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Semiempirical approach for standardless calibration in µ-XRF spectrometry using capillary lenses”. Padilla R, van Espen P, Abrahantes A, Janssens K, X-ray spectrometry 34, 19 (2005). http://doi.org/10.1002/XRS.781
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EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments”. Fredrickx P, de Ryck I, Janssens K, Schryvers D, Petit J-P, Döcking H, X-ray spectrometry 33, 326 (2004). http://doi.org/10.1002/xrs.734
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Grazing-exit electron probe x-ray microanalysis of light elements in particles”. Spolnik Z, Tsuji K, Van Grieken R, X-ray spectrometry 33, 16 (2004). http://doi.org/10.1002/XRS.656
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Literature trends in x-ray emission spectrometry in the period 1990-2000: a review”. Injuk J, Van Grieken R, X-ray spectrometry 32, 35 (2003). http://doi.org/10.1002/XRS.606
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Reconstruction of the three-dimensional distribution of elements in fly-ash particles by micro-XRF spectroscopy”. Rindby A, Janssens K, Osán J, X-ray spectrometry 32, 248 (2003). http://doi.org/10.1002/XRS.647
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Characterization of a polycapillary lens for use in micro-XANES experiments”. Proost K, Vincze L, Janssens K, Gao N, Bulska E, Schreiner M, Falkenberg G, X-ray spectrometry 32, 215 (2003). http://doi.org/10.1002/XRS.635
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Performance of a new compact EDXRF spectrometer for aerosol analysis”. Samek L, Injuk J, van Espen P, Van Grieken R, X-ray spectrometry 31, 84 (2002). http://doi.org/10.1002/XRS.551
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Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Hoffmann P, Ortner HM, X-ray spectrometry 31, 87 (2002). http://doi.org/10.1002/XRS.563
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Optimization of experimental conditions of thin-window EPMA for ligh-element analysis of individual environmental particles”. Szalóki I, Osán J, Worobiec A, de Hoog J, Van Grieken R, X-ray spectrometry 30, 143 (2001). http://doi.org/10.1002/XRS.473.ABS
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ID18F: a new micro-X-ray fluorescence end-station at the European Synchrotron Radiation Facility (ESRF): preliminary results”. Somogyi A, Drakopoulos M, Vincze L, Vekemans B, Camerani C, Janssens K, Snigirev A, Adams F, X-ray spectrometry 30, 242 (2001). http://doi.org/10.1002/XRS.494.ABS
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Individual particle characterization of Siberian aerosols by micro-PIXE and backscattering spectrometry”. van Malderen H, Hoornaert S, Injuk J, Przybylowicz WJ, Pineda CA, Prozesky VM, Van Grieken R, X-ray spectrometry 30, 320 (2001). http://doi.org/10.1002/XRS.505
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Efficiency calibartion of energy-dispersive detectors for application in quantitative x- and γ-ray spectrometry”. Szalóki I, Szegedi S, Varga K, Braun M, Osán J, Van Grieken R, X-ray spectrometry 30, 49 (2001). http://doi.org/10.1002/XRS.467
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Evaluation of energy-dispersive x-ray spectra of low-Z elements from electron-probe microanalysis of individual particles”. Osán J, de Hoog J, van Espen P, Szalóki I, Ro C-U, Van Grieken R, X-ray spectrometry 30, 419 (2001). http://doi.org/10.1002/XRS.523
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Component selection for a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Gibson D, Hoffmann P, Ortner HM, X-ray spectrometry 30, 8 (2001). http://doi.org/10.1002/XRS.457
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Use of microscopic XRF for non-destructive analysis in art an archaeometry”. Janssens K, Vittiglio G, Deraedt I, Aerts A, Vekemans B, Vincze L, Wei F, de Ryck I, Schalm O, Adams F, Rindby A, Knöchel A, Simionovici AS, Snigirev A, X-ray spectrometry 29, 73 (2000). http://doi.org/10.1002/(SICI)1097-4539(200001/02)29:1<73::AID-XRS416>3.3.CO;2-D
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Progress in laboratory grazing emission X-ray fluorescence spectrometry”. Claes M, de Bokx P, Van Grieken R, X-ray spectrometry 28, 224 (1999). http://doi.org/10.1002/(SICI)1097-4539(199907/08)28:4<224::AID-XRS337>3.3.CO;2-W
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Application of auxiliary signals in X-ray fluorescence and electron microprobe analysis for density evaluation”. Kuczumov A, Vekemans B, Schalm O, Vincze L, Dorriné, W, Gysels K, Van Grieken R, X-ray spectrometry 28, 282 (1999). http://doi.org/10.1002/(SICI)1097-4539(199907/08)28:4<282::AID-XRS352>3.0.CO;2-H
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Energy-dispersive X-ray fluorescence in geochemical mapping”. Civici N, Van Grieken R, X-ray spectrometry 26, 147 (1997). http://doi.org/10.1002/(SICI)1097-4539(199707)26:4<147::AID-XRS193>3.0.CO;2-X
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Automated segmentation of μ-XRF image sets”. Vekemans B, Janssens K, Vincze L, Aerts A, Adams F, Hertogen J, X-ray spectrometry 26, 333 (1997)
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Analysis of X-ray spectra by iterative least squares (AXIL): new developments”. Vekemans B, Janssens K, Vincze L, Adams F, van Espen P, X-ray spectrometry 23, 278 (1994). http://doi.org/10.1002/XRS.1300230609
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M\alpha/L\alpha intensity ratios for Ta, W, Pt, Au, Pb and Bi for electron energies in the 11-40 keV range”. Trincavelli J, Montoro S, van Espen P, Van Grieken R, X-ray spectrometry 22, 372 (1993). http://doi.org/10.1002/XRS.1300220510
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Monte Carlo simulation of conventional and synchrotron energy-dispersive X-ray spectrometers”. Janssens K, Vincze L, van Espen P, Adams F, X-ray spectrometry 22, 234 (1993). http://doi.org/10.1002/XRS.1300220412
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EDXRS study of aerosol composition variations in air masses crossing the North Sea”. Injuk J, van Malderen H, Van Grieken R, Swietlicki E, Knox JM, Schofield R, X-ray spectrometry 22, 220 (1993). http://doi.org/10.1002/XRS.1300220410
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Current trends in the literature on X-ray emission spectrometry”. Van Grieken R, Markowicz A, Veny P, X-ray spectrometry 20, 271 (1991). http://doi.org/10.1002/XRS.1300200605
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Energy-dispersive X-ray fluorescence analysis of geological materials in borax beads using Tertian's binary coefficient approach combined with internal standard addition”. Muia LM, Van Grieken R, X-ray spectrometry 20, 179 (1991)
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Use of theoretical accurate binary influence coefficients with Tertian's equation in X-ray fluorescence analysis of silicate rocks in borax glass beads”. Muia LM, Van Grieken R, X-ray spectrometry 19, 141 (1990). http://doi.org/10.1002/XRS.1300190311
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Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation”. Araujo MF, van Espen P, Van Grieken R, X-ray spectrometry 19, 29 (1990). http://doi.org/10.1002/XRS.1300190107
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Evaluation of the ArmstrongBuseck correction for automated electron probe X-ray microanalysis of particles”. Storms HM, Janssens KH, Török SB, Van Grieken RE, X-ray spectrometry 18, 45 (1989). http://doi.org/10.1002/XRS.1300180203
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Theoretical evaluation of the effective alpha and De Jongh approaches in X-ray fluorescence analysis of geological materials in borax glass beads”. Muia LM, Van Grieken R, X-ray spectrometry 18, 259 (1989). http://doi.org/10.1002/XRS.1300180604
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Monte Carlo simulation of backscattered peaks in secondary target energy-dispersive X-ray spectra”. Van Dyck P, Török S, Van Grieken R, X-ray spectrometry 15, 231 (1986). http://doi.org/10.1002/XRS.1300150403
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