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  Author Title Year Publication Volume Times cited Additional Links Links
Zhang, Z.; Lobato, I.; De Backer, A.; Van Aert, S.; Nellist, P. Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions 2023 Ultramicroscopy 246 UA library record; WoS full record; WoS citing articles pdf url doi
Van Tendeloo, G.; Bals, S.; Van Aert, S.; Verbeeck, J.; van Dyck, D. Advanced electron microscopy for advanced materials 2012 Advanced materials 24 107 UA library record; WoS full record; WoS citing articles pdf url doi
Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D. An alternative approach to determine attainable resolution directly from HREM images 2013 Ultramicroscopy 133 UA library record; WoS full record pdf url doi
de Backer, A.; Martinez, G.T.; Rosenauer, A.; Van Aert, S. Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations 2013 Ultramicroscopy 134 48 UA library record; WoS full record; WoS citing articles pdf url doi
Van Aert, S. Atomen in 3D : Antwerpenaren brengen atomaire structuur nanodeeltjes in beeld 2011 Chemie magazine 7 UA library record pdf
Egoavil, R.; Gauquelin, N.; Martinez, G.T.; Van Aert, S.; Van Tendeloo, G.; Verbeeck, J. Atomic resolution mapping of phonon excitations in STEM-EELS experiments 2014 Ultramicroscopy 147 22 UA library record; WoS full record; WoS citing articles pdf url doi
Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy 2009 Microscopy and microanalysis 15 1 UA library record; WoS full record; WoS citing articles url doi
Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. Computational aspects in quantitative EELS 2010 Microscopy and microanalysis 16 UA library record url doi
van den Broek, W.; Rosenauer, A.; Goris, B.; Martinez, G.T.; Bals, S.; Van Aert, S.; van Dyck, D. Correction of non-linear thickness effects in HAADF STEM electron tomography 2012 Ultramicroscopy 116 67 UA library record; WoS full record; WoS citing articles pdf doi
Akamine, H.; Van den Bos, K.H.W.; Gauquelin, N.; Farjami, S.; Van Aert, S.; Schryvers, D.; Nishida, M. Determination of the atomic width of an APB in ordered CoPt using quantified HAADF-STEM 2015 Journal of alloys and compounds 644 12 UA library record; WoS full record; WoS citing articles pdf url doi
de Backer, A.; Martinez, G.T.; MacArthur, K.E.; Jones, L.; Béché, A.; Nellist, P.D.; Van Aert, S. Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting 2015 Ultramicroscopy 151 29 UA library record; WoS full record; WoS citing articles pdf url doi
Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S. The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images 2014 Micron 63 25 UA library record; WoS full record; WoS citing articles pdf url doi
Huijben, M.; Rijnders, G.; Blank, D.H.A.; Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Brinkman, A.; Hilgenkamp, H. Electronically coupled complementary interfaces between perovskite band insulators 2006 Nature materials 5 315 UA library record; WoS full record; WoS citing articles pdf doi
den Dekker, A.J.; Gonnissen, J.; de Backer, A.; Sijbers, J.; Van Aert, S. Estimation of unknown structure parameters from high-resolution (S)TEM images : what are the limits? 2013 Ultramicroscopy 134 31 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. Advanced electron crystallography through model-based imaging 2016 IUCrJ 3 30 UA library record; WoS full record; WoS citing articles pdf url doi
Tan, H.; Egoavil, R.; Béché, A.; Martinez, G.T.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Rotella, H.; Boullay, P.; Pautrat, A.; Prellier, W. Mapping electronic reconstruction at the metal-insulator interface in LaVO3/SrVO3 heterostructures 2013 Physical review : B : condensed matter and materials physics 88 15 UA library record; WoS full record; WoS citing articles url doi
Goris, B.; de Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, K.J.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Van Aert, S.; Bals, S.; Sijbers, J.; Van Tendeloo, G. Measuring lattice strain in three dimensions through electron microscopy 2015 Nano letters 15 87 UA library record; WoS full record; WoS citing articles pdf url doi
Van den Broek, W.; Rosenauer, A.; Van Aert, S.; Sijbers, J.; van Dyck, D. A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM 2014 Ultramicroscopy 141 6 UA library record; WoS full record; WoS citing articles pdf url doi
de Backer, A.; De wael, A.; Gonnissen, J.; Van Aert, S. Optimal experimental design for nano-particle atom-counting from high-resolution STEM images 2015 Ultramicroscopy 151 24 UA library record; WoS full record; WoS citing articles pdf url doi
Gonnissen, J.; de Backer, A.; den Dekker, A.J.; Martinez, G.T.; Rosenauer, A.; Sijbers, J.; Van Aert, S. Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images 2014 Applied physics letters 105 12 UA library record; WoS full record; WoS citing articles pdf url doi
Van Aert, S.; de Backer, A.; Martinez, G.T.; Goris, B.; Bals, S.; Van Tendeloo, G.; Rosenauer, A. Procedure to count atoms with trustworthy single-atom sensitivity 2013 Physical review : B : condensed matter and materials physics 87 106 UA library record; WoS full record; WoS citing articles url doi
Martinez, G.T.; Rosenauer, A.; de Backer, A.; Verbeeck, J.; Van Aert, S. Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy 2014 Ultramicroscopy 137 74 UA library record; WoS full record; WoS citing articles pdf doi
Martinez, G.T.; Jones, L.; de Backer, A.; Béché, A.; Verbeeck, J.; Van Aert, S.; Nellist, P.D. Quantitative STEM normalisation : the importance of the electron flux 2015 Ultramicroscopy 159 27 UA library record; WoS full record; WoS citing articles pdf url doi
Bals, S.; Goris, B.; Altantzis, T.; Heidari, H.; Van Aert, S.; Van Tendeloo, G. Seeing and measuring in 3D with electrons 2014 Comptes rendus : physique 15 15 UA library record; WoS full record; WoS citing articles pdf url doi
Jones, L.; Yang, H.; Pennycook, T.J.; Marshall, M.S.J.; Van Aert, S.; Browning, N.D.; Castell, M.R.; Nellist, P.D. Smart Align : a new tool for robust non-rigid registration of scanning microscope data 2015 Advanced Structural and Chemical Imaging 1 131 UA library record; WoS full record; WoS citing articles pdf url doi
Bals, S.; Van Aert, S.; Van Tendeloo, G.; van Dyck, D.; Avila-Brande, D. Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction 2005 Microscopy and microanalysis 11 UA library record pdf
Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G. Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy 2007 Microscopy and microanalysis 13 UA library record pdf doi
Goris, B.; de Backer, A.; Van Aert, S.; Gómez-Graña, S.; Liz-Marzán, L.M.; Van Tendeloo, G.; Bals, S. Three-dimensional elemental mapping at the atomic scale in bimetallic nanocrystals 2013 Nano letters 13 90 UA library record; WoS full record; WoS citing articles pdf doi
Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. Ultra-high resolution electron tomography for materials science : a roadmap 2011 Microscopy and microanalysis 17 UA library record url doi
Molina-Luna, L.; Duerrschnabel, M.; Turner, S.; Erbe, M.; Martinez, G.T.; Van Aert, S.; Holzapfel, B.; Van Tendeloo, G. Atomic and electronic structures of BaHfO3-doped TFA-MOD-derived YBa2Cu3O7−δthin films 2015 Superconductor science and technology 28 4 UA library record; WoS full record; WoS citing articles pdf doi
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