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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links  |
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Bogaerts, A.; Gijbels, R. |
Fundamental aspects and applications of glow discharge spectrometric techniques |
1998 |
Spectrochimica acta: part B : atomic spectroscopy |
53 |
49 |
UA library record; WoS full record; WoS citing articles |
|
|
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Bogaerts, A.; Gijbels, R. |
Hybrid Monte-Carlo-fluid modeling network for an argon/hydrogen direct current glow discharge |
2002 |
Spectrochimica acta: part B : atomic spectroscopy |
57 |
68 |
UA library record; WoS full record; WoS citing articles |
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|
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Bogaerts, A.; Neyts, E.; Gijbels, R.; van der Mullen, J. |
Gas discharge plasmas and their applications |
2002 |
Spectrochimica acta: part B : atomic spectroscopy |
57 |
462 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Baguer, N.; Bogaerts, A.; Gijbels, R. |
Hybrid model for a cylindrical hollow cathode glow discharge and comparison with experiments |
2002 |
Spectrochimica acta: part B : atomic spectroscopy |
57 |
31 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Wilken, L.; Hoffmann, V.; Gijbels, R.; Wetzig, K. |
Comparison of modeling calculations with experimental results for rf glow discharge optical emission spectrometry |
2002 |
Spectrochimica acta: part B : atomic spectroscopy |
57 |
14 |
UA library record; WoS full record; WoS citing articles |
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|
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Bogaerts, A.; Wilken, L.; Hoffmann, V.; Gijbels, R.; Wetzig, K. |
Comparison of modeling calculations with experimental results for direct current glow discharge optical emission spectrometry |
2001 |
Spectrochimica acta: part B : atomic spectroscopy |
56 |
16 |
UA library record; WoS full record; WoS citing articles |
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|
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Bogaerts, A.; Gijbels, R. |
Description of the argon-excited levels in a radio-frequency and direct current glow discharge |
2000 |
Spectrochimica acta: part B : atomic spectroscopy |
55 |
24 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Gijbels, R. |
Behavior of the sputtered copper atoms, ions and excited species in a radio-frequency and direct current glow discharge |
2000 |
Spectrochimica acta: part B : atomic spectroscopy |
55 |
17 |
UA library record; WoS full record; WoS citing articles |
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Lenaerts, J.; Gijbels, R.; van Vaeck, L.; Verlinden, G.; Geuens, I. |
Imaging TOF-SIMS for the surface analysis of silver halide microcrystals |
2003 |
Applied surface science |
203/204 |
7 |
UA library record; WoS full record; WoS citing articles |
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de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks |
2003 |
Applied surface science |
203 |
15 |
UA library record; WoS full record; WoS citing articles |
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van Ham, R.; Adriaens, A.; van Vaeck, L.; Gijbels, R.; Adams, F. |
Molecular information in static SIMS for the speciation of inorganic compounds |
2000 |
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms |
161/163 |
19 |
UA library record; WoS full record; WoS citing articles |
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Neyts, E.; Yan, M.; Bogaerts, A.; Gijbels, R. |
PIC-MC simulation of an RF capacitively coupled Ar/H2 discharge |
2003 |
Nuclear instruments and methods in physics research: B |
202 |
8 |
UA library record; WoS full record; WoS citing articles |
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Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Adams, F. |
Capabilities and limitations of Fourier transform laser microprobe mass spectrometry for molecular analysis of solids |
2002 |
Vacuum |
69 |
4 |
UA library record; WoS full record; WoS citing articles |
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|
|
Bogaerts, A.; Gijbels, R. |
Numerical modelling of gas discharge plasmas for various applications |
2003 |
Vacuum: surface engineering, surface instrumentation & vacuum technology |
69 |
16 |
UA library record; WoS full record; WoS citing articles |
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Conard, T.; de Witte, H.; Loo, R.; Verheyen, P.; Vandervorst, W.; Caymax, M.; Gijbels, R. |
XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers |
1999 |
Thin solid films : an international journal on the science and technology of thin and thick films |
343/344 |
1 |
UA library record; WoS full record; WoS citing articles |
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Vandecasteele, C.; van Grieken, R.; Gijbels, R.; Speecke, A. |
Systematic errors in 14-MeV neutron activation analysis for oxygen : part 1 : neutron and γ-ray attenuation effects |
1973 |
Analytica chimica acta |
64 |
11 |
UA library record; WoS full record; WoS citing articles |
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Gijbels, R.; Dams, R. |
Determination of silicon in natural and pollution aerosols by 14-MeV neutron activation analysis |
1973 |
Analytica chimica acta |
63 |
16 |
UA library record; WoS full record; WoS citing articles |
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Vandecasteele, C.; van Grieken, R.; Gijbels, R.; Speecke, A. |
Systematic errors in 14-MeV neutron activation analysis for oxygen : part 2 : a general standardization method for the determination of oxygen |
1973 |
Analytica chimica acta |
65 |
12 |
UA library record; WoS full record; WoS citing articles |
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van Grieken, R.; Gijbels, R.; Speecke, A.; Hoste, J. |
Internal standard activation analysis of silicon in steel |
1968 |
Analytica chimica acta |
43 |
14 |
UA library record; WoS full record; WoS citing articles |
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van Grieken, R.; Gijbels, R.; Speecke, A.; Hoste, J. |
The determination of silicon in steel by 14-mev neutron activation analysis |
1968 |
Analytica chimica acta |
43 |
19 |
UA library record; WoS full record; WoS citing articles |
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Shazali, I.; Van 't dack, L.; Gijbels, R. |
Determination of precious metals in ores and rocks by thermal neutron activation/\gamma-spectrometry after preconcentration by nickel sulphide fire assay and coprecipitation with tellurium |
1987 |
Analytica chimica acta |
196 |
49 |
UA library record; WoS full record; WoS citing articles |
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Kalitzova, M.; Vlakhov, E.; Marinov, Y.; Gesheva, K.; Ignatova, V.A.; Lebedev, O.; Muntele, C.; Gijbels, R. |
Effect of high-frequency electromagnetic field on Te+-implanted (001) Si</tex> |
2004 |
Vacuum: the international journal and abstracting service for vacuum science and technology |
76 |
2 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Temelkov, K.A.; Vuchkov, N.K.; Gijbels, R. |
Calculation of rate constants for asymmetric charge transfer, and their effect on relative sensitivity factors in glow discharge mass spectrometry |
2007 |
Spectrochimica acta: part B : atomic spectroscopy |
62 |
28 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Gijbels, R.; Gamez, G.; Hieftje, G.M. |
Fundamental studies on a planar-cathode direct current glow discharge: part 2: numerical modeling and comparison with laser scattering experiments |
2004 |
Spectrochimica acta: part B : atomic spectroscopy |
59 |
26 |
UA library record; WoS full record; WoS citing articles |
|
|
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Bogaerts, A.; Chen, Z.; Gijbels, R.; Vertes, A. |
Laser ablation for analytical sampling: what can we learn from modeling? |
2003 |
Spectrochimica acta: part B : atomic spectroscopy |
58 |
321 |
UA library record; WoS full record; WoS citing articles |
|
|
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Neyts, E.; Bogaerts, A.; Gijbels, R.; Benedikt, J.; van de Sanden, M.C.M. |
Molecular dynamics simulation of the impact behaviour of various hydrocarbon species on DLC |
2005 |
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms |
228 |
19 |
UA library record; WoS full record; WoS citing articles |
|
|
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Neyts, E.; Bogaerts, A.; Gijbels, R.; Benedikt, J.; van den Sanden, M.C.M. |
Molecular dynamics simulations for the growth of diamond-like carbon films from low kinetic energy species |
2004 |
Diamond and related materials |
13 |
53 |
UA library record; WoS full record; WoS citing articles |
|
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Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. |
S-SIMS and MetA-SIMS study of organic additives in thin polymer coatings |
2006 |
Applied surface science |
252 |
3 |
UA library record; WoS full record; WoS citing articles |
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de Mondt, R.; Adriaensen, L.; Vangaever, F.; Lenaerts, J.; van Vaeck, L.; Gijbels, R. |
Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS) |
2006 |
Applied surface science |
252 |
9 |
UA library record; WoS full record; WoS citing articles |
|
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Ignatova, V.A.; Conard, T.; Möller, W.; Vandervorst, W.; Gijbels, R. |
Depth profiling of ZrO2/SiO2/Si stacks : a TOF-SIMS and computer simulation study |
2004 |
Applied surface science |
231/232 |
4 |
UA library record; WoS full record; WoS citing articles |
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