ni-Ti wires heat teated by electric current: high energy X-ray and TEM investigations”. Malard B, Pilch J, Sittner P, Gartnerova V, Delville R, Schryvers D, Curfs C, Functional materials letters 2, 45 (2009). http://doi.org/10.1142/S1793604709000557
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Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry”. Vanhellemont J, Maes HE, Schaekers M, Armigliato A, Cerva H, Cullis A, de Sande J, Dinges H, Hallais J, Nayar V, Pickering C, Stehlé, JL, Van Landuyt J, Walker C, Werner H, Salieri P;, Applied surface science T2 –, SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE 63, 45 (1993). http://doi.org/10.1016/0169-4332(93)90062-G
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A simplified approach to the band gap correction of defect formation energies : Al, Ga, and In-doped ZnO”. Saniz R, Xu Y, Matsubara M, Amini MN, Dixit H, Lamoen D, Partoens B, The journal of physics and chemistry of solids 74, 45 (2013). http://doi.org/10.1016/j.jpcs.2012.07.017
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