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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Langerak, C.J.G.M.; Singleton, J.; Perenboom, J.A.A.; Devreese, J.T.; Barnes, D.J.; Nicholas, R.J.; Huant, S.; Harris, J.J.; Foxon, C.T.; Etienne, B.; Peeters, F.M. |
Far-infrared magneto-optical studies of the polaron effect in low dimensional GaAs-(Ga,Al)As structures |
1991 |
Physica scripta |
T39 |
6 |
UA library record; WoS full record; WoS citing articles |
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Martin, J.M.L.; François, J.P.; Gijbels, R. |
The rotational partition function of the symmetric top and the effect of K doubling thereon |
1991 |
Chemical physics letters |
187 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Fanidis, C.; van Dyck, D.; van Landuyt, J. |
Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases |
1993 |
Ultramicroscopy |
48 |
6 |
UA library record; WoS full record; WoS citing articles |
|
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Raveau, B.; Michel, C.; Hervieu, M.; Van Tendeloo, G.; Martin, C.; Maignan, A. |
Copper oxycarbonates and mercury-based cuprates: promising high Tc superconductors |
1994 |
Journal of superconductivity |
7 |
6 |
UA library record; WoS full record; WoS citing articles |
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Amelinckx, S.; Van Tendeloo, G. |
Electron microscopy of recent high Tc superconductors |
1994 |
Physica: C : superconductivity |
235/240 |
6 |
UA library record; WoS full record; WoS citing articles |
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|
Hellmuth, K.H.; Siitari-Kaupi, M.; Rauhala, E.; Johansson, B.; Zilliacus, R.; Gijbels, R.; Adriaens, A. |
Reactions of high FeO-olivine rock with groundwater and redox-sensitive elements studied by surface-analytical methods and autoradiography |
1994 |
Materials Research Society symposium proceedings |
333 |
6 |
UA library record; WoS full record; WoS citing articles |
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Shi, J.M.; Peeters, F.M.; Devreese, J.T. |
Transition energies of D- centers in a superlattice |
1994 |
Surface science : a journal devoted to the physics and chemistry of interfaces |
305 |
6 |
UA library record; WoS full record; WoS citing articles |
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Held, A.; Taylor, P.; Ingelbrecht, C.; de Bièvre, P.; Broekaert, J.; van Straaten, M.; Gijbels, R. |
Determination of scandium in high-purity titanium using inductively coupled plasma mass spectrometry and glow discharge mass spectrometry as part of its certification as a reference material |
1995 |
Journal of analytical atomic spectrometry |
10 |
6 |
UA library record; WoS full record; WoS citing articles |
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Vanhellemont, J.; Claeys, C.; van Landuyt, J. |
In-situ HVEM study of dislocation generation in patterned stress fields at silicon surfaces |
1995 |
Physica status solidi: A: applied research |
150 |
6 |
UA library record; WoS full record; WoS citing articles |
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Martin, C.; Hervieu, M.; Van Tendeloo, G.; Goutenoire, F.; Michel, C.; Maignan, A.; Raveau, B. |
A mercury based cuprate with the “2212” structure: Hg2-x(Cu,Pr)xBa2PrCu2O8-\delta |
1995 |
Solid state communications |
93 |
6 |
UA library record; WoS full record; WoS citing articles |
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Huve, M.; Martin, C.; Maignan, A.; Michel, C.; Van Tendeloo, G.; Hervieu, M.; Raveau, B. |
A new cuprate with mercury bilayers : the “2222” oxide Hg2-xMxBa2Pr2Cu2O10-\delta (M= Cu,Pr) |
1995 |
Journal of solid state chemistry |
114 |
6 |
UA library record; WoS full record; WoS citing articles |
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Verbist, K.; Van Tendeloo, G.; Ye, M.; Schroeder, J.; Mehbod, M.; Deltour, R. |
Inclusions in magnetron sputtered YBa2Cu3-x MxO7-d thin films: a study by means of electron microscopy |
1996 |
Microscopy, microanalysis, microstructures |
7 |
6 |
UA library record; WoS full record; WoS citing articles |
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Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G. |
New erbium silicide superstructures: a study by high resolution electron microscopy |
1996 |
Physica status solidi: A: applied research |
158 |
6 |
UA library record; WoS full record; WoS citing articles |
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Nistor, L.; Van Tendeloo, G.; Amelinckx, S. |
The paraelectric-ferroelectric phase transition of Bi4Ti3O12 studied by electron microscopy |
1996 |
Phase transitions |
59 |
6 |
UA library record; WoS full record; WoS citing articles |
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van Cleempoel, A.; Gijbels, R.; Zhu, D.; Claeys, M.; Richter, H.; Fonseca, A. |
Quantitative determination of C60 and C70 in soot extracts by high performance liquid chromatography and mass spectrometric characterization |
1996 |
Fullerene science and technology |
4 |
6 |
UA library record; WoS full record; WoS citing articles |
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Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; Hevesi, K.; Gensterblum, G.; Yu, L.M.; Pireaux, J.J.; Grey, F.; Bohr, J. |
Structural defects and epitaxial rotation of C60 and C70 (111) films on GeS(001) |
1996 |
Journal of applied physics |
80 |
6 |
UA library record; WoS full record; WoS citing articles |
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Gregory, C.; Gijbels, R.; Jacob, W.; Geuens, I.; van Roost, C.; de Keyzer, R. |
Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy |
1997 |
Journal of microscopy |
188 |
6 |
UA library record; WoS full record; WoS citing articles |
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van Vaeck, L.; Poels, K.; de Nollin, S.; Hachimi, A.; Gijbels, R. |
Laser microprobe mass spectrometry: principle and applications in biology and medicine |
1997 |
Cell biology international |
21 |
6 |
UA library record; WoS full record; WoS citing articles |
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Verlinden, G.; Janssens, G.; Gijbels, R.; van Espen, P.; Geuens, I. |
Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis |
1997 |
Analytical chemistry |
69 |
6 |
UA library record; WoS full record; WoS citing articles |
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Luhrs, C.C.; Molins, E.; Van Tendeloo, G.; Beltran-Porter, D.; Fuertes, A. |
Crystal structure of Bi6Sr8-xCa3+xO22(-0.5\leq x\leq1.7): a mixed valence bismuth oxide related to perovskite |
1998 |
Chemistry of materials |
10 |
6 |
UA library record; WoS full record; WoS citing articles |
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Buschmann, V.; Rodewald, M.; Fuess, H.; Van Tendeloo, G.; Schaffer, C. |
Hetero-epitaxial growth of CoSi2 thin films on Si(100) : template effects and epitaxial orientations |
1998 |
Journal of crystal growth |
191 |
6 |
UA library record; WoS full record; WoS citing articles |
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Hervieu, M.; Martin, C.; Maignan, A.; Van Tendeloo, G.; Raveau, B. |
Charge ordering-disordering in Th-doped CaMnO3 |
1999 |
European physical journal : B : condensed matter and complex systems |
10 |
6 |
UA library record; WoS full record; WoS citing articles |
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Buschmann, V.; Rodewald, M.; Fuess, H.; Van Tendeloo, G.; Schäffer, C. |
High resolution electron microscopy study of molecular beam epitaxy grown CoSi2/Si1-xGex/Si(100) heterostructurs |
1999 |
Journal of applied physics |
85 |
6 |
UA library record; WoS full record; WoS citing articles |
|
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Schryvers, D.; Holland-Moritz, D. |
Martensitic transformations and microstructures in splat-cooled Ni-Al |
1999 |
Materials science and engineering: part A: structural materials: properties, microstructure and processing |
273/275 |
6 |
UA library record; WoS full record; WoS citing articles |
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Helm, M.; Hilber, W.; Strasser, G.; de Meester, R.; Peeters, F.M. |
Minibands and Wannier-Strak ladders in semiconductor superlattices studied by infrared spectroscopy |
1999 |
Brazilian journal of physics |
29 |
6 |
UA library record; WoS full record; WoS citing articles |
|
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Kato, H.; Peeters, F.M.; Ulloa, S.E. |
The remote plasmon polaron |
1999 |
Europhysics letters |
45 |
6 |
UA library record; WoS full record; WoS citing articles |
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Peeters, F.M.; Reijniers, J.; Badalian, S.M.; Vasilopoulos, P. |
Snake orbits in hybrid semiconductor/ferromagnetic devices |
1999 |
Microelectronic engineering |
47 |
6 |
UA library record; WoS full record; WoS citing articles |
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Bismayer, U.; Mathes, D.; Oroyo, M.; Bosbach, D.; Putnis, A.; Van Tendeloo, G.; Güttler, B. |
Ferroelastic domains in lead phosphate-arsenate: an AFM, X-ray diffraction, TEM and raman study |
2000 |
Phase transitions |
71 |
6 |
UA library record; WoS full record; WoS citing articles |
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Stuer, C.; van Landuyt, J.; Bender, H.; Rooyackers, R.; Badenes, G. |
The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures |
2001 |
Materials science in semiconductor processing |
4 |
6 |
UA library record; WoS full record; WoS citing articles |
|
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Adams, F.; Adriaens, A.; Bogaerts, A. |
Can plasma spectrochemistry assist in improving the accuracy of chemical analysis? |
2002 |
Analytica chimica acta |
456 |
6 |
UA library record; WoS full record; WoS citing articles |
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