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Author Title Year Publication Volume Times cited Additional Links
Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution 2022 Ultramicroscopy 233 UA library record; WoS full record; WoS citing articles
Croitoru, M.D.; van Dyck, D.; Van Aert, S.; Bals, S.; Verbeeck, J. An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images 2006 Ultramicroscopy 106 18 UA library record; WoS full record; WoS citing articles
Pourbabak, S.; Wang, X.; Van Dyck, D.; Verlinden, B.; Schryvers, D. Ni cluster formation in low temperature annealed Ni50.6Ti49.4 2017 Functional materials letters 10 4 UA library record; WoS full record; WoS citing articles
Potapov, P.; Lichte, H.; Verbeeck, J.; van Dyck, D. Experiments on inelastic electron holography 2006 Ultramicroscopy 106 28 UA library record; WoS full record; WoS citing articles
Potapov, P.L.; Verbeeck, J.; Schattschneider, P.; Lichte, H.; van Dyck, D. Inelastic electron holography as a variant of the Feynman thought experiment 2007 Ultramicroscopy 107 13 UA library record; WoS full record; WoS citing articles
van den Broek, W.; Van Aert, S.; van Dyck, D. A model based atomic resolution tomographic algorithm 2009 Ultramicroscopy 109 17 UA library record; WoS full record; WoS citing articles
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. Direct structure inversion from exit waves : part 2 : a practical example 2012 Ultramicroscopy 116 8 UA library record; WoS full record; WoS citing articles
Xu, Q.; Zandbergen, H.W.; van Dyck, D. Imaging from atomic structure to electronic structure 2012 Micron 43 UA library record; WoS full record
Verbeeck, J.; van Dyck, D.; Van Tendeloo, G. Energy-filtered transmission electron microscopy: an overview 2004 Spectrochimica acta: part B : atomic spectroscopy 59 37 UA library record; WoS full record; WoS citing articles
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D. On the interpretation of HREM images of partially ordered alloys 1995 Ultramicroscopy 60 20 UA library record; WoS full record; WoS citing articles
Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. Electron-diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals 1994 Physica status solidi: A 143 7 UA library record; WoS full record; WoS citing articles
Lobato, I.; Van Dyck, D. MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA 2015 Ultramicroscopy 156 32 UA library record; WoS full record; WoS citing articles
Tsai, C.-Y.; Chang, Y.-C.; Lobato, I.; Van Dyck, D.; Chen, F.-R. Hollow Cone Electron Imaging for Single Particle 3D Reconstruction of Proteins 2016 Scientific reports 6 UA library record; WoS full record; WoS citing articles
Xu, Q.; Zandbergen, H.W.; van Dyck, D. Applying an information transmission approach to extract valence electron information from reconstructed exit waves 2011 Ultramicroscopy 111 1 UA library record; WoS full record; WoS citing articles
Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. Advanced electron crystallography through model-based imaging 2016 IUCrJ 3 30 UA library record; WoS full record; WoS citing articles
Van Tendeloo, G.; Bals, S.; Van Aert, S.; Verbeeck, J.; van Dyck, D. Advanced electron microscopy for advanced materials 2012 Advanced materials 24 107 UA library record; WoS full record; WoS citing articles
Van den Broek, W.; Rosenauer, A.; Van Aert, S.; Sijbers, J.; van Dyck, D. A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM 2014 Ultramicroscopy 141 6 UA library record; WoS full record; WoS citing articles
Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D. An alternative approach to determine attainable resolution directly from HREM images 2013 Ultramicroscopy 133 UA library record; WoS full record
van den Broek, W.; Van Aert, S.; van Dyck, D. Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency 2012 Microscopy and microanalysis 18 15 UA library record; WoS full record; WoS citing articles
Van Tendeloo, G.; op de Beeck, M.; De Meulenaere, P.; van Dyck, D. Towards quantitative high resolution electron microscopy? 1995 Institute of physics conference series 147 UA library record; WoS full record;
van Dyck, D.; Croitoru, M.D. Statistical method for thickness measurement of amorphous objects 2007 Applied physics letters 90 4 UA library record; WoS full record; WoS citing articles
Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. Model-based electron microscopy : from images toward precise numbers for unknown structure parameters 2012 Micron 43 7 UA library record; WoS full record; WoS citing articles
Schalm, O.; van der Linden, V.; Frederickx, P.; Luyten, S.; van der Snickt, G.; Caen, J.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. Enamels in stained glass windows: preparation, chemical composition, microstructure and causes of deterioration 2009 Spectrochimica acta: part B : atomic spectroscopy 64 28 UA library record; WoS full record; WoS citing articles
Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis 2003 Institute of physics conference series UA library record; WoS full record;
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. A method to determine the local surface profile from reconstructed exit waves 2011 Ultramicroscopy 111 3 UA library record; WoS full record; WoS citing articles
van Dyck, D.; Lobato, I.; Chen, F.-R.; Kisielowski, C. Do you believe that atoms stay in place when you observe them in HREM? 2015 Micron 68 11 UA library record; WoS full record; WoS citing articles
Ferroni, M.; Carotta, M.C.; Guidi, V.; Martinelli, G.; Ronconi, F.; Richard, O.; van Dyck, D.; van Landuyt, J. Structural characterization of Nb-TiO2 nanosized thick-films for gas sensing application 2000 Sensors and actuators : B : chemical 68 51 UA library record; WoS full record; WoS citing articles
van den Broek, W.; Van Aert, S.; Goos, P.; van Dyck, D. Throughput maximization of particle radius measurements by balancing size and current of the electron probe 2011 Ultramicroscopy 111 7 UA library record; WoS full record; WoS citing articles
Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? 2012 Ultramicroscopy 114 5 UA library record; WoS full record; WoS citing articles
Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? 2017 Ultramicroscopy 181 3 UA library record; WoS full record; WoS citing articles