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Author Title Year Publication Volume Times cited Additional Links
De wael, A.; De Backer, A.; Jones, L.; Nellist, P.D.; Van Aert, S. Hybrid statistics-simulations based method for atom-counting from ADF STEM images 2017 Ultramicroscopy 177 8 UA library record; WoS full record; WoS citing articles
Vatanparast, M.; Egoavil, R.; Reenaas, T.W.; Verbeeck, J.; Holmestad, R.; Vullum, P.E. Bandgap measurement of high refractive index materials by off-axis EELS 2017 Ultramicroscopy 182 3 UA library record; WoS full record; WoS citing articles
Grieb, T.; Krause, F.F.; Mahr, C.; Zillmann, D.; Müller-Caspary, K.; Schowalter, M.; Rosenauer, A. Optimization of NBED simulations for disc-detection measurements 2017 Ultramicroscopy 181 6 UA library record; WoS full record; WoS citing articles
Zhong, Z.; Aveyard, R.; Rieger, B.; Bals, S.; Palenstijn, W.J.; Batenburg, K.J. Automatic correction of nonlinear damping effects in HAADF-STEM tomography for nanomaterials of discrete compositions 2018 Ultramicroscopy 184 8 UA library record; WoS full record; WoS citing articles
Alania, M.; Lobato Hoyos, I.P.; Van Aert, S. Frozen lattice and absorptive model for high angle annular dark field scanning transmission electron microscopy : a comparison study in terms of integrated intensity and atomic column position measurement 2018 Ultramicroscopy 184 UA library record; WoS full record; WoS citing articles
Grieb, T.; Tewes, M.; Schowalter, M.; Müller-Caspary, K.; Krause, F.F.; Mehrtens, T.; Hartmann, J.-M.; Rosenauer, A. Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation 2018 Ultramicroscopy 184 7 UA library record; WoS full record; WoS citing articles
Schryvers, D.; Salje, E.K.H.; Nishida, M.; De Backer, A.; Idrissi, H.; Van Aert, S. Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations 2017 Ultramicroscopy 176 1 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Béché, A.; Müller-Caspary, K.; Guzzinati, G.; Luong, M.A.; Den Hertog, M. Demonstration of a 2 × 2 programmable phase plate for electrons 2018 Ultramicroscopy 190 73 UA library record; WoS full record; WoS citing articles
Korneychuk, S.; Partoens, B.; Guzzinati, G.; Ramaneti, R.; Derluyn, J.; Haenen, K.; Verbeeck, J. Exploring possibilities of band gap measurement with off-axis EELS in TEM 2018 Ultramicroscopy 189 7 UA library record; WoS full record; WoS citing articles
Grieb, T.; Krause, F.F.; Schowalter, M.; Zillmann, D.; Sellin, R.; Müller-Caspary, K.; Mahr, C.; Mehrtens, T.; Bimberg, D.; Rosenauer, A. Strain analysis from nano-beam electron diffraction : influence of specimen tilt and beam convergence 2018 Ultramicroscopy 190 1 UA library record; WoS full record; WoS citing articles
van den Bos, K.H.W.; Janssens, L.; De Backer, A.; Nellist, P.D.; Van Aert, S. The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials 2019 Ultramicroscopy 203 4 UA library record; WoS full record; WoS citing articles
Fatermans, J.; Van Aert, S.; den Dekker, A.J. The maximum a posteriori probability rule for atom column detection from HAADF STEM images 2019 Ultramicroscopy 201 1 UA library record; WoS full record; WoS citing articles
Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose 2019 Ultramicroscopy 203 25 UA library record; WoS full record; WoS citing articles
Susi, T.; Madsen, J.; Ludacka, U.; Mortensen, J.J.; Pennycook, T.J.; Lee, Z.; Kotakoski, J.; Kaiser, U.; Meyer, J.C. Efficient first principles simulation of electron scattering factors for transmission electron microscopy 2019 Ultramicroscopy 197 3 UA library record; WoS full record; WoS citing articles
Pennycook, T.J.; Martinez, G.T.; Nellist, P.D.; Meyer, J.C. High dose efficiency atomic resolution imaging via electron ptychography 2019 Ultramicroscopy 196 1 UA library record; WoS full record; WoS citing articles
Leuthner, G.T.; Hummel, S.; Mangler, C.; Pennycook, T.J.; Susi, T.; Meyer, J.C.; Kotakoski, J. Scanning transmission electron microscopy under controlled low-pressure atmospheres 2019 Ultramicroscopy 203 4 UA library record; WoS full record; WoS citing articles
Vanrompay, H.; Skorikov, A.; Bladt, E.; Béché, A.; Freitag, B.; Verbeeck, J.; Bals, S. Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges 2021 Ultramicroscopy 221 15 UA library record; WoS full record; WoS citing articles
Li, C.; Tardajos, A.P.; Wang, D.; Choukroun, D.; Van Daele, K.; Breugelmans, T.; Bals, S. A simple method to clean ligand contamination on TEM grids 2021 Ultramicroscopy 221 10 UA library record; WoS full record; WoS citing articles
De wael, A.; De Backer, A.; Lobato, I.; Van Aert, S. Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt 2021 Ultramicroscopy UA library record; WoS full record; WoS citing articles
Koo, J.; Dahl, A.B.; Bærentzen, J.A.; Chen, Q.; Bals, S.; Dahl, V.A. Shape from projections via differentiable forward projector for computed tomography 2021 Ultramicroscopy 224 3 UA library record; WoS full record; WoS citing articles
Madsen, J.; Pennycook, T.J.; Susi, T. ab initio description of bonding for transmission electron microscopy 2021 Ultramicroscopy 231 UA library record; WoS full record; WoS citing articles
Kummamuru, N.B.; Perreault, P.; Lenaerts, S. A new generalized empirical correlation for predicting methane hydrate equilibrium conditions in pure water 2021 Industrial & Engineering Chemistry Research 60 UA library record; WoS full record; WoS citing articles
Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J. Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging 1997 Ultramicroscopy 69 11 UA library record; WoS full record; WoS citing articles
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. Does a monochromator improve the precision in quantitative HRTEM? 2001 Ultramicroscopy 89 22 UA library record; WoS full record; WoS citing articles
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. Optimal experimental design of STEM measurement of atom column positions 2002 Ultramicroscopy 90 35 UA library record; WoS full record; WoS citing articles
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? 2003 Ultramicroscopy 98 26 UA library record; WoS full record; WoS citing articles
Potapov, P.L.; Schryvers, D. Measuring the absolute position of EELS ionisation edges in a TEM 2004 Ultramicroscopy 99 29 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Van Aert, S. Model based quantification of EELS spectra 2004 Ultramicroscopy 101 147 UA library record; WoS full record; WoS citing articles
den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework 2005 Ultramicroscopy 104 70 UA library record; WoS full record; WoS citing articles
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example 2005 Ultramicroscopy 104 37 UA library record; WoS full record; WoS citing articles