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Phase offset method of ptychographic contrast reversal correction”. Hofer C, Gao C, Chennit T, Yuan B, Pennycook TJ, Ultramicroscopy , 113922 (2024). http://doi.org/10.1016/j.ultramic.2024.113922
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On central focusing for contrast optimization in direct electron ptychography of thick samples”. Gao C, Hofer C, Pennycook TJ, Ultramicroscopy 256, 113879 (2024). http://doi.org/10.1016/J.ULTRAMIC.2023.113879
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Two-dimensional halide Pb-perovskite-double perovskite epitaxial heterostructures”. Singh A, Yuan B, Rahman MH, Yang H, De A, Park JY, Zhang S, Huang L, Mannodi-Kanakkithodi A, Pennycook TJ, Dou L, Journal of the American Chemical Society 145, 19885 (2023). http://doi.org/10.1021/JACS.3C06127
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Reliable phase quantification in focused probe electron ptychography of thin materials”. Hofer C, Pennycook TJ, Ultramicroscopy 254, 113829 (2023). http://doi.org/10.1016/j.ultramic.2023.113829
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Picometer-precision few-tilt ptychotomography of 2D materials”. Hofer C, Mustonen K, Skakalova V, Pennycook TJ, 2D materials 10, 035029 (2023). http://doi.org/10.1088/2053-1583/ACDD80
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Crystal structure controls on oriented primary magnetite micro-inclusions in plagioclase From oceanic gabbro”. Bian G, Ageeva O, Roddatis V, Li C, Pennycook TJ, Habler G, Abart R, Journal of petrology 64, egad008 (2023). http://doi.org/10.1093/PETROLOGY/EGAD008
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Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science”. Gao C, Hofer C, Jannis D, Béché, A, Verbeeck J, Pennycook TJ, Applied physics letters 121, 081906 (2022). http://doi.org/10.1063/5.0101895
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Accurate and Robust Calibration of the Uniform Affine Transformation Between Scan-Camera Coordinates for Atom-Resolved In-Focus 4D-STEM Datasets”. Ning S, Xu W, Ma Y, Loh L, Pennycook TJ, Zhou W, Zhang F, Bosman M, Pennycook SJ, He Q, Loh ND, Microscopy and microanalysis , 1 (2022). http://doi.org/10.1017/S1431927622000320
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Towards Exotic Layered Materials: 2D Cuprous Iodide”. Mustonen K, Hofer C, Kotrusz P, Markevich A, Hulman M, Mangler C, Susi T, Pennycook TJ, Hricovini K, Richter CM, Meyer JC, Kotakoski J, Skákalová, V, Advanced materials , 2106922 (2021). http://doi.org/10.1002/adma.202106922
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ab initio description of bonding for transmission electron microscopy”. Madsen J, Pennycook TJ, Susi T, Ultramicroscopy 231 (2021). http://doi.org/10.1016/J.ULTRAMIC.2021.113253
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Towards chirality control of graphene nanoribbons embedded in hexagonal boron nitride”. Wang HS, Chen L, Elibol K, He L, Wang H, Chen C, Jiang C, Li C, Wu T, Cong CX, Pennycook TJ, Argentero G, Zhang D, Watanabe K, Taniguchi T, Wei W, Yuan Q, Meyer JC, Xie X, Nature Materials , 1 (2020). http://doi.org/10.1038/S41563-020-00806-2
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Beyond surface redox and oxygen mobility at pd-polar ceria (100) interface : underlying principle for strong metal-support interactions in green catalysis”. Mahadi AH, Ye L, Fairclough SM, Qu J, Wu S, Chen W, Papaioannou E, Ray B, Pennycook TJ, Haigh SJ, Young NP, Tedsree K, Metcalfe IS, Tsang SCE, Applied Catalysis B-Environmental 270, 118843 (2020). http://doi.org/10.1016/J.APCATB.2020.118843
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Efficient Phase Contrast Imaging via Electron Ptychography, a Tutorial”. Pennycook TJ, Martinez GT, O'Leary CM, Yang H, Nellist PD, Microscopy and microanalysis 25, 2684 (2019). http://doi.org/10.1017/S1431927619014156
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Scanning transmission electron microscopy under controlled low-pressure atmospheres”. Leuthner GT, Hummel S, Mangler C, Pennycook TJ, Susi T, Meyer JC, Kotakoski J, Ultramicroscopy 203, 76 (2019). http://doi.org/10.1016/J.ULTRAMIC.2019.02.002
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Efficient first principles simulation of electron scattering factors for transmission electron microscopy”. Susi T, Madsen J, Ludacka U, Mortensen JJ, Pennycook TJ, Lee Z, Kotakoski J, Kaiser U, Meyer JC, Ultramicroscopy 197, 16 (2019). http://doi.org/10.1016/J.ULTRAMIC.2018.11.002
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High dose efficiency atomic resolution imaging via electron ptychography”. Pennycook TJ, Martinez GT, Nellist PD, Meyer JC, Ultramicroscopy 196, 131 (2019). http://doi.org/10.1016/J.ULTRAMIC.2018.10.005
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Smart Align : a new tool for robust non-rigid registration of scanning microscope data”. Jones L, Yang H, Pennycook TJ, Marshall MSJ, Van Aert S, Browning ND, Castell MR, Nellist PD, Advanced Structural and Chemical Imaging 1, 8 (2015). http://doi.org/10.1186/s40679-015-0008-4
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