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Author |
Title  |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Jannis, D.; Velazco, A.; Béché, A.; Verbeeck, J. |
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process |
2022 |
Ultramicroscopy |
|
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Guzzinati, G.; Béché, A.; McGrouther, D.; Verbeeck, J. |
Rotation of electron beams in the presence of localised, longitudinal magnetic fields |
2019 |
|
|
|
UA library record |
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Verbeeck, J.; Guzzinati, G.; Clark, L.; Juchtmans, R.; Van Boxem, R.; Tian, H.; Béché, A.; Lubk, A.; Van Tendeloo, G. |
Shaping electron beams for the generation of innovative measurements in the (S)TEM |
2014 |
Comptes rendus : physique |
15 |
22 |
UA library record; WoS full record; WoS citing articles |
|
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Savchenko, T.M.; Buzzi, M.; Howald, L.; Ruta, S.; Vijayakumar, J.; Timm, M.; Bracher, D.; Saha, S.; Derlet, P.M.; Béché, A.; Verbeeck, J.; Chantrell, R.W.; Vaz, C.A.F.; Nolting, F.; Kleibert, A. |
Single femtosecond laser pulse excitation of individual cobalt nanoparticles |
2020 |
Physical Review B |
102 |
1 |
UA library record; WoS full record |
|
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Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. |
Spectrocopic coincidence experiment in transmission electron microscopy |
2019 |
|
|
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UA library record |
|
|
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Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. |
Spectroscopic coincidence experiments in transmission electron microscopy |
2019 |
Applied physics letters |
114 |
18 |
UA library record; WoS full record; WoS citing articles |
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Cooper, D.; Le Royer, C.; Béché, A.; Rouvière, J.-L. |
Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy |
2012 |
Applied Physics Letters |
100 |
|
UA library record; WoS full record; WoS citing articles |
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Cooper, D.; Denneulin, T.; Bernier, N.; Béché, A.; Rouvière, J.-L. |
Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope |
2016 |
Micron |
80 |
50 |
UA library record; WoS full record; WoS citing articles |
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Cooper, D.; Denneulin, T.; Barnes, J.-P.; Hartmann, J.-M.; Hutin, L.; Le Royer, C.; Béché, A.; Rouvière, J.-L. |
Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy |
2012 |
Applied Physics Letters |
112 |
14 |
UA library record; WoS full record; WoS citing articles |
|
|
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Béché, A.; Rouviere, J.L.; Barnes, J.P.; Cooper, D. |
Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography |
2013 |
Ultramicroscopy |
131 |
73 |
UA library record; WoS full record; WoS citing articles |
|
|
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Prabhakara, V.; Jannis, D.; Béché, A.; Bender, H.; Verbeeck, J. |
Strain measurement in semiconductor FinFET devices using a novel moiré demodulation technique |
2019 |
Semiconductor science and technology |
|
8 |
UA library record; WoS full record; WoS citing articles |
|
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Clark, L.; Guzzinati, G.; Béché, A.; Lubk, A.; Verbeeck, J. |
Symmetry-constrained electron vortex propagation |
2016 |
Physical review A |
93 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Denneulin, T.; Rouvière, J.L.; Béché, A.; Py, M.; Barnes, J.P.; Rochat, N.; Hartmann, J.M.; Cooper, D. |
The reduction of the substitutional C content in annealed Si/SiGeC superlattices studied by dark-field electron holography |
2011 |
Semiconductor science and technology |
26 |
|
UA library record; WoS full record; WoS citing articles |
|
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Bliokh, K.Y.; Ivanov, I.P.; Guzzinati, G.; Clark, L.; Van Boxem, R.; Béché, A.; Juchtmans, R.; Alonso, M.A.; Schattschneider, P.; Nori, F.; Verbeeck, J. |
Theory and applications of free-electron vortex states |
2017 |
Physics reports |
690 |
210 |
UA library record; WoS full record; WoS citing articles |
|
|
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Liu, P.; Arslan Irmak, E.; De Backer, A.; De wael, A.; Lobato, I.; Béché, A.; Van Aert, S.; Bals, S. |
Three-dimensional atomic structure of supported Au nanoparticles at high temperature |
2021 |
Nanoscale |
13 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
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Altantzis, T.; Lobato, I.; De Backer, A.; Béché, A.; Zhang, Y.; Basak, S.; Porcu, M.; Xu, Q.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Van Tendeloo, G.; Van Aert, S.; Bals, S. |
Three-Dimensional Quantification of the Facet Evolution of Pt Nanoparticles in a Variable Gaseous Environment |
2019 |
Nano letters |
19 |
82 |
UA library record; WoS full record; WoS citing articles |
|
|
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Jones, E.; Cooper, D.; Rouvière, J.-L.; Béché, A.; Azize, M.; Palacios, T.; Gradecak, S. |
Towards rapid nanoscale measurement of strain in III-nitride heterostructures |
2013 |
Applied Physics Letters |
103 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
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Juchtmans, R.; Béché, A.; Abakumov, A.; Batuk, M.; Verbeeck, J. |
Using electron vortex beams to determine chirality of crystals in transmission electron microscopy |
2015 |
Physical review : B : condensed matter and materials physics |
91 |
54 |
UA library record; WoS full record; WoS citing articles |
|
|
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Van den Broek, W.; Reed, B.W.; Béché, A.; Velazco, A.; Verbeeck, J.; Koch, C.T. |
Various compressed sensing setups evaluated against Shannon sampling under constraint of constant illumination |
2019 |
IEEE transactions on computational imaging |
5 |
7 |
UA library record; WoS full record; WoS citing articles |
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