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Author Title Year (down) Publication Volume Times cited Additional Links
Verbeeck, J.; Tian, H.; Béché, A. A new way of producing electron vortex probes for STEM 2012 Ultramicroscopy 113 62 UA library record; WoS full record; WoS citing articles
de Backer, A.; Van Aert, S.; van Dyck, D. High precision measurements of atom column positions using model-based exit wave reconstruction 2011 Ultramicroscopy 111 8 UA library record; WoS full record; WoS citing articles
Schattschneider, P.; Verbeeck, J. Theory of free electron vortices 2011 Ultramicroscopy 111 57 UA library record; WoS full record; WoS citing articles
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. A method to determine the local surface profile from reconstructed exit waves 2011 Ultramicroscopy 111 3 UA library record; WoS full record; WoS citing articles
Goris, B.; Bals, S.; van den Broek, W.; Verbeeck, J.; Van Tendeloo, G. Exploring different inelastic projection mechanisms for electron tomography 2011 Ultramicroscopy 111 21 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Bertoni, G.; Lichte, H. A holographic biprism as a perfect energy filter? 2011 Ultramicroscopy 111 13 UA library record; WoS full record; WoS citing articles
Xu, Q.; Zandbergen, H.W.; van Dyck, D. Applying an information transmission approach to extract valence electron information from reconstructed exit waves 2011 Ultramicroscopy 111 1 UA library record; WoS full record; WoS citing articles
Heidari Mezerji, H.; van den Broek, W.; Bals, S. A practical method to determine the effective resolution in incoherent experimental electron tomography 2011 Ultramicroscopy 111 26 UA library record; WoS full record; WoS citing articles
Béché, A.; Rouvière, J.L.; Barnes, J.P.; Cooper, D. Dark field electron holography for strain measurement 2011 Ultramicroscopy 111 31 UA library record; WoS full record; WoS citing articles
van den Broek, W.; Van Aert, S.; Goos, P.; van Dyck, D. Throughput maximization of particle radius measurements by balancing size and current of the electron probe 2011 Ultramicroscopy 111 7 UA library record; WoS full record; WoS citing articles
Van Aert, S.; Chen, J.H.; van Dyck, D. Linear versus non-linear structural information limit in high-resolution transmission electron microscopy 2010 Ultramicroscopy 110 6 UA library record; WoS full record; WoS citing articles
Hadermann, J.; Abakumov, A.M.; Tsirlin, A.A.; Filonenko, V.P.; Gonnissen, J.; Tan, H.; Verbeeck, J.; Gemmi, M.; Antipov, E.V.; Rosner, H. Direct space structure solution from precession electron diffraction data: resolving heavy and light scatterers in Pb13Mn9O25 2010 Ultramicroscopy 110 24 UA library record; WoS full record; WoS citing articles
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. Direct structure inversion from exit waves: part 1: theory and simulations 2010 Ultramicroscopy 110 25 UA library record; WoS full record; WoS citing articles
Schattschneider, P.; Ennen, I.; Stoger-Pollach, M.; Verbeeck, J.; Mauchamp, V.; Jaouen, M. Real space maps of magnetic moments on the atomic scale: theory and feasibility 2010 Ultramicroscopy 110 10 UA library record; WoS full record; WoS citing articles
van den Broek, W.; Van Aert, S.; van Dyck, D. A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy 2010 Ultramicroscopy 110 16 UA library record; WoS full record; WoS citing articles
van den Broek, W.; Van Aert, S.; van Dyck, D. A model based atomic resolution tomographic algorithm 2009 Ultramicroscopy 109 17 UA library record; WoS full record; WoS citing articles
Ke, X.; Bals, S.; Romo Negreira, A.; Hantschel, T.; Bender, H.; Van Tendeloo, G. TEM sample preparation by FIB for carbon nanotube interconnects 2009 Ultramicroscopy 109 21 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Bertoni, G. Deconvolution of core electron energy loss spectra 2009 Ultramicroscopy 109 13 UA library record; WoS full record; WoS citing articles
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy 2009 Ultramicroscopy 109 166 UA library record; WoS full record; WoS citing articles
Müller, K.; Schowalter, M.; Jansen, J.; Tsuda, K.; Titantah, J.; Lamoen, D.; Rosenauer, A. Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data 2009 Ultramicroscopy 109 8 UA library record; WoS full record; WoS citing articles
Schattschneider, P.; Verbeeck, J.; Hamon, A.L. Real space maps of atomic transitions 2009 Ultramicroscopy 109 10 UA library record; WoS full record; WoS citing articles
Batenburg, K.J.; Bals, S.; Sijbers, J.; Kübel, C.; Midgley, P.A.; Hernandez, J.C.; Kaiser, U.; Encina, E.R.; Coronado, E.A.; Van Tendeloo, G. 3D imaging of nanomaterials by discrete tomography 2009 Ultramicroscopy 109 220 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Sc hattschneider, P.; Rosenauer, A. Image simulation of high resolution energy filtered TEM images 2009 Ultramicroscopy 109 36 UA library record; WoS full record; WoS citing articles
van den Broek, W.; Verbeeck, J.; Schryvers, D.; de Backer, S.; Scheunders, P. Tomographic spectroscopic imaging; an experimental proof of concept 2009 Ultramicroscopy 109 1 UA library record; WoS full record; WoS citing articles
Van Aert, S.; Chang, L.Y.; Bals, S.; Kirkland, A.I.; Van Tendeloo, G. Effect of amorphous layers on the interpretation of restored exit waves 2009 Ultramicroscopy 109 10 UA library record; WoS full record; WoS citing articles
Croitoru, M.D.; van Dyck, D.; Liu, Y.Z.; Zhang, Z. Measurement of specimen thickness by phase change determination in TEM 2008 Ultramicroscopy 108 2 UA library record; WoS full record; WoS citing articles
Rosenauer, A.; Schowalter, M.; Titantah, J.T.; Lamoen, D. An emission-potential multislice approximation to simulate thermal diffuse scattering in high-resolution transmission electron microscopy 2008 Ultramicroscopy 108 25 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Hébert; Rubino, S.; Novák, P.; Rusz, J.; Houdellier, F.; Gatel, C.; Schattschneider, P. Optimal aperture sizes and positions for EMCD experiments 2008 Ultramicroscopy 108 27 UA library record; WoS full record; WoS citing articles
Bertoni, G.; Verbeeck, J. Accuracy and precision in model based EELS quantification 2008 Ultramicroscopy 108 44 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Bertoni, G.; Schattschneider, P. The Fresnel effect of a defocused biprism on the fringes in inelastic holography 2008 Ultramicroscopy T2 – 16th International Microscopy Congress, SEP 03-08, 2006, Sapporo, JAPAN 108 15 UA library record; WoS full record; WoS citing articles