| |
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Şentürk, DG.; Yu, CP.; De Backer, A.; Van Aert, S. |
Atom counting from a combination of two ADF STEM images |
2024 |
Ultramicroscopy |
255 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Van den Broek, W.; Jannis, D.; Verbeeck, J. |
Convexity constraints on linear background models for electron energy-loss spectra |
2023 |
Ultramicroscopy |
254 |
|
UA library record |
|
|
|
Şentürk, D.G.; De Backer, A.; Van Aert, S. |
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination |
2024 |
Ultramicroscopy |
259 |
|
UA library record; WoS full record |
|
|
|
Gholam, S.; Hadermann, J. |
The effect of the acceleration voltage on the quality of structure determination by 3D-electron diffraction |
2024 |
Ultramicroscopy |
266 |
|
UA library record; WoS full record |
|
|
|
Poppe, R.; Hadermann, J. |
Optimization of three-dimensional electron diffuse scattering data acquisition |
2024 |
Ultramicroscopy |
265 |
|
UA library record; WoS full record |
|
