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  Author Title Year Publication Volume Times cited Additional Links (up) Links
de Backer, A.; De wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits? 2015 Journal of physics : conference series 644 UA library record url doi
Cooper, D.; de la Peña, F.; Béché, A.; Rouvière, J.-L.; Servanton, G.; Pantel, R.; Morin, P. Field mapping with nanometer-scale resolution for the next generation of electronic devices 2011 Nano letters 11 12 UA library record; WoS full record; WoS citing articles doi
Jalabert, D.; Pelloux-Gervais, D.; Béché, A.; Hartmann, J.M.; Gergaud, P.; Rouvière, J.L.; Canut, B. Depth strain profile with sub-nm resolution in a thin silicon film using medium energy ion scattering 2012 Physica Status Solidi A-Applications And Materials Science 209 3 UA library record; WoS full record; WoS citing articles doi
Cooper, D.; Le Royer, C.; Béché, A.; Rouvière, J.-L. Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy 2012 Applied Physics Letters 100 UA library record; WoS full record; WoS citing articles doi
Cooper, D.; Denneulin, T.; Barnes, J.-P.; Hartmann, J.-M.; Hutin, L.; Le Royer, C.; Béché, A.; Rouvière, J.-L. Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy 2012 Applied Physics Letters 112 14 UA library record; WoS full record; WoS citing articles doi
Jones, E.; Cooper, D.; Rouvière, J.-L.; Béché, A.; Azize, M.; Palacios, T.; Gradecak, S. Towards rapid nanoscale measurement of strain in III-nitride heterostructures 2013 Applied Physics Letters 103 6 UA library record; WoS full record; WoS citing articles doi
van Huis, M.A.; Figuerola, A.; Fang, C.; Béché, A.; Zandbergen, H.W.; Manna, L. Letter Chemical transformation of Au-tipped CdS nanorods into AuS/Cd core/shell particles by electron beam irradiation 2011 Nano letters 11 25 UA library record; WoS full record; WoS citing articles doi
Verbeeck, J.; Béché, A.; van den Broek, W. A holographic method to measure the source size broadening in STEM 2012 Ultramicroscopy 120 29 UA library record; WoS full record; WoS citing articles pdf doi
Clark, L.; Béché, A.; Guzzinati, G.; Lubk, A.; Mazilu, M.; Van Boxem, R.; Verbeeck, J. Exploiting lens aberrations to create electron-vortex beams 2013 Physical review letters 111 66 UA library record; WoS full record; WoS citing articles url doi
Béché, A.; Rouviere, J.L.; Barnes, J.P.; Cooper, D. Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography 2013 Ultramicroscopy 131 73 UA library record; WoS full record; WoS citing articles doi
Tan, H.; Egoavil, R.; Béché, A.; Martinez, G.T.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Rotella, H.; Boullay, P.; Pautrat, A.; Prellier, W. Mapping electronic reconstruction at the metal-insulator interface in LaVO3/SrVO3 heterostructures 2013 Physical review : B : condensed matter and materials physics 88 15 UA library record; WoS full record; WoS citing articles url doi
Béché, A.; Van Boxem, R.; Van Tendeloo, G.; Verbeeck, J. Magnetic monopole field exposed by electrons 2014 Nature physics 10 131 UA library record; WoS full record; WoS citing articles url doi
Guzzinati, G.; Clark, L.; Béché, A.; Verbeeck, J. Measuring the orbital angular momentum of electron beams 2014 Physical review : A : atomic, molecular and optical physics 89 42 UA library record; WoS full record; WoS citing articles url doi
Li, K.; Béché, A.; Song, M.; Sha, G.; Lu, X.; Zhang, K.; Du, Y.; Ringer, S.P.; Schryvers, D. Atomistic structure of Cu-containing \beta" precipitates in an Al-Mg-Si-Cu alloy 2014 Scripta materialia 75 22 UA library record; WoS full record; WoS citing articles doi
Verbeeck, J.; Guzzinati, G.; Clark, L.; Juchtmans, R.; Van Boxem, R.; Tian, H.; Béché, A.; Lubk, A.; Van Tendeloo, G. Shaping electron beams for the generation of innovative measurements in the (S)TEM 2014 Comptes rendus : physique 15 22 UA library record; WoS full record; WoS citing articles pdf url doi
Clark, L.; Béché, A.; Guzzinati, G.; Verbeeck, J. Quantitative measurement of orbital angular momentum in electron microscopy 2014 Physical review : A : atomic, molecular and optical physics 89 23 UA library record; WoS full record; WoS citing articles url doi
Guzzinati, G.; Clark, L.; Béché, A.; Juchtmans, R.; Van Boxem, R.; Mazilu, M.; Verbeeck, J. Prospects for versatile phase manipulation in the TEM : beyond aberration correction 2015 Ultramicroscopy 151 19 UA library record; WoS full record; WoS citing articles pdf url doi
Mueller, K.; Krause, F.F.; Béché, A.; Schowalter, M.; Galioit, V.; Loeffler, S.; Verbeeck, J.; Zweck, J.; Schattschneider, P.; Rosenauer, A. Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction 2014 Nature communications 5 197 UA library record; WoS full record; WoS citing articles pdf url doi
de Backer, A.; Martinez, G.T.; MacArthur, K.E.; Jones, L.; Béché, A.; Nellist, P.D.; Van Aert, S. Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting 2015 Ultramicroscopy 151 29 UA library record; WoS full record; WoS citing articles pdf url doi
Juchtmans, R.; Béché, A.; Abakumov, A.; Batuk, M.; Verbeeck, J. Using electron vortex beams to determine chirality of crystals in transmission electron microscopy 2015 Physical review : B : condensed matter and materials physics 91 54 UA library record; WoS full record; WoS citing articles url doi
Egoavil, R.; Huehn, S.; Jungbauer, M.; Gauquelin, N.; Béché, A.; Van Tendeloo, G.; Verbeeck; Moshnyaga, V. Phase problem in the B-site ordering of La2CoMnO6 : impact on structure and magnetism 2015 Nanoscale 7 37 UA library record; WoS full record; WoS citing articles pdf url doi
Martinez, G.T.; Jones, L.; de Backer, A.; Béché, A.; Verbeeck, J.; Van Aert, S.; Nellist, P.D. Quantitative STEM normalisation : the importance of the electron flux 2015 Ultramicroscopy 159 27 UA library record; WoS full record; WoS citing articles pdf url doi
Wolf, D.; Rodriguez, L.A.; Béché, A.; Javon, E.; Serrano, L.; Magen, C.; Gatel, C.; Lubk, A.; Lichte, H.; Bals, S.; Van Tendeloo, G.; Fernández-Pacheco, A.; De Teresa, J.M.; Snoeck, E. 3D Magnetic Induction Maps of Nanoscale Materials Revealed by Electron Holographic Tomography 2015 Chemistry of materials 27 50 UA library record; WoS full record; WoS citing articles url doi
Lubk, A.; Béché, A.; Verbeeck, J. Electron Microscopy of Probability Currents at Atomic Resolution 2015 Physical review letters 115 12 UA library record; WoS full record; WoS citing articles pdf url doi
De Backer, A.; De Wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits? 2015 Journal of physics : conference series 644 UA library record; WoS full record pdf url doi
Béché, A.; Winkler, R.; Plank, H.; Hofer, F.; Verbeeck, J. Focused electron beam induced deposition as a tool to create electron vortices 2015 Micron 80 21 UA library record; WoS full record; WoS citing articles pdf url doi
Béché, A.; Goris, B.; Freitag, B.; Verbeeck, J. Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy 2016 Applied physics letters 108 40 UA library record; WoS full record; WoS citing articles pdf url doi
Béché, A.; Juchtmans, R.; Verbeeck, J. Efficient creation of electron vortex beams for high resolution STEM imaging 2017 Ultramicroscopy 178 30 UA library record; WoS full record; WoS citing articles pdf url doi
Clark, L.; Guzzinati, G.; Béché, A.; Lubk, A.; Verbeeck, J. Symmetry-constrained electron vortex propagation 2016 Physical review A 93 7 UA library record; WoS full record; WoS citing articles pdf url doi
Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy 2016 Ultramicroscopy 178 93 UA library record; WoS full record; WoS citing articles pdf url doi
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