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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links  |
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Veldeman, E.; Van 't dack, L.; Gijbels, R.; Campbell, M.; Vanhaecke, F.; Vanhoe, H.; Vandecasteele, C. |
Analysis of thermal waters by ICP-MS |
1991 |
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UA library record |
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Hadermann, J.; Abakumov, A.M.; Van Tendeloo, G.; Shpanchenko, R.V.; Oleinikov, P.N.; Antipov, E.V. |
Anion ordering in fluorinated La2CuO4 |
1999 |
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UA library record; WoS full record; |
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Gijbels, R.; van Grieken, R. |
Application of analytical methods for trace elements in geothermal waters : part 1 : Amélie-les-Bains (Eastern Pyrenees) |
1977 |
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UA library record |
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Gijbels, R.; van Grieken, R.; Blommaert, W.; Van 't dack, L.; van Espen, P.; Nullens, H.; Saelens, R. |
Application of analytical methods for trace elements in geothermal waters : part 2 : Plombières, Bains-les-Bains, Bourbonne (Vosges) |
1983 |
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UA library record |
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Gijbels, R.; van Grieken, R.; Blommaert, W.; Vandelannoote, R.; Van 't dack, L. |
Application of trace element analysis to geothermal waters |
1977 |
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UA library record |
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Fredrickx, P.; Wouters, J.; Schryvers, D. |
The application of transmission electron microscopy (TEM) in the research of inorganic colorants in stained glass windows and parchment illustrations |
2003 |
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UA library record |
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Gijbels, R.; Oksenoid, K.G. |
Atomic mass spectrometry |
1995 |
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UA library record |
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Van Tendeloo, G.; Krekels, T.; Amelinckx, S.; Hervieu, M.; Raveau, B.; Greaves, C. |
Atomic resolution of interfaces in ceramic-superconductors |
1995 |
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UA library record |
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Pauwels, B.; Yandouzi, M.; Schryvers, D.; Van Tendeloo, G.; Verschoren, G.; Lievens, P.; Hou, M.; van Swygenhoven, H. |
Atomic scale characterization of supported and assembled nanoparticles |
2001 |
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UA library record |
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Zhurkin, E.; Hou, M.; van Swygenhoven, H.; Pauwels, B.; Yandouzi, M.; Schryvers, D.; Van Tendeloo, G.; Lievens, P.; Verschoren, G.; Kuriplach, J.; van Peteghem, S.; Segers, D.; Dauwe, C. |
Atomic scale modeling of supported and assembled nanoparticles |
2001 |
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UA library record |
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Yusupov, M. |
Atomic scale simulations for a better insight in plasma medicine |
2014 |
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UA library record |
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Marmorkos, I.K.; Schweigert, V.A.; Peeters, F.M.; Lok, J.G.S. |
Binding of remote and spatial separated D- centers in double barrier resonant tunneling semiconductor devices |
1996 |
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UA library record |
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de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. |
Capabilities of TOF-SIMS to study the influence of different oxidation conditions on metal contamination redistribution |
1999 |
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UA library record; WoS full record; |
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Biró, L.P.; Khanh, N.Q.; Horváth, Z.E.; Vértesy, Z.; Kocsonya, A.; Konya, Z.; Osváth, Z.; Koós, A.; Guylai, J.; Zhang, X.B.; Van Tendeloo, G.; Fonseca, A.; Nagy, J.B. |
Catalyst traces after chemical purification in CVD grown carbon nanotubes |
2001 |
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UA library record; WoS full record; WoS citing articles |
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Van Tendeloo, G.; De Meulenaere, P.; Hervieu, M.; Letouze, F.; Martin, C. |
Cation ordering in Tl- and Hg-based superconducting materials |
1996 |
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UA library record |
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Komendová, L. |
Characteristic length scales and vortex interactions in two-component superconducting systems |
2013 |
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UA library record |
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d' Hondt, H. |
Characterization of anion deficient perovskites |
2011 |
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UA library record |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
1991 |
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UA library record |
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Kirilenko, D. |
Characterization of graphene by electron diffraction |
2012 |
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UA library record |
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Wiktor, C. |
Characterization of metal-organic frameworks and other porous materials via advanced transmission electron microscopy |
2014 |
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UA library record |
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Leroux, F. |
Characterization of soft-hard matter composite materials by advanced transmission electron microscopy |
2012 |
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UA library record |
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van Landuyt, J.; Van Tendeloo, G. |
Charcaterization by high-resolution transmission electron microscopy |
1998 |
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UA library record; WoS full record; |
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Hervieu, M.; Martin, C.; Van Tendeloo, G.; Mercey, B.; Maignan, A.; Jirak, Z.; Raveau, B. |
Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties |
2000 |
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UA library record |
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Koenraad, P.M.; Shi, J.M.; van de Stadt, A.F.W.; Smets, A.; Perenboom, J.A.A.J.; Peeters, F.M.; Devreese, J.T.; Wolter, J.H. |
Charged-impurity correlations in a δ-doped quantum barrier |
1996 |
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UA library record |
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Shi, J.M.; Koenraad, P.M.; van de Stadt, A.F.W.; Peeters, F.M.; Devreese, J.T.; Wolter, J.H. |
Charged-impurity correlations in Si ?-doped GaAs |
1996 |
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UA library record |
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De Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. |
Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy |
2002 |
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UA library record; WoS full record; |
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Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
The chemical characterization of silver halide microcrystals |
1993 |
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UA library record |
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Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling |
2000 |
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UA library record |
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Peeters, F.M.; Partoens, B.; Kong, M. |
The classical electron gas in artificial structures |
2004 |
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UA library record |
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van Dijk, J.; Kroesen, G.M.W.; Bogaerts, A. |
Cluster issue on plasma modelling |
2009 |
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UA library record |
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