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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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de Backer, A. |
Quantitative atomic resolution electron microscopy using advanced statistical techniques |
2015 |
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UA library record |
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Hens, S.; Stuer, C.; Bender, H.; Loo, R.; van Landuyt, J. |
Quantitative EFTEM study of germanium quantum dots |
2001 |
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UA library record; WoS full record; |
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Heidari Mezerji, H. |
Quantitative electron tomography of nanoparticles |
2012 |
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UA library record |
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Martínez Alanis, G.T. |
Quantitative model-based high angle annular dark field scanning transmission electron microscopy |
2015 |
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UA library record |
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Vlasov, I.I.; Turner, S.; Van Tendeloo, G.; Shiryaev, A.A. |
Recent results on characterization of detonation nanodiamonds |
2012 |
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UA library record |
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Van Tendeloo, G.; Bernaerts, D.; Amelinckx, S. |
Reduced dimensionality in different forms of carbon |
1998 |
Fullerenes and carbon based materials |
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UA library record; WoS full record; |
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Müller, K.; Schowalter, M.; Rosenauer, A.; Jansen, J.; Tsuda, K.; Titantah, J.T.; Lamoen, D. |
Refinement of chemically sensitive structure factors using parallel and convergent beam electron nanodiffraction |
2010 |
Journal of physics : conference series |
209 |
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UA library record |
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Tokei, Z.; Lanckmans, F.; van den Bosch, G.; Van Hove, M.; Maex, K.; Bender, H.; Hens, S.; van Landuyt, J. |
Reliability of copper dual damascene influenced by pre-clean |
2002 |
Analysis Of Integrated Circuits |
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5 |
UA library record; WoS full record; WoS citing articles |
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Van Eyndhoven, G.; Batenburg, K.J.; van Oers, C.; Kurttepeli, M.; Bals, S.; Cool, P.; Sijbers, J. |
Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples |
2014 |
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UA library record |
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Cheng, K.; Degroote, S.; Leys, M.; van Daele, B.; Germain, M.; Van Tendeloo, G.; Borghs, G. |
Single crystalline GaN grown on porous Si(111) by MOVPE |
2007 |
Physica status solidi: C: conferences and critical reviews |
4 |
2 |
UA library record; WoS full record; WoS citing articles |
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Jones, L.; Yang, H.; Pennycook, T.J.; Marshall, M.S.J.; Van Aert, S.; Browning, N.D.; Castell, M.R.; Nellist, P.D. |
Smart Align : a new tool for robust non-rigid registration of scanning microscope data |
2015 |
Advanced Structural and Chemical Imaging |
1 |
131 |
UA library record; WoS full record; WoS citing articles |
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Delville, R.; Shi, H.; James, R.D.; Schryvers, D. |
Special microstructures and twin features in Ti50Ni50-x(Pd,Au)x at small hysteresis |
2011 |
Diffusion and defect data : solid state data : part B : solid state phenomena |
172/174 |
3 |
UA library record; WoS full record; WoS citing articles |
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Misko, V.R.; Fomin, V.M.; Devreese, J.T.; Moshchalkov, V.V. |
Stability of vortex-antivortex “molecules” in mesoscopic superconducting triangles |
2005 |
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UA library record; WoS full record; |
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Bals, S.; Van Aert, S.; Van Tendeloo, G.; van Dyck, D.; Avila-Brande, D. |
Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction |
2005 |
Microscopy and microanalysis |
11 |
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UA library record |
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Van Aert, S. |
Statistical parameter estimation theory : a tool for quantitative electron microscopy |
2012 |
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UA library record |
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Egoavil, R. |
STEM investigation of complex oxides at the atomic scale |
2014 |
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UA library record |
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Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S. |
Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM |
2000 |
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UA library record |
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Stuer, G.; Bender, H.; van Landuyt, J.; Eyben, P. |
Stress analysis with convergent beam electron diffraction around NMOS transistors |
2001 |
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UA library record; WoS full record; |
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Hadermann, J.; Abakumov, A.M.; Lebedev, O.I.; Antipov, E.V.; Van Tendeloo, G. |
Structural changes in fluorinated T{'} and T* phases |
2000 |
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UA library record |
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Yandouzi, M.; Pauwels, B.; Schryvers, D.; van Swygenhoven, H.; Van Tendeloo, G. |
Structural characterisation of nanostructured Ni3Al processed by inert gas condensation |
2003 |
Defects and diffusion in metals |
213/215 |
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UA library record; WoS full record; |
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Krsmanovic, R.; Bertoni, G.; Van Tendeloo, G. |
Structural characterization of erbium doped LAS glass ceramics obtained by glass melting technique |
2007 |
Materials science forum |
555 |
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UA library record; WoS full record; WoS citing articles |
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Yandouzi, M.; Pauwels, B.; Schryvers, D.; Van Swygenhoven, H.; Van Tendeloo, G. |
Structural characterization of nanostructured Ni3Al processed by inert gas condensation |
2003 |
Diffusion and defect data : solid state data : part A : defect and diffusion forum |
213 |
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UA library record; WoS full record; |
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Lebedev, O.; Verbeeck, J.; Van Tendeloo, G.; Shapoval, O.; Belenchuk, A.; Moshnyaga, V.; Damaschke, B.; Samwer, K. |
Structural phase transition in (La0.67Ca0.33MnO3)1-x: (MgO)x composite film |
2002 |
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UA library record |
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Pauwels, B.; Van Tendeloo, G.; Bouwen, W.; Kuhn, L.T.; Lievens, P. |
Structural properties of Au clusters on MgO |
2000 |
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UA library record |
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Nistor, L.C.; van Landuyt, J.; Ralchenko, V.G.; Obratzova, E.D.; Korothushenko, K.G.; Smolin, A.A. |
Structural studies of nanocrystalline diamond thin films |
1997 |
Materials science forum |
239-241 |
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UA library record; WoS full record; |
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Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S.; Leibold, B.; Habermeier, H.U.; Phillipp, F. |
Structure and magnetotransport properties of La2/3Ca1/3MnO3 thin films prepared by pulsed laser deposition |
1998 |
Materials Research Society symposium proceedings
T2 – Symposium on Advances in Laser Ablation of Materials at the 1998 MRS, Spring Meeting, April 13-16, 1998, San Francisco, Calif. |
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UA library record; WoS full record |
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Vasiliev, A.L.; Stepantsov, E.A.; Ivanov, Z.G.; Olsson, E.; Verbist, K.; Van Tendeloo, G. |
Structure of artificial grain boundaries in sapphire bicrystals with intermediate layers |
1997 |
Interface science |
5 |
3 |
UA library record; WoS full record; WoS citing articles |
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Lebedev, O.I.; Van Tendeloo, G.; Abakumov, A.M.; Shpanchenko, R.V.; Rozova, M.G.; Antipov, E.V. |
Structure of Y123 and Y247 fluorinated phases by HREM |
1998 |
Electron microscopy: vol. 3 |
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UA library record; WoS full record; |
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Verbist, K.; Lebedev, O.I.; Van Tendeloo, G.; Verhoeven, M.A.J.; Rijnders, A.J.H.M.; Blank, D.H.A. |
Study of ramp-type Josephson junctions by HREM |
1997 |
Electronic Applications; Vol 2: Large Scale And Power Applications |
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UA library record; WoS full record; |
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de Hosson, J.T.M.; Van Tendeloo, G. |
Superconducting ceramics |
1997 |
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UA library record |
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