| Records |
| Author |
van Dyck, D.; Van Aert, S.; den Dekker, A.J. |
| Title |
Physical limits on atomic resolution |
Type |
A1 Journal article |
| Year |
2004 |
Publication |
Microscopy and microanalysis |
Abbreviated Journal |
Microsc Microanal |
| Volume |
10 |
Issue |
|
Pages |
153-157 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Cambridge, Mass. |
Editor |
|
| Language |
|
Wos |
000188882100022 |
Publication Date |
2004-08-11 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
1431-9276;1435-8115; |
ISBN |
|
Additional Links  |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
1.891 |
Times cited |
14 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 1.891; 2004 IF: 2.389 |
| Call Number |
UA @ lucian @ c:irua:47515 |
Serial |
2616 |
| Permanent link to this record |
| |
|
| |
| Author |
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. |
| Title |
Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? |
Type |
A1 Journal article |
| Year |
2003 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
98 |
Issue |
|
Pages |
27-42 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000186831500003 |
Publication Date |
2003-04-25 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
26 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 2.843; 2003 IF: 1.665 |
| Call Number |
UA @ lucian @ c:irua:47516 |
Serial |
1749 |
| Permanent link to this record |
| |
|
| |
| Author |
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
| Title |
Optimal experimental design of STEM measurement of atom column positions |
Type |
A1 Journal article |
| Year |
2002 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
90 |
Issue |
|
Pages |
273-289 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000174770900004 |
Publication Date |
2002-07-25 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
35 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 2.843; 2002 IF: 1.772 |
| Call Number |
UA @ lucian @ c:irua:47517 |
Serial |
2483 |
| Permanent link to this record |
| |
|
| |
| Author |
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. |
| Title |
Does a monochromator improve the precision in quantitative HRTEM? |
Type |
A1 Journal article |
| Year |
2001 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
89 |
Issue |
|
Pages |
275-290 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000172667000004 |
Publication Date |
2002-07-25 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
22 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 2.843; 2001 IF: 1.890 |
| Call Number |
UA @ lucian @ c:irua:47518 |
Serial |
746 |
| Permanent link to this record |
| |
|
| |
| Author |
Van Aert, S.; van Dyck, D. |
| Title |
Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? |
Type |
A1 Journal article |
| Year |
2001 |
Publication |
Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties |
Abbreviated Journal |
|
| Volume |
81 |
Issue |
11 |
Pages |
1833-1846 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
London |
Editor |
|
| Language |
|
Wos |
000172199700016 |
Publication Date |
2007-07-08 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
1364-2812;1463-6417; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
|
Times cited |
11 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: NA |
| Call Number |
UA @ lucian @ c:irua:47519 |
Serial |
744 |
| Permanent link to this record |
| |
|
| |
| Author |
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
| Title |
High-resolution electron microscopy and electron tomography: resolution versus precision |
Type |
A1 Journal article |
| Year |
2002 |
Publication |
Journal of structural biology |
Abbreviated Journal |
J Struct Biol |
| Volume |
138 |
Issue |
|
Pages |
21-33 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
New York |
Editor |
|
| Language |
|
Wos |
000177978800003 |
Publication Date |
2002-09-17 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
1047-8477; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.767 |
Times cited |
33 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 2.767; 2002 IF: 4.194 |
| Call Number |
UA @ lucian @ c:irua:47520 |
Serial |
1446 |
| Permanent link to this record |
| |
|
| |
| Author |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
| Title |
High-resolution electron microscopy : from imaging toward measuring |
Type |
A1 Journal article |
| Year |
2002 |
Publication |
IEEE transactions on instrumentation and measurement |
Abbreviated Journal |
Ieee T Instrum Meas |
| Volume |
51 |
Issue |
4 |
Pages |
611-615 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
New York, N.Y. |
Editor |
|
| Language |
|
Wos |
000178992000010 |
Publication Date |
2003-01-03 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0018-9456; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.456 |
Times cited |
13 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 2.456; 2002 IF: 0.592 |
| Call Number |
UA @ lucian @ c:irua:47521 |
Serial |
1450 |
| Permanent link to this record |
| |
|
| |
| Author |
Bals, S.; Van Aert, S.; Van Tendeloo, G.; Avila-Brande, D. |
| Title |
Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range |
Type |
A1 Journal article |
| Year |
2006 |
Publication |
Physical review letters |
Abbreviated Journal |
Phys Rev Lett |
| Volume |
96 |
Issue |
9 |
Pages |
096106,1-4 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
The local structure of Bi4W2/3Mn1/3O8Cl is determined using quantitative transmission electron microscopy. The electron exit wave, which is closely related to the projected crystal potential, is reconstructed and used as a starting point for statistical parameter estimation. This method allows us to refine all atomic positions on a local scale, including those of the light atoms, with a precision in the picometer range. Using this method one is no longer restricted to the information limit of the electron microscope. Our results are in good agreement with x-ray powder diffraction data demonstrating the reliability of the method. Moreover, it will be shown that local effects can be interpreted using this approach. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
New York, N.Y. |
Editor |
|
| Language |
|
Wos |
000235905700042 |
Publication Date |
2006-03-10 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0031-9007;1079-7114; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
8.462 |
Times cited |
69 |
Open Access |
|
| Notes |
Fwo; Iap V |
Approved |
Most recent IF: 8.462; 2006 IF: 7.072 |
| Call Number |
UA @ lucian @ c:irua:56977 |
Serial |
3154 |
| Permanent link to this record |
| |
|
| |
| Author |
Verbeeck, J.; Van Aert, S. |
| Title |
Model based quantification of EELS spectra |
Type |
A1 Journal article |
| Year |
2004 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
101 |
Issue |
2/4 |
Pages |
207-224 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
Recent advances in model based quantification of electron energy loss spectra (EELS) are reported. The maximum likelihood method for the estimation of physical parameters describing an EELS spectrum, the validation of the model used in this estimation procedure, and the computation of the attainable precision, that is, the theoretical lower bound on the variance of these estimates, are discussed. Experimental examples on An and GaAs samples show the power of the maximum likelihood method and show that the theoretical prediction of the attainable precision can be closely approached even for spectra with overlapping edges where conventional EELS quantification fails. To provide end-users with a low threshold alternative to conventional quantification, a user friendly program was developed which is freely available under a GNU public license. (C) 2004 Elsevier B.V. All rights reserved. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000224046100016 |
Publication Date |
2004-07-23 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
147 |
Open Access |
|
| Notes |
Fwo; Iuap P5/01 |
Approved |
Most recent IF: 2.843; 2004 IF: 2.215 |
| Call Number |
UA @ lucian @ c:irua:57130UA @ admin @ c:irua:57130 |
Serial |
2101 |
| Permanent link to this record |
| |
|
| |
| Author |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. |
| Title |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example |
Type |
A1 Journal article |
| Year |
2005 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
104 |
Issue |
2 |
Pages |
107-125 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000230526400002 |
Publication Date |
2005-04-08 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
37 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 2.843; 2005 IF: 2.490 |
| Call Number |
UA @ lucian @ c:irua:57131 |
Serial |
1960 |
| Permanent link to this record |
| |
|
| |
| Author |
den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. |
| Title |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework |
Type |
A1 Journal article |
| Year |
2005 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
104 |
Issue |
2 |
Pages |
83-106 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000230526400001 |
Publication Date |
2005-04-09 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
70 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 2.843; 2005 IF: 2.490 |
| Call Number |
UA @ lucian @ c:irua:57229 |
Serial |
1959 |
| Permanent link to this record |
| |
|
| |
| Author |
Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
| Title |
Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative |
Type |
A1 Journal article |
| Year |
2006 |
Publication |
Optics express |
Abbreviated Journal |
Opt Express |
| Volume |
14 |
Issue |
9 |
Pages |
3830-3839 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
|
Editor |
|
| Language |
|
Wos |
000237296200013 |
Publication Date |
2006-05-04 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
1094-4087; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
3.307 |
Times cited |
45 |
Open Access |
|
| Notes |
Fwo |
Approved |
Most recent IF: 3.307; 2006 IF: 4.009 |
| Call Number |
UA @ lucian @ c:irua:58262 |
Serial |
2883 |
| Permanent link to this record |
| |
|
| |
| Author |
Huijben, M.; Rijnders, G.; Blank, D.H.A.; Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Brinkman, A.; Hilgenkamp, H. |
| Title |
Electronically coupled complementary interfaces between perovskite band insulators |
Type |
A1 Journal article |
| Year |
2006 |
Publication |
Nature materials |
Abbreviated Journal |
Nat Mater |
| Volume |
5 |
Issue |
|
Pages |
556-560 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
London |
Editor |
|
| Language |
|
Wos |
000238708900021 |
Publication Date |
2006-06-18 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
1476-1122;1476-4660; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
39.737 |
Times cited |
315 |
Open Access |
|
| Notes |
Fwo |
Approved |
Most recent IF: 39.737; 2006 IF: 19.194 |
| Call Number |
UA @ lucian @ c:irua:59713UA @ admin @ c:irua:59713 |
Serial |
1019 |
| Permanent link to this record |
| |
|
| |
| Author |
van Dyck, D.; Van Aert, S.; Croitoru, M. |
| Title |
Atomic resolution electron tomography: a dream? |
Type |
A1 Journal article |
| Year |
2006 |
Publication |
International journal of materials research |
Abbreviated Journal |
Int J Mater Res |
| Volume |
97 |
Issue |
7 |
Pages |
872-879 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
|
Editor |
|
| Language |
|
Wos |
000239916700003 |
Publication Date |
2013-12-09 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
1862-5282;2195-8556; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
0.681 |
Times cited |
6 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 0.681; 2006 IF: NA |
| Call Number |
UA @ lucian @ c:irua:60965 |
Serial |
176 |
| Permanent link to this record |
| |
|
| |
| Author |
Verbeeck, J.; Van Aert, S.; Bertoni, G. |
| Title |
Model-based quantification of EELS spectra: including the fine structure |
Type |
A1 Journal article |
| Year |
2006 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
106 |
Issue |
11-12 |
Pages |
976-980 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
An extension to model-based electron energy loss spectroscopy (EELS) quantification is reported to improve the possibility of modelling fine structure changes in electron energy loss spectra. An equalisation function is used in the energy loss near edge structure (ELNES) region to model the differences between a single atom differential cross section and the cross section for an atom in a crystal. The equalisation function can be shown to approximate the relative density of unoccupied states for the given excitation edge. On a set of 200 experimental h-BN spectra, this technique leads to statistically acceptable models resulting into unbiased estimates of relative concentrations and making the estimated precisions come very close to the Cramer-Rao lower bound (CRLB). The method greatly expands the useability of model-based EELS quantification to spectra with pronounced fine structure. Another benefit of this model is that one also gets an estimate of the unoccupied density of states for a given excitation edge, without having to do background removal and deconvolution, making the outcome intrinsically more reliable and less noisy. (c) 2006 Elsevier B.V. All rights reserved. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000241592900004 |
Publication Date |
2006-07-04 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
38 |
Open Access |
|
| Notes |
Goa; Fwo Iap-V |
Approved |
Most recent IF: 2.843; 2006 IF: 1.706 |
| Call Number |
UA @ lucian @ c:irua:61379UA @ admin @ c:irua:61379 |
Serial |
2102 |
| Permanent link to this record |
| |
|
| |
| Author |
Van Aert, S.; Geuens, P.; van Dyck, D.; Kisielowski, C.; Jinschek, J.R. |
| Title |
Electron channelling based crystallography |
Type |
A1 Journal article |
| Year |
2007 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
107 |
Issue |
6/7 |
Pages |
551-558 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000245341300015 |
Publication Date |
2006-12-13 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
32 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 2.843; 2007 IF: 1.996 |
| Call Number |
UA @ lucian @ c:irua:64286 |
Serial |
913 |
| Permanent link to this record |
| |
|
| |
| Author |
Van Aert, S.; Chang, L.Y.; Bals, S.; Kirkland, A.I.; Van Tendeloo, G. |
| Title |
Effect of amorphous layers on the interpretation of restored exit waves |
Type |
A1 Journal article |
| Year |
2009 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
109 |
Issue |
3 |
Pages |
237-246 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
The effects of amorphous layers on the quality of exit wave restorations have been investigated. Two independently developed software implementations for exit wave restoration have been used to simulated focal series of images of SrTiO3 with amorphous carbon layers incorporated. The restored exit waves have been compared both qualitatively and quantitatively. We have shown that amorphous layers have a strong impact on the quantitative measurements of atomic column positions, however, the error in the position measurements is still in the picometer range. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000264280200005 |
Publication Date |
2008-11-15 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
10 |
Open Access |
|
| Notes |
Fwo; Esteem 026019 |
Approved |
Most recent IF: 2.843; 2009 IF: 2.067 |
| Call Number |
UA @ lucian @ c:irua:76421 |
Serial |
796 |
| Permanent link to this record |
| |
|
| |
| Author |
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. |
| Title |
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy |
Type |
A1 Journal article |
| Year |
2009 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
109 |
Issue |
10 |
Pages |
1236-1244 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
A model-based method is proposed to relatively quantify the chemical composition of atomic columns using high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) images. The method is based on a quantification of the total intensity of the scattered electrons for the individual atomic columns using statistical parameter estimation theory. In order to apply this theory, a model is required describing the image contrast of the HAADF STEM images. Therefore, a simple, effective incoherent model has been assumed which takes the probe intensity profile into account. The scattered intensities can then be estimated by fitting this model to an experimental HAADF STEM image. These estimates are used as a performance measure to distinguish between different atomic column types and to identify the nature of unknown columns with good accuracy and precision using statistical hypothesis testing. The reliability of the method is supported by means of simulated HAADF STEM images as well as a combination of experimental images and electron energy-loss spectra. It is experimentally shown that statistically meaningful information on the composition of individual columns can be obtained even if the difference in averaged atomic number Z is only 3. Using this method, quantitative mapping at atomic resolution using HAADF STEM images only has become possible without the need of simultaneously recorded electron energy loss spectra. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000270015200004 |
Publication Date |
2009-05-28 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
166 |
Open Access |
|
| Notes |
Fwo; Esteem 026019 |
Approved |
Most recent IF: 2.843; 2009 IF: 2.067 |
| Call Number |
UA @ lucian @ c:irua:78585UA @ admin @ c:irua:78585 |
Serial |
2748 |
| Permanent link to this record |
| |
|
| |
| Author |
van den Broek, W.; Van Aert, S.; van Dyck, D. |
| Title |
A model based atomic resolution tomographic algorithm |
Type |
A1 Journal article |
| Year |
2009 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
109 |
Issue |
12 |
Pages |
1485-1490 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
Tomography with high angular annular dark field scanning transmission electron microscopy at atomic resolution can be greatly improved if one is able to take advantage of prior knowledge. In this paper we present a reconstruction technique that explicitly takes into account the microscope parameters and the atomic nature of the projected object. This results in a more accurate estimate of the atomic positions and in a good resistance to noise. The reconstruction is a maximum likelihood estimator of the object. Moreover, the limits to the precision have been explored, allowing for a prediction of the amount of expected noise in the reconstruction for a certain experimental setup. We believe that the proposed reconstruction technique can be generalized to other tomographic experiments. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000271840200010 |
Publication Date |
2009-08-28 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
17 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 2.843; 2009 IF: 2.067 |
| Call Number |
UA @ lucian @ c:irua:78588 |
Serial |
2097 |
| Permanent link to this record |
| |
|
| |
| Author |
Van Aert, S.; Chen, J.H.; van Dyck, D. |
| Title |
Linear versus non-linear structural information limit in high-resolution transmission electron microscopy |
Type |
A1 Journal article |
| Year |
2010 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
110 |
Issue |
11 |
Pages |
1404-1410 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
A widely used performance criterion in high-resolution transmission electron microscopy (HRTEM) is the information limit. It corresponds to the inverse of the maximum spatial object frequency that is linearly transmitted with sufficient intensity from the exit plane of the object to the image plane and is limited due to partial temporal coherence. In practice, the information limit is often measured from a diffractogram or from Young's fringes assuming a weak phase object scattering beyond the inverse of the information limit. However, for an aberration corrected electron microscope, with an information limit in the sub-angstrom range, weak phase objects are no longer applicable since they do not scatter sufficiently in this range. Therefore, one relies on more strongly scattering objects such as crystals of heavy atoms observed along a low index zone axis. In that case, dynamical scattering becomes important such that the non-linear and linear interaction may be equally important. The non-linear interaction may then set the experimental cut-off frequency observed in a diffractogram. The goal of this paper is to quantify both the linear and the non-linear information transfer in terms of closed form analytical expressions. Whereas the cut-off frequency set by the linear transfer can be directly related with the attainable resolution, information from the non-linear transfer can only be extracted using quantitative, model-based methods. In contrast to the historic definition of the information limit depending on microscope parameters only, the expressions derived in this paper explicitly incorporate their dependence on the structure parameters as well. In order to emphasize this dependence and to distinguish from the usual information limit, the expressions derived for the inverse cut-off frequencies will be referred to as the linear and non-linear structural information limit. The present findings confirm the well-known result that partial temporal coherence has different effects on the transfer of the linear and non-linear terms, such that the non-linear imaging contributions are damped less than the linear imaging contributions at high spatial frequencies. This will be important when coherent aberrations such as spherical aberration and defocus are reduced. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000282562100008 |
Publication Date |
2010-07-15 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
6 |
Open Access |
|
| Notes |
Fwo |
Approved |
Most recent IF: 2.843; 2010 IF: 2.063 |
| Call Number |
UA @ lucian @ c:irua:83689 |
Serial |
1821 |
| Permanent link to this record |
| |
|
| |
| Author |
van den Broek, W.; Van Aert, S.; van Dyck, D. |
| Title |
A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy |
Type |
A1 Journal article |
| Year |
2010 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
110 |
Issue |
5 |
Pages |
548-554 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
Depth sectioning in high angular annular dark field scanning transmission electron microscopy is considered a candidate for three-dimensional characterization on the atomic scale. However at present the depth resolution is still far from the atomic level, due to strong limitations in the opening angle of the beam. In this paper we introduce a new, parameter based tomographic reconstruction algorithm that allows to make maximal use of the prior knowledge about the constituent atom types and the microscope settings, so as to retrieve the atomic positions and push the resolution to the atomic level in all three dimensions. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000279065700022 |
Publication Date |
2009-09-21 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
16 |
Open Access |
|
| Notes |
Fwo |
Approved |
Most recent IF: 2.843; 2010 IF: 2.063 |
| Call Number |
UA @ lucian @ c:irua:83690 |
Serial |
2104 |
| Permanent link to this record |
| |
|
| |
| Author |
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
| Title |
Direct structure inversion from exit waves: part 1: theory and simulations |
Type |
A1 Journal article |
| Year |
2010 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
110 |
Issue |
5 |
Pages |
527-534 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
In order to interpret the amplitude and phase of the exit wave in terms of mass and position of the atoms, one has to invert the dynamic scattering of the electrons in the object so as to obtain a starting structure which can then be used as a seed for further quantitative structure refinement. This is especially challenging in case of a zone axis condition when the interaction of the electrons with the atom column is very strong. Based on the channelling theory we will show that the channelling map not only yields a circle on the Argand plot but also a circular defocus curve for every column. The former gives the number of atoms in each column, while the latter provides the defocus value for each column, which reveals the surface roughness at the exit plane with single atom sensitivity. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000279065700019 |
Publication Date |
2009-12-12 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
25 |
Open Access |
|
| Notes |
Fwo |
Approved |
Most recent IF: 2.843; 2010 IF: 2.063 |
| Call Number |
UA @ lucian @ c:irua:83691 |
Serial |
723 |
| Permanent link to this record |
| |
|
| |
| Author |
Van Aert, S.; Batenburg, K.J.; Rossell, M.D.; Erni, R.; Van Tendeloo, G. |
| Title |
Three-dimensional atomic imaging of crystalline nanoparticles |
Type |
A1 Journal article |
| Year |
2011 |
Publication |
Nature |
Abbreviated Journal |
Nature |
| Volume |
470 |
Issue |
7334 |
Pages |
374-377 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
Determining the three-dimensional (3D) arrangement of atoms in crystalline nanoparticles is important for nanometre-scale device engineering and also for applications involving nanoparticles, such as optoelectronics or catalysis. A nanoparticles physical and chemical properties are controlled by its exact 3D morphology, structure and composition1. Electron tomography enables the recovery of the shape of a nanoparticle from a series of projection images2, 3, 4. Although atomic-resolution electron microscopy has been feasible for nearly four decades, neither electron tomography nor any other experimental technique has yet demonstrated atomic resolution in three dimensions. Here we report the 3D reconstruction of a complex crystalline nanoparticle at atomic resolution. To achieve this, we combined aberration-corrected scanning transmission electron microscopy5, 6, 7, statistical parameter estimation theory8, 9 and discrete tomography10, 11. Unlike conventional electron tomography, only two images of the targeta silver nanoparticle embedded in an aluminium matrixare sufficient for the reconstruction when combined with available knowledge about the particles crystallographic structure. Additional projections confirm the reliability of the result. The results we present help close the gap between the atomic resolution achievable in two-dimensional electron micrographs and the coarser resolution that has hitherto been obtained by conventional electron tomography. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
London |
Editor |
|
| Language |
|
Wos |
000287409100037 |
Publication Date |
2011-02-02 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0028-0836;1476-4687; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
40.137 |
Times cited |
341 |
Open Access |
|
| Notes |
Esteem 026019 |
Approved |
Most recent IF: 40.137; 2011 IF: 36.280 |
| Call Number |
UA @ lucian @ c:irua:86745 |
Serial |
3644 |
| Permanent link to this record |
| |
|
| |
| Author |
Croitoru, M.D.; van Dyck, D.; Van Aert, S.; Bals, S.; Verbeeck, J. |
| Title |
An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images |
Type |
A1 Journal article |
| Year |
2006 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
106 |
Issue |
10 |
Pages |
933-940 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab |
| Abstract |
We propose an improved image simulation procedure for atomic-resolution annular dark-field scanning transmission electron microscopy (STEM) based on the multislice formulation, which takes thermal diffuse scattering fully into account. The improvement with regard to the classical frozen phonon approach is realized by separating the lattice configuration statistics from the dynamical scattering so as to avoid repetitive calculations. As an example, the influence of phonon scattering on the image contrast is calculated and investigated. STEM image simulation of crystals can be applied with reasonable computing times to problems involving a large number of atoms and thick or large supercells. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000240397200006 |
Publication Date |
2006-05-10 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
18 |
Open Access |
|
| Notes |
Fwo; Fwo-V |
Approved |
Most recent IF: 2.843; 2006 IF: 1.706 |
| Call Number |
UA @ lucian @ c:irua:87604UA @ admin @ c:irua:87604 |
Serial |
876 |
| Permanent link to this record |
| |
|
| |
| Author |
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
| Title |
A method to determine the local surface profile from reconstructed exit waves |
Type |
A1 Journal article |
| Year |
2011 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
111 |
Issue |
8 |
Pages |
1352-1359 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
Reconstructed exit waves are useful to quantify unknown structure parameters such as the position and composition of the atom columns at atomic scale. Existing techniques provide a complex wave in a flat plane which is close to the plane where the electrons leave the atom columns. However, due to local deviation in the flatness of the exit surface, there will be an offset between the plane of reconstruction and the actual exit of a specific atom column. Using the channelling theory, it has been shown that this defocus offset can in principle be determined atom column-by-atom column. As such, the surface roughness could be quantified at atomic scale. However, the outcome strongly depends on the initial plane of reconstruction especially in a crystalline structure. If this plane is further away from the true exit, the waves of the atom columns become delocalized and interfere mutually which strongly complicates the interpretation of the exit wave in terms of the local structure. In this paper, we will study the delocalization with defocus using the channelling theory in a more systematic way. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000300461100049 |
Publication Date |
2011-05-03 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
3 |
Open Access |
|
| Notes |
Fwo |
Approved |
Most recent IF: 2.843; 2011 IF: 2.471 |
| Call Number |
UA @ lucian @ c:irua:88941 |
Serial |
2017 |
| Permanent link to this record |
| |
|
| |
| Author |
Boschker, H.; Huijben, M.; Vailinois, A.; Verbeeck, J.; Van Aert, S.; Luysberg, M.; Bals, S.; Van Tendeloo, G.; Houwman, E.P.; Koster, G.; Blank, D.H.A.; Rijnders, G. |
| Title |
Optimized fabrication of high-quality La0.67Sr0.33MnO3 thin films considering all essential characteristics |
Type |
A1 Journal article |
| Year |
2011 |
Publication |
Journal of physics: D: applied physics |
Abbreviated Journal |
J Phys D Appl Phys |
| Volume |
44 |
Issue |
20 |
Pages |
205001-205001,9 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
In this paper, an overview of the fabrication and properties of high-quality La0.67Sr0.33MnO3 (LSMO) thin films is given. A high-quality LSMO film combines a smooth surface morphology with a large magnetization and a small residual resistivity, while avoiding precipitates and surface segregation. In the literature, typically only a few of these issues are adressed. We therefore present a thorough characterization of our films, which were grown by pulsed laser deposition. The films were characterized with reflection high energy electron diffraction, atomic force microscopy, x-ray diffraction, magnetization and transport measurements, x-ray photoelectron spectroscopy and scanning transmission electron microscopy. The films have a saturation magnetization of 4.0 µB/Mn, a Curie temperature of 350 K and a residual resistivity of 60 µΩ cm. These results indicate that high-quality films, combining both large magnetization and small residual resistivity, were realized. A comparison between different samples presented in the literature shows that focussing on a single property is insufficient for the optimization of the deposition process. For high-quality films, all properties have to be adressed. For LSMO devices, the thin-film quality is crucial for the device performance. Therefore, this research is important for the application of LSMO in devices. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
London |
Editor |
|
| Language |
|
Wos |
000290150900001 |
Publication Date |
2011-04-29 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0022-3727;1361-6463; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.588 |
Times cited |
99 |
Open Access |
|
| Notes |
This research was financially supported by the Dutch Science Foundation, by NanoNed, a nanotechnology program of the Dutch Ministry of Economic Affairs, and by the NanOxide program of the European Science Foundation. This work is supported in part by the Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering, under contract DE-AC02-76SF00515. |
Approved |
Most recent IF: 2.588; 2011 IF: 2.544 |
| Call Number |
UA @ lucian @ c:irua:89557UA @ admin @ c:irua:89557 |
Serial |
2491 |
| Permanent link to this record |
| |
|
| |
| Author |
van den Broek, W.; Van Aert, S.; Goos, P.; van Dyck, D. |
| Title |
Throughput maximization of particle radius measurements by balancing size and current of the electron probe |
Type |
A1 Journal article |
| Year |
2011 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
111 |
Issue |
7 |
Pages |
940-947 |
| Keywords |
A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
In thispaperweinvestigatewhichprobesizemaximizesthethroughputwhenmeasuringtheradiusof nanoparticlesinhighangleannulardarkfieldscanningtransmissionelectronmicroscopy(HAADFSTEM). The sizeandthecorrespondingcurrentoftheelectronprobedeterminetheprecisionoftheestimateofa particlesradius.Maximizingthroughputmeansthatamaximumnumberofparticlesshouldbeimaged withinagiventimeframe,sothataprespecifiedprecisionisattained.WeshowthatBayesianstatistical experimentaldesignisaveryusefulapproachtodeterminetheoptimalprobesizeusingacertainamount of priorknowledgeaboutthesample.Thedependenceoftheoptimalprobesizeonthedetectorgeometry and thediameter,variabilityandatomicnumberoftheparticlesisinvestigated.Anexpressionforthe optimalprobesizeintheabsenceofanykindofpriorknowledgeaboutthespecimenisderivedaswell. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000300461000026 |
Publication Date |
2010-11-25 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
7 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 2.843; 2011 IF: 2.471 |
| Call Number |
UA @ lucian @ c:irua:89657 |
Serial |
3659 |
| Permanent link to this record |
| |
|
| |
| Author |
de Backer, A.; Van Aert, S.; van Dyck, D. |
| Title |
High precision measurements of atom column positions using model-based exit wave reconstruction |
Type |
A1 Journal article |
| Year |
2011 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
| Volume |
111 |
Issue |
9/10 |
Pages |
1475-1482 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
In this paper, it has been investigated how to measure atom column positions as accurately and precisely as possible using a focal series of images. In theory, it is expected that the precision would considerably improve using a maximum likelihood estimator based on the full series of focal images. As such, the theoretical lower bound on the variances of the unknown atom column positions can be attained. However, this approach is numerically demanding. Therefore, maximum likelihood estimation has been compared with the results obtained by fitting a model to a reconstructed exit wave rather than to the full series of focal images. Hence, a real space model-based exit wave reconstruction technique based on the channelling theory is introduced. Simulations show that the reconstructed complex exit wave contains the same amount of information concerning the atom column positions as the full series of focal images. Only for thin samples, which act as weak phase objects, this information can be retrieved from the phase of the reconstructed complex exit wave. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
| Language |
|
Wos |
000300461200004 |
Publication Date |
2011-07-28 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.843 |
Times cited |
8 |
Open Access |
|
| Notes |
Fwo |
Approved |
Most recent IF: 2.843; 2011 IF: 2.471 |
| Call Number |
UA @ lucian @ c:irua:91879 |
Serial |
1438 |
| Permanent link to this record |
| |
|
| |
| Author |
Van Aert, S.; Turner, S.; Delville, R.; Schryvers, D.; Van Tendeloo, G.; Salje, E.K.H. |
| Title |
Direct observation of ferrielectricity at ferroelastic domain boundaries in CaTiO3 by electron microscopy |
Type |
A1 Journal article |
| Year |
2012 |
Publication |
Advanced materials |
Abbreviated Journal |
Adv Mater |
| Volume |
24 |
Issue |
4 |
Pages |
523-527 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
High-resolution aberration-corrected transmission electron microscopy aided by statistical parameter estimation theory is used to quantify localized displacements at a (110) twin boundary in orthorhombic CaTiO3. The displacements are 36 pm for the Ti atoms and confined to a thin layer. This is the first direct observation of the generation of ferroelectricity by interfaces inside this material which opens the door for domain boundary engineering. |
| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
Weinheim |
Editor |
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| Language |
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Wos |
000299156400011 |
Publication Date |
2011-12-24 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
0935-9648; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
19.791 |
Times cited |
150 |
Open Access |
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| Notes |
Fwo |
Approved |
Most recent IF: 19.791; 2012 IF: 14.829 |
| Call Number |
UA @ lucian @ c:irua:94110 |
Serial |
717 |
| Permanent link to this record |
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| Author |
Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. |
| Title |
Model-based electron microscopy : from images toward precise numbers for unknown structure parameters |
Type |
A1 Journal article |
| Year |
2012 |
Publication |
Micron |
Abbreviated Journal |
Micron |
| Volume |
43 |
Issue |
4 |
Pages |
509-515 |
| Keywords |
A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
Statistical parameter estimation theory is proposed as a method to quantify electron microscopy images. It aims at obtaining precise and accurate values for the unknown structure parameters including, for example, atomic column positions and types. In this theory, observations are purely considered as data planes, from which structure parameters have to be determined using a parametric model describing the images. The method enables us to measure positions of atomic columns with a precision of the order of a few picometers even though the resolution of the electron microscope is one or two orders of magnitude larger. Moreover, small differences in averaged atomic number, which cannot be distinguished visually, can be quantified using high-angle annular dark field scanning transmission electron microscopy images. Finally, it is shown how to optimize the experimental design so as to attain the highest precision. As an example, the optimization of the probe size for nanoparticle radius measurements is considered. It is also shown how to quantitatively balance signal-to-noise ratio and resolution by adjusting the probe size. |
| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
Oxford |
Editor |
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| Language |
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Wos |
000301702400003 |
Publication Date |
2011-11-03 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
0968-4328; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
1.98 |
Times cited |
7 |
Open Access |
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| Notes |
Fwo |
Approved |
Most recent IF: 1.98; 2012 IF: 1.876 |
| Call Number |
UA @ lucian @ c:irua:94114 |
Serial |
2099 |
| Permanent link to this record |
