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Author	Title	Year	Publication	Volume	Times cited	Additional Links
Krekels, T.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.	Structural effects of element substitution in the CuO plane of the 1-2-3 YBCO superconductor	1993	Acta crystallographica: section A: foundations of crystallography	49	56	UA library record; WoS full record; WoS citing articles
Milat, O.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S.	Superlattice variants in Sr2CuO2(CO3): an electron microscopy study	1993	Acta crystallographica: section A: foundations of crystallography	49		UA library record
Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.	Graphene textures: tubules and whiskers related to fullerene crystallography	1993	Acta crystallographica: section A: foundations of crystallography	49		UA library record
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R.	Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging	1991				UA library record
Lioutas, C.B.; Manolikas, C.; Van Tendeloo, G.; van Landuyt, J.	A 2a2b3c superstructure in hexagonal NiS_1-x: a study by means of electron diffraction and HREM	1993	Journal of crystal growth	126	4	UA library record; WoS full record; WoS citing articles
Goessens, C.; Schryvers, D.; van Landuyt, J.; Geuens, I.; Gijbels, R.; Jacob, W.; de Keyzer, R.	A temperature study of mixed AgBr-AgBrI tabular crystals	1995			3	UA library record; WoS full record; WoS citing articles
De Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C.	Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy	2002				UA library record; WoS full record;
Hens, S.; van Landuyt, J.; Bender, H.; Boullart, W.; Vanhaelemeersch, S.	Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy	2001	Materials science in semiconductor processing	4		UA library record; WoS full record
Stuer, C.; van Landuyt, J.; Bender, H.; Rooyackers, R.; Badenes, G.	The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures	2001	Materials science in semiconductor processing	4	6	UA library record; WoS full record; WoS citing articles
Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K.	Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation	2001	Institute of physics conference series			UA library record; WoS full record;
Ferroni, M.; Carotta, M.C.; Guidi, V.; Martinelli, G.; Ronconi, F.; Richard, O.; van Dyck, D.; van Landuyt, J.	Structural characterization of Nb-TiO₂ nanosized thick-films for gas sensing application	2000	Sensors and actuators : B : chemical	68	51	UA library record; WoS full record; WoS citing articles
Teodorescu, V.S.; Mihailescu, I.N.; Gyorgy, E.; Luches, A.; Martino, M.; Nistor, L.C.; van Landuyt, J.; Hermann, J.	The study of a crater forming on the surface of a Ti target submitted to multipulse excimer laser irradiation under low pressure N₂	1996	Journal of modern optics	43	11	UA library record; WoS full record; WoS citing articles
Nistor, L.; Bender, H.; van Landuyt, J.; Nemeth, S.; Boeve, H.; De Boeck, J.; Borghs, G.	HREM investigation of a Fe/GaN/Fe tunnel junction	2001	Institute of physics conference series T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, Univ of Oxford, Oxford, England			UA library record; WoS full record;
Hens, S.; Stuer, C.; Bender, H.; Loo, R.; van Landuyt, J.	Quantitative EFTEM study of germanium quantum dots	2001				UA library record; WoS full record;
Stuer, G.; Bender, H.; van Landuyt, J.; Eyben, P.	Stress analysis with convergent beam electron diffraction around NMOS transistors	2001				UA library record; WoS full record;
Van Renterghem, W.; Karthauser, S.; Schryvers, D.; van Landuyt, J.; De Keyzer, R.; Van Roost, C.	The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals	2000				UA library record; WoS full record;
Van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; Van Roost, C.; De Keyzer, R.B.	Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study	2000				UA library record; WoS full record;
De Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J.	Accurate infrared absorption measurement of interstitial and precipitated oxygen in p⁺ silicon wafers	1999	Microelectronic engineering	45		UA library record; WoS full record
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J.	Extended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ electron irradiation in an HREM	1999	Physica status solidi: A: applied research T2 – International Conference on Extended Defects in Semiconductors (EDS 98), Sept. 06-11, 1998, Jaszowiec, Poland	171	40	UA library record; WoS full record; WoS citing articles
Frangis, N.; van Landuyt, J.; Grimaldi, M.G.; Calcagno, L.	Electron microscopy and Rutherford backscattering spectrometry characterisation of 6H SiC samples implanted with He⁺	1996	Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms T2 – Symposium 1 on New Trends in Ion Beam Processing of Materials, at the, E-MRS 96 Spring Meeting, June 04-07, 1996, Strasbourg, France	120	2	UA library record; WoS full record; WoS citing articles
Frangis, N.; Nejim, A.; Hemment, P.L.F.; Stoemenos, J.; van Landuyt, J.	Ion beam synthesis of \beta-SiC at 950 degrees C and structural characterization	1996	Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms T2 – Symposium J on Correlated Effects in Atomic and Cluster Ion Bombardment and Implantation/Symposium C on Pushing the Limits of Ion Beam, Processing – Fr	112	9	UA library record; WoS full record; WoS citing articles
Vanhellemont, J.; Romano Rodriguez, A.; Fedina, L.; van Landuyt, J.; Aseev, A.	Point defect reactions in silicon studied in situ by high flux electron irradiation in high voltage transmission electron microscope	1995	Materials science and technology	11	7	UA library record; WoS full record; WoS citing articles
Schryvers, D.; Van Tendeloo, G.; van Landuyt, J.; Le Tanner	HREM imaging analysis in the study of pretransition and nucleation phenomena in alloys (Invited)	1994				UA library record; WoS full record;
van Landuyt, J.	The evolution of HVEM application in antwerp	1991	Ultramicroscopy T2 – 2nd Osaka International Symp.on High-Voltage Electron Microscopy : New Directions and Future Aspects of High Voltage Electron Microscopy, November 8-10, 1990, Osaka University, Osaka, Japan	39		UA library record; WoS full record
Zhang, Z.; Ma, L.N.; Liao, X.Z.; van Landuyt, J.	A transmission electron-microscopy study of crystalline surface domains on al-co decagonal quasi-crystals and the \tau²-Al₁₃CO₄ approximant	1994	Philosophical magazine letters	70	4	UA library record; WoS full record; WoS citing articles
Ivanov, V.; Nagy, J.B.; Lambin, P.; Lucas, A.; Zhang, X.B.; Zhang, X.F.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.	The study of carbon nanotubules produced by catalytic method	1994	Chemical physics letters	223	405	UA library record; WoS full record; WoS citing articles
Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R.	Electron-diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals	1994	Physica status solidi: A	143	7	UA library record; WoS full record; WoS citing articles
Nistor, L.C.; van Landuyt, J.; Ralchenko, V.G.; Kononenko, T.V.; Obraztsova, E.D.; Strelnitsky, V.E.	Direct observation of laser-induced crystallization of a-C : H films	1994	Applied physics A : materials science & processing	58	73	UA library record; WoS full record; WoS citing articles
Teodorescu, V.S.; Nistor, L.C.; van Landuyt, J.; Dinescu, M.	TEM study of laser induced phase transition in iron thin films	1994	Materials research bulletin	29	2	UA library record; WoS full record; WoS citing articles
Van Tendeloo, G.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; Amelinckx, S.	Up close: Center for Electron Microscopy of Materials Science at the University of Antwerp	1994	MRS bulletin			UA library record; WoS full record;