| |
Author  |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
van Aarle, W.; Palenstijn, W.J.; De Beenhouwer, J.; Altantzis, T.; Bals, S.; Batenburg, K.J.; Sijbers, J. |
The ASTRA Toolbox: A platform for advanced algorithm development in electron tomography |
2015 |
Ultramicroscopy |
157 |
562 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aelst, J.; Philippaerts, A.; Bartholomeeusen, E.; Fayad, E.; Thibault-Starzyk, F.; Lu, J.; Schryvers, D.; Ooms, R.; Verboekend, D.; Jacobs, P.; Sels, B. |
Towards biolubricant compatible vegetable oils by pore mouth hydrogenation with shape-selective Pt/ZSM-5 catalysts |
2016 |
Catalysis science & technology |
6 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aelst, J.; Philippaerts, A.; Turner, S.; Van Tendeloo, G.; Jacobs, P.; Sels, B. |
Heterogeneous conjugation of vegetable oil with alkaline treated highly dispersed Ru/USY catalysts |
2016 |
Applied catalysis : A : general |
526 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aelst, J.; Verboekend, D.; Philippaerts, A.; Nuttens, N.; Kurttepeli, M.; Gobechiya, E.; Haouas, M.; Sree, S.P.; Denayer, J.F.M.; Martens, J.A.; Kirschhock, C.E.A.; Taulelle, F.; Bals, S.; Baron, G.V.; Jacobs, P.A.; Sels, B.F. |
Catalyst design by NH4OH treatment of USY zeolite |
2015 |
Advanced functional materials |
25 |
64 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S. |
Atomen in 3D : Antwerpenaren brengen atomaire structuur nanodeeltjes in beeld |
2011 |
Chemie magazine |
7 |
|
UA library record |
|
|
|
Van Aert, S. |
Meer zien met onzichtbaar licht |
2007 |
Karakter : tijdschrift van wetenschap |
18 |
|
UA library record |
|
|
|
Van Aert, S. |
Statistical parameter estimation theory : a tool for quantitative electron microscopy |
2012 |
|
|
|
UA library record |
|
|
|
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. |
The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data |
2008 |
|
|
|
UA library record |
|
|
|
Van Aert, S.; Batenburg, J.; Van Tendeloo, S. |
Atomen tellen |
2011 |
Nederlands tijdschrift voor natuurkunde (1991) |
77 |
|
UA library record |
|
|
|
Van Aert, S.; Batenburg, K.J.; Rossell, M.D.; Erni, R.; Van Tendeloo, G. |
Three-dimensional atomic imaging of crystalline nanoparticles |
2011 |
Nature |
470 |
341 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; Chang, L.Y.; Bals, S.; Kirkland, A.I.; Van Tendeloo, G. |
Effect of amorphous layers on the interpretation of restored exit waves |
2009 |
Ultramicroscopy |
109 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; Chen, J.H.; van Dyck, D. |
Linear versus non-linear structural information limit in high-resolution transmission electron microscopy |
2010 |
Ultramicroscopy |
110 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; De Backer, A.; Jones, L.; Martinez, G.T.; Béché, A.; Nellist, P.D. |
Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy |
2019 |
Physical review letters |
122 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. |
Advanced electron crystallography through model-based imaging |
2016 |
IUCrJ |
3 |
30 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; de Backer, A.; Martinez, G.T.; Goris, B.; Bals, S.; Van Tendeloo, G.; Rosenauer, A. |
Procedure to count atoms with trustworthy single-atom sensitivity |
2013 |
Physical review : B : condensed matter and materials physics |
87 |
106 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
High-resolution electron microscopy : from imaging toward measuring |
2002 |
IEEE transactions on instrumentation and measurement |
51 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
Statistical experimental design for quantitative atomic resolution transmission electron microscopy |
2004 |
|
|
13 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
High resolution electron microscopy from imaging towards measuring |
2001 |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
|
|
UA library record |
|
|
|
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example |
2005 |
Ultramicroscopy |
104 |
37 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; den Dekker, A.J.; van Dyck, D. |
How to optimize the experimental design of quantitative atomic resolution TEM experiments? |
2004 |
Micron |
35 |
14 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
High-resolution electron microscopy and electron tomography: resolution versus precision |
2002 |
Journal of structural biology |
138 |
33 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
The notion of resolution |
2008 |
|
|
|
UA library record |
|
|
|
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
The notion of resolution |
2007 |
|
|
|
UA library record |
|
|
|
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
Optimal experimental design of STEM measurement of atom column positions |
2002 |
Ultramicroscopy |
90 |
35 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; Geuens, P.; van Dyck, D.; Kisielowski, C.; Jinschek, J.R. |
Electron channelling based crystallography |
2007 |
Ultramicroscopy |
107 |
32 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; Turner, S.; Delville, R.; Schryvers, D.; Van Tendeloo, G.; Ding, X.; Salje, E.K.H. |
Functional twin boundaries |
2013 |
Phase transitions |
86 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; Turner, S.; Delville, R.; Schryvers, D.; Van Tendeloo, G.; Salje, E.K.H. |
Direct observation of ferrielectricity at ferroelastic domain boundaries in CaTiO3 by electron microscopy |
2012 |
Advanced materials |
24 |
150 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. |
Model-based electron microscopy : from images toward precise numbers for unknown structure parameters |
2012 |
Micron |
43 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; van Dyck, D. |
Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? |
2001 |
Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties |
81 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative |
2006 |
Optics express |
14 |
45 |
UA library record; WoS full record; WoS citing articles |
|
