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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. |
Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy |
2009 |
Microscopy and microanalysis |
15 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bach, D.; Schneider, R.; Gerthsen, D.; Verbeeck, J.; Sigle, W. |
EELS of niobium and stoichiometric niobium-oxide phases: part 1: plasmon and Near-edges fine structure |
2009 |
Microscopy and microanalysis |
15 |
55 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Tian, H.; Schryvers, D.; Shabalovskaya, S.; van Humbeeck, J. |
Microstructure of surface and subsurface layers of a Ni-Ti shape memory microwire |
2009 |
Microscopy and microanalysis |
15 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bals, S.; Tirry, W.; Geurts, R.; Yang, Z.; Schryvers, D. |
High-quality sample preparation by low kV FIB thinning for analytical TEM measurements |
2007 |
Microscopy and microanalysis |
13 |
82 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G. |
Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy |
2007 |
Microscopy and microanalysis |
13 |
|
UA library record |
|
|
|
Denecke, M.A.; Somogyi, A.; Janssens, K.; Simon, R.; Dardenne, K.; Noseck, U. |
Microanalysis (micro-XRF, micro-XANES, and micro-XRD) of a tertiary sediment using microfocused synchrotron radiation |
2007 |
Microscopy and microanalysis |
13 |
31 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bach, D.; Störmer, H.; Schneider, R.; Gerthsen, D.; Verbeeck, J. |
EELS investigations of different niobium oxide phases |
2006 |
Microscopy and microanalysis |
12 |
50 |
UA library record; WoS full record; WoS citing articles |
|
|
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van Dyck, D.; Van Aert, S.; den Dekker, A.J. |
Physical limits on atomic resolution |
2004 |
Microscopy and microanalysis |
10 |
14 |
UA library record; WoS full record; WoS citing articles |
|
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|
Jinschek, J.R.; Bals, S.; Gopal, V.; Xus, X.; Kisielowski, C. |
Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs |
2004 |
Microscopy and microanalysis |
10 |
|
UA library record |
|
|
|
Bals, S.; Radmilovic, V.; Kisielowski, C. |
TEM annular objective apertures fabricated by FIB |
2004 |
Microscopy and microanalysis |
10 |
|
UA library record |
|
|
|
Verlinden, G.; Gijbels, R.; Geuens, I. |
Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS |
2002 |
Microscopy and microanalysis |
8 |
1 |
UA library record; WoS full record; WoS citing articles |
|
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Heidari, H.; Rivero, G.; Idrissi, H.; Ramachandran, D.; Cakir, S.; Egoavil, R.; Kurttepeli, M.; Crabbé, A.C.; Hauffman, T.; Terryn, H.; Du Prez, F.; Schryvers, D. |
Melamine–Formaldehyde Microcapsules: Micro- and Nanostructural Characterization with Electron Microscopy |
2016 |
Microscopy and microanalysis |
22 |
2 |
UA library record; WoS full record; WoS citing articles |
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Nord, M.; Verbeeck, J. |
Towards Reproducible and Transparent Science of (Big) Electron Microscopy Data Using Version Control |
2019 |
Microscopy and microanalysis
T2 – Microscopy & Microanalysis 2019, 4-8 August, 2019, Portland, Oregon |
25 |
|
UA library record |
|
|
|
Nord, M.; Verbeeck, J. |
Open Source Development Tools for Robust and Reproducible Electron Microscopy Data Analysis |
2019 |
Microscopy And Microanalysis |
25 |
|
|
|
|
|
MacArthur, K.E.; Yankovich, A.B.; Béché, A.; Luysberg, M.; Brown, H.G.; Findlay, S.D.; Heggen, M.; Allen, L.J. |
Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic Scale |
2021 |
Microscopy And Microanalysis |
|
|
UA library record; WoS full record; WoS citing articles |
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Esteban, D.A.; Vanrompay, H.; Skorikov, A.; Béché, A.; Verbeeck, J.; Freitag, B.; Bals, S. |
Fast electron low dose tomography for beam sensitive materials |
2021 |
Microscopy And Microanalysis |
27 |
|
UA library record |
|
|
|
Neelisetty, K.K.; Kumar C.N., S.; Kashiwar, A.; Scherer, T.; Chakravadhanula, V.S.K.; Kuebel, C. |
Novel thin film lift-off process for in situ TEM tensile characterization |
2021 |
Microscopy And Microanalysis |
27 |
|
UA library record |
|
|
|
Orlinskii, S.B.; Bogomolov, R.S.; Kiyamova, A.M.; Yavkin, B.V.; Mamin, G.M.; Turner, S.; Van Tendeloo, G.; Shiryaev, A.A.; Vlasov, I.I.; Shenderova, O. |
Identification of substitutional nitrogen and surface paramagnetic centers in nanodiamond of dynamic synthesis by electron paramagnetic resonance |
2011 |
Nanoscience and nanotechnology letters |
3 |
14 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Lemberge, P.; Deraedt, I.; Janssens, K.; van Espen, P. |
Quantitative analysis of 16-17th century archaeological glass vessels using PLS regression of EPXMA and μ-XRF data |
2000 |
Journal of chemometrics |
14 |
|
UA library record; WoS full record; WoS citing articles |
|
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Batuk, M.; Buffiere, M.; Zaghi, A.E.; Lenaers, N.; Verbist, C.; Khelifi, S.; Vleugels, J.; Meuris, M.; Hadermann, J. |
Effect of the burn-out step on the microstructure of the solution-processed Cu(In,Ga)Se2 solar cells |
2015 |
Thin solid films : an international journal on the science and technology of thin and thick films |
583 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Samani, M.K.; Ding, X.Z.; Khosravian, N.; Amin-Ahmadi, B.; Yi, Y.; Chen, G.; Neyts, E.C.; Bogaerts, A.; Tay, B.K. |
Thermal conductivity of titanium nitride/titanium aluminum nitride multilayer coatings deposited by lateral rotating cathode arc |
2015 |
Thin solid films : an international journal on the science and technology of thin and thick films |
578 |
41 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Forsh, E.A.; Abakumov, A.M.; Zaytsev, V.B.; Konstantinova, E.A.; Forsh, P.A.; Rumyantseva, M.N.; Gaskov, A.M.; Kashkarov, P.K. |
Optical and photoelectrical properties of nanocrystalline indium oxide with small grains |
2015 |
Thin solid films : an international journal on the science and technology of thin and thick films |
595 |
18 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Oueslati, S.; Brammertz, G.; Buffiere, M.; ElAnzeery, H.; Touayar, O.; Koeble, C.; Bekaert, J.; Meuris, M.; Poortmans, J. |
Physical and electrical characterization of high-performance Cu2ZnSnSe4 based thin film solar cells |
2015 |
Thin solid films : an international journal on the science and technology of thin and thick films |
582 |
49 |
UA library record; WoS full record; WoS citing articles |
|
|
|
E. Zaghi, A.; Buffière, M.; Koo, J.; Brammertz, G.; Batuk, M.; Verbist, C.; Hadermann, J.; Kim, W.K.; Meuris, M.; Poortmans, J.; Vleugels, J.; |
Effect of selenium content of CuInSex alloy nanopowder precursors on recrystallization of printed CuInSe2 absorber layers during selenization heat treatment |
2014 |
Thin solid films : an international journal on the science and technology of thin and thick films |
|
7 |
UA library record; WoS full record; WoS citing articles |
|
|
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Amin-Ahmadi, B.; Idrissi, H.; Galceran, M.; Colla, M.S.; Raskin, J.P.; Pardoen, T.; Godet, S.; Schryvers, D. |
Effect of deposition rate on the microstructure of electron beam evaporated nanocrystalline palladium thin films |
2013 |
Thin solid films : an international journal on the science and technology of thin and thick films |
539 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Jehanathan, N.; Georgieva, V.; Saraiva, M.; Depla, D.; Bogaerts, A.; Van Tendeloo, G. |
The influence of Cr and Y on the micro structural evolution of Mg―Cr―O and Mg―Y―O thin films |
2011 |
Thin solid films : an international journal on the science and technology of thin and thick films |
519 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Espinosa, E.H.; Lonescu, R.; Bittencourt, C.; Felten, A.; Erni, R.; Van Tendeloo, G.; Pireaux, J.-J.; Llobet, E. |
Metal-decorated multi-wall carbon nanotubes for low temperature gas sensing |
2007 |
Thin solid films : an international journal on the science and technology of thin and thick films |
515 |
86 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Laffez, P.; Chen, X.Y.; Banerjee, G.; Pezeril, T.; Rossell, M.D.; Van Tendeloo, G.; Lacorre, P.; Liu, J.M.; Liu, Z.-G. |
Growth of La2Mo2O9 films on porous Al2O3 substrates by radio frequency magnetron sputtering |
2006 |
Thin solid films : an international journal on the science and technology of thin and thick films |
500 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Mahieu, S.; Ghekiere, P.; de Winter, G.; Depla, D.; de Gryse, R.; Lebedev, O.I.; Van Tendeloo, G. |
Influence of the Ar/O2 ratio on the growth and biaxial alignment of yttria stabilized zirconia layers during reactive unbalanced magnetron sputtering |
2005 |
Thin solid films : an international journal on the science and technology of thin and thick films |
484 |
23 |
UA library record; WoS full record; WoS citing articles |
|
|
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Conard, T.; de Witte, H.; Loo, R.; Verheyen, P.; Vandervorst, W.; Caymax, M.; Gijbels, R. |
XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers |
1999 |
Thin solid films : an international journal on the science and technology of thin and thick films |
343/344 |
1 |
UA library record; WoS full record; WoS citing articles |
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