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  Author Title Year (down) Publication Volume Times cited Additional Links Links
de Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. Accurate infrared spectroscopy determination of interstitial and precipitated oxygen in highly doped Czochralski-grown silicon 1999 The review of scientific instruments 70 5 UA library record; WoS full record; WoS citing articles doi
Tsuji, K.; Sato, T.; Wagatsuma, K.; Claes, M.; Van Grieken, R. Preliminary experiment of total reflection x-ray fluorescence using two glancing x-ray beams excitation 1999 The review of scientific instruments 70 UA library record; WoS full record; WoS citing articles doi
Camuffo, D.; Brimblecombe, P.; Van Grieken, R.; Busse, H.-J.; Sturaro, G.; Valentino, A.; Bernardi, A.; Blades, N.; Shooter, D.; de Bock, L.; Gysels, K.; Wieser, M.; Kim, O. Indoor air quality at the Correr Museum, Venice, Italy 1999 The science of the total environment 236 UA library record; WoS full record; WoS citing articles doi
Sánchez-Moral, S.; Soler, V.; Cañaveras, J.C.; Sanz-Rubio, E.; Van Grieken, R.; Gysels, K. Inorganic deterioration affecting the Altamira Cave, N Spain: quantitative approach to wall-corrosion (solutional etching) processes induced by visitors 1999 The science of the total environment 243/244 UA library record; WoS full record; WoS citing articles doi
Conard, T.; de Witte, H.; Loo, R.; Verheyen, P.; Vandervorst, W.; Caymax, M.; Gijbels, R. XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers 1999 Thin solid films : an international journal on the science and technology of thin and thick films 343/344 1 UA library record; WoS full record; WoS citing articles doi
Kuczumov, A.; Vekemans, B.; Schalm, O.; Vincze, L.; Dorriné, W.; Gysels, K.; Van Grieken, R. Application of auxiliary signals in X-ray fluorescence and electron microprobe analysis for density evaluation 1999 X-ray spectrometry 28 UA library record; WoS full record; WoS citing articles doi
Claes, M.; de Bokx, P.; Van Grieken, R. Progress in laboratory grazing emission X-ray fluorescence spectrometry 1999 X-ray spectrometry 28 UA library record; WoS full record; WoS citing articles doi
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