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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Angeli, J.; Bengtson, A.; Bogaerts, A.; Hoffmann, V.; Hodoroaba, V.-D.; Steers, E. |
Glow discharge optical emission spectrometry: moving towards reliable thin film analysis: a short review |
2003 |
Journal of analytical atomic spectrometry |
18 |
75 |
UA library record; WoS full record; WoS citing articles |
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Jakubowski, N.; Bogaerts, A.; Hoffmann, V. |
Glow discharges in emission and mass spectrometry |
2003 |
|
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UA library record |
|
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Chen, Z.; Kong, M.; Milošević, M.V.; Wu, Y. |
Ground state configurations of two-dimensional plasma crystals under long-range attractive particle interaction force |
2003 |
Physica scripta |
67 |
4 |
UA library record; WoS full record; WoS citing articles |
|
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Lenaerts, J.; Gijbels, R.; van Vaeck, L.; Verlinden, G.; Geuens, I. |
Imaging TOF-SIMS for the surface analysis of silver halide microcrystals |
2003 |
Applied surface science |
203/204 |
7 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Gijbels, R.; Grozeva, M.; Sabotinov, N. |
Investigation of laser output power saturation in the He-Cu+ IR hollow cathode discharge laser by experiments and numerical modeling |
2003 |
Physica scripta |
T105 |
|
UA library record; WoS full record; WoS citing articles |
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de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks |
2003 |
Applied surface science |
203 |
15 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Chen, Z.; Gijbels, R.; Vertes, A. |
Laser ablation for analytical sampling: what can we learn from modeling? |
2003 |
Spectrochimica acta: part B : atomic spectroscopy |
58 |
321 |
UA library record; WoS full record; WoS citing articles |
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Mihailova, D.; Grozeva, M.; Bogaerts, A.; Gijbels, R.; Sabotinov, N. |
Longitudinal hollow cathode copper ion laser: optimization of excitation and geometry |
2003 |
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UA library record; WoS full record; WoS citing articles |
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Gijbels, R. |
The many faces of TOF-SIMS for the characterization of solid (sub)surfaces |
2003 |
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UA library record |
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Bogaerts, A.; Gijbels, R.; Jackson, G.P. |
Modeling of a millisecond pulsed glow discharge: investigation of the afterpeak |
2003 |
Journal of analytical atomic spectrometry |
18 |
42 |
UA library record; WoS full record; WoS citing articles |
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Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Adams, F. |
Molecular speciation of inorganic mixtures by Fourier transform laser microprobe mass sepctrometry |
2003 |
International journal of mass spectrometry |
225 |
9 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Gijbels, R. |
Numerical modelling of analytical glow discharges |
2003 |
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UA library record |
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Bogaerts, A.; Gijbels, R. |
Numerical modelling of gas discharge plasmas for various applications |
2003 |
Vacuum: surface engineering, surface instrumentation & vacuum technology |
69 |
16 |
UA library record; WoS full record; WoS citing articles |
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Georgieva, V.; Bogaerts, A.; Gijbels, R. |
Numerical study of Ar/CF4/N2 discharges in single and dual frequency capacitively coupled plasma reactors |
2003 |
Journal of applied physics |
94 |
90 |
UA library record; WoS full record; WoS citing articles |
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Herrebout, D.; Bogaerts, A.; Gijbels, R.; Goedheer, W.J.; Vanhulsel, A. |
A one-dimensional fluid model for an acetylene rf discharge: a study of the plasma chemistry |
2003 |
IEEE transactions on plasma science |
31 |
26 |
UA library record; WoS full record; WoS citing articles |
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de Bleecker, K.; Herrebout, D.; Bogaerts, A.; Gijbels, R.; Descamps, P. |
One-dimensional modelling of a capacitively coupled rf plasma in silane/helium, including small concentrations of O2 and N2 |
2003 |
Journal of physics: D: applied physics |
36 |
|
UA library record; WoS full record; WoS citing articles |
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Chen, Z.; Feng, X.; Xu, Y.; Yu, M.Y. |
Optical bistability and multistability in four-level systems |
2003 |
Physica scripta |
68 |
8 |
UA library record; WoS full record; WoS citing articles |
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Georgieva, V.; Bogaerts, A.; Gijbels, R. |
Particle-in-cell/Monte Carlo simulation of a capacitively coupled radio frequency Ar/Cf4 discharge: effect of gas composition |
2003 |
Journal of applied physics |
93 |
57 |
UA library record; WoS full record; WoS citing articles |
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Neyts, E.; Yan, M.; Bogaerts, A.; Gijbels, R. |
Particle-in-cell/Monte Carlo simulations of a low-pressure capacitively coupled radio-frequency discharge: effect of adding H2 to an Ar discharge |
2003 |
Journal of applied physics |
93 |
15 |
UA library record; WoS full record; WoS citing articles |
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Neyts, E.; Yan, M.; Bogaerts, A.; Gijbels, R. |
PIC-MC simulation of an RF capacitively coupled Ar/H2 discharge |
2003 |
Nuclear instruments and methods in physics research: B |
202 |
8 |
UA library record; WoS full record; WoS citing articles |
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Baguer, N.; Bogaerts, A.; Gijbels, R. |
Role of the fast Ar atoms, Ar+ ions and metastable Ar atoms in a hollow cathode glow discharge: study by a hybrid model |
2003 |
Journal of applied physics |
94 |
19 |
UA library record; WoS full record; WoS citing articles |
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Lenaerts, J.; van Vaeck, L.; Gijbels, R. |
Secondary ion formation of low molecular weight organic dyes in time-of-flight static secondary ion mass spectrometry |
2003 |
Rapid communications in mass spectrometry |
17 |
10 |
UA library record; WoS full record; WoS citing articles |
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Baguer, N.; Bogaerts, A.; Gijbels, R. |
Study of a hollow cathode glow discharge in He: Monte Carlo-fluid model combined with a transport model for the metastable atoms |
2003 |
Journal of applied physics |
93 |
24 |
UA library record; WoS full record; WoS citing articles |
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Bings, N.H.; Bogaerts, A.; Broekaert, J.A.C. |
Atomic spectroscopy |
2004 |
Analytical chemistry |
76 |
32 |
UA library record; WoS full record; WoS citing articles |
|
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Bogaerts, A.; Gijbels, R. |
Calculation of cathode heating in analytical glow discharges |
2004 |
Journal of analytical atomic spectrometry |
19 |
21 |
UA library record; WoS full record; WoS citing articles |
|
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Adriaensen, L.; Vangaever, F.; Gijbels, R. |
A comparative study of carbocyanine dyes measured with TOF-SIMS and other mass spectrometric techniques |
2004 |
Applied surface science |
231/232 |
7 |
UA library record; WoS full record; WoS citing articles |
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Lenaerts, J.; van Vaeck, L.; Gijbels, R.; Van Luppen, J. |
Comparison of mono- and polyatomic primary ions for the characterization of organic dye overlayers with static secondary ion mass spectrometry |
2004 |
Rapid communications in mass spectrometry |
18 |
5 |
UA library record; WoS full record; WoS citing articles |
|
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Bogaerts, A.; Verscharen, W.; Steers, E. |
Computer simulations of crater profiles in glow discharge optical emission spectrometry: comparison with experiments and investigation of the underlying mechanisms |
2004 |
Spectrochimica acta: part B : atomic spectroscopy |
59 |
14 |
UA library record; WoS full record; WoS citing articles |
|
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Shimizu, K.; Habazaki, H.; Bender, H.; Gijbels, R. |
The dawn of surface analysis that stands by the side users: ultra-thin film analysis by rf-GDOES |
2004 |
Engineering materials |
52 |
|
UA library record |
|
|
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Ignatova, V.A.; Conard, T.; Möller, W.; Vandervorst, W.; Gijbels, R. |
Depth profiling of ZrO2/SiO2/Si stacks : a TOF-SIMS and computer simulation study |
2004 |
Applied surface science |
231/232 |
4 |
UA library record; WoS full record; WoS citing articles |
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