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Author Gholam, S.; Hadermann, J. pdf  url
doi  openurl
  Title The effect of the acceleration voltage on the quality of structure determination by 3D-electron diffraction Type A1 Journal article
  Year (down) 2024 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 266 Issue Pages 114022  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract Nowadays, 3D Electron Diffraction (3DED) is widely used for the structure determination of sub-micron-sized particles. In this work, we investigate the influence of the acceleration voltage on the quality of 3DED datasets acquired on BaTiO3 nanoparticles. Datasets were acquired using a wide range of beam energies, from common, high acceleration voltages (300 kV and 200 kV) to medium (120 kV and 80 kV) and low acceleration voltages (60 kV and 30 kV). In the integration process, Rint increases as the beam energy reduces, which is mainly due to the increased dynamical scattering. Nevertheless, the structure was solved successfully in all cases. The structure refinement was comparable for all beam energies with small deficiencies such as negative atomic displacements for the heaviest atom in the structure, barium. Including extinction correction in the refinement noticeably improved the model for low acceleration voltages, probably due to higher beam absorption in these cases. Dynamical refinement, however, shows superior results for higher acceleration voltages, since the dynamical refinement calculations currently discard inelastic scattering effects.  
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  Language Wos https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=brocade2&SrcAuth=WosAPI&KeyUT=WOS:001297 Publication Date 2024-08-05  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991 ISBN Additional Links UA library record; WoS full record  
  Impact Factor 2.2 Times cited Open Access  
  Notes The authors acknowledge funding from the Research Foundation Flanders (FWO, Belgium) project SBO S000121N. The authors are also grateful to Dr. Armand Béché and Dr. Lars Riekehr for their technical support and to Prof. Lukáš Palatinus, Dr. Stefano Canossa, Dr. Maria Batuk and Amirhossein Hajizadeh for fruitful discussions. Approved Most recent IF: 2.2; 2024 IF: 2.843  
  Call Number EMAT @ emat @c:irua:208540 Serial 9268  
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