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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
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Contino, A.; Ciofi, I.; Wu, X.; Asselberghs, I.; Celano, U.; Wilson, C.J.; Tokei, Z.; Groeseneken, G.; Sorée, B. |
Modeling of edge scattering in graphene interconnects |
2018 |
IEEE electron device letters |
39 |
1 |
UA library record; WoS full record; WoS citing articles |
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Clima, S.; Chen, Y.Y.; Fantini, A.; Goux, L.; Degraeve, R.; Govoreanu, B.; Pourtois, G.; Jurczak, M. |
Intrinsic tailing of resistive states distributions in amorphous <tex>HfOx </tex> and TaOx based resistive random access memories |
2015 |
IEEE electron device letters |
36 |
33 |
UA library record; WoS full record; WoS citing articles |
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Toledano-Luque, M.; Matagne, P.; Sibaja-Hernandez, A.; Chiarella, T.; Ragnarsson, L.-A.; Sorée, B.; Cho, M.; Mocuta, A.; Thean, A. |
Superior reliability of junctionless pFinFETs by reduced oxide electric field |
2014 |
IEEE electron device letters |
35 |
13 |
UA library record; WoS full record; WoS citing articles |
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Clima, S.; Kaczer, B.; Govoreanu, B.; Popovici, M.; Swerts, J.; Verhulst, A.S.; Jurczak, M.; De Gendt, S.; Pourtois, G. |
Determination of ultimate leakage through rutile TiO2 and tetragonal ZrO2 from ab initio complex band calculations |
2013 |
IEEE electron device letters |
34 |
3 |
UA library record; WoS full record; WoS citing articles |
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Katti, G.; Stucchi, M.; Velenis, D.; Sorée, B.; de Meyer, K.; Dehaene, W. |
Temperature-dependent modeling and characterization of through-silicon via capacitance |
2011 |
IEEE electron device letters |
32 |
27 |
UA library record; WoS full record; WoS citing articles |
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Demirtas, M.; Odaci, C.; Perkgoz, N.K.; Sevik, C.; Ay, F. |
Low Loss Atomic Layer Deposited Al2O3 Waveguides for Applications in On-Chip Optical Amplifiers |
2018 |
IEEE journal of selected topics in quantum electronics |
24 |
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UA library record; WoS full record; WoS citing articles |
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Koirala, B.; Rasti, B.; Bnoulkacem, Z.; de Lima Ribeiro, A.; Madriz, Y.; Herrmann, E.; Gestels, A.; De Kerf, T.; Lorenz, S.; Fuchs, M.; Janssens, K.; Steenackers, G.; Gloaguen, R.; Scheunders, P. |
A multisensor hyperspectral benchmark dataset for unmixing of intimate mixtures |
2024 |
IEEE sensors journal |
24 |
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UA library record |
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Yagmurcukardes, N.; Bayram, A.; Aydin, H.; Yagmurcukardes, M.; Acikbas, Y.; Peeters, F.M.; Celebi, C. |
Anisotropic etching of CVD grown graphene for ammonia sensing |
2022 |
IEEE sensors journal |
22 |
2 |
UA library record; WoS full record; WoS citing articles |
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Borkowski, R.; Straub, M.; Ou, Y.; Lefevre, Y.; Jelić, Ž.L.; Lanneer, W.; Kaneda, N.; Mahadevan, A.; Hueckstaedt, V.; van Veen, D.; Houtsma, V.; Coomans, W.; Bonk, R.; Maes, J. |
FLCS-PON : a 100 Gbit/s flexible passive optical network: concepts and field trial |
2021 |
Journal Of Lightwave Technology |
39 |
|
UA library record; WoS full record; WoS citing articles |
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Tokei, Z.; Lanckmans, F.; van den Bosch, G.; Van Hove, M.; Maex, K.; Bender, H.; Hens, S.; van Landuyt, J. |
Reliability of copper dual damascene influenced by pre-clean |
2002 |
Analysis Of Integrated Circuits |
|
5 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
High resolution electron microscopy from imaging towards measuring |
2001 |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
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UA library record |
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Reyntjens, P.; Van de Put, M.; Vandenberghe, W.G.; Sorée, B. |
Ultrascaled graphene-capped interconnects : a quantum mechanical study |
2023 |
Proceedings of the IEEE ... International Interconnect Technology Conference
T2 – IEEE International Interconnect Technology Conference (IITC) / IEEE, Materials for Advanced Metallization Conference (MAM), MAY 22-25, 2023, Dresden, Germany |
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UA library record; WoS full record |
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Adelmann, C.; Sankaran, K.; Dutta, S.; Gupta, A.; Kundu, S.; Jamieson, G.; Moors, K.; Pinna, N.; Ciofi, I.; Van Elshocht, S.; Bommels, J.; Boccardi, G.; Wilson, C.J.; Pourtois, G.; Tokei, Z. |
Alternative Metals: from ab initio Screening to Calibrated Narrow Line Models |
2018 |
Proceedings of the IEEE ... International Interconnect Technology Conference
T2 – IEEE International Interconnect Technology Conference (IITC), JUN 04-07, 2018, Santa Clara, CA |
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UA library record; WoS full record; WoS citing articles |
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Koirala, B.; Rasti, B.; Bnoulkacem, Z.; De Lima Ribeiro, A.; Madriz, Y.; Herrmann, E.; Gestels, A.; De Kerf, T.; Janssens, K.; Steenackers, G.; Gloaguen, R.; Scheunders, P. |
An extensive multisensor hyperspectral benchmark datasets of intimate mixtures of mineral powders |
2023 |
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UA library record |
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Clima, S.; O'Sullivan, B.J.; Ronchi, N.; Bardon, M.G.; Banerjee, K.; Van den Bosch, G.; Pourtois, G.; van Houdt, J. |
Ferroelectric switching in FEFET : physics of the atomic mechanism and switching dynamics in HfZrOx, HfO2 with oxygen vacancies and Si dopants |
2020 |
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UA library record; WoS full record; WoS citing articles |
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Lujan, G.S.; Magnus, W.; Soree, B.; Pourghaderi, M.A.; Veloso, A.; van Dal, M.J.H.; Lauwers, A.; Kubicek, S.; De Gendt, S.; Heyns, M.; De Meyer, K.; |
A new method to calculate leakage current and its applications for sub-45nm MOSFETs |
2005 |
Solid-State Device Research (ESSDERC), European Conference
T2 – ESSDERC 2005 : proceedings of 35th European Solid-State Device Research Conference, September 12-16, 2005, Grenoble, France |
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UA library record; WoS full record |
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Bizindavyi, J.; Verhulst, A.S.; Sorée, B.; Groeseneken, G. |
Impact of calibrated band-tails on the subthreshold swing of pocketed TFETs |
2018 |
Conference digest
T2 – 76th Device Research Conference (DRC), JUN 24-27, 2018, Santa Barbara, CA |
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UA library record; WoS full record |
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Reijniers, J.; Partoens, B.; Steckel, J.; Peremans, H. |
HRTF measurement by means of unsupervised head movements with respect to a single fixed speaker |
2020 |
Ieee Access |
8 |
4 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Gijbels, R. |
Monte Carlo model for the argon ions and fast argon atoms in a radio-frequency discharge |
1999 |
IEEE transactions on plasma science |
27 |
15 |
UA library record; WoS full record; WoS citing articles |
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Berezhnoi, S.; Kaganovich, I.; Misina, M.; Bogaerts, A.; Gijbels, R. |
Semianalytical description of nonlocal secondary electrons in a radio-frequency capacitively coupled plasma at intermediate pressures |
1999 |
IEEE transactions plasma science |
27 |
7 |
UA library record; WoS full record; WoS citing articles |
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Simionovici, A.S.; Chukalina, M.; Schroer, C.; Drakopoulos, M.; Snigirev, A.; Snigireva, I.; Lengeler, B.; Janssens, K.; Adams, F. |
High-resolution X-ray fluorescence microtomography of homogeneous samples |
2000 |
IEEE transactions on nuclear science |
47 |
|
UA library record; WoS full record; WoS citing articles |
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Hadermann, J.; Abakumov, A.M. |
Structure solution and refinement of metal-ion battery cathode materials using electron diffraction tomography |
2019 |
And Materials |
75 |
2 |
UA library record; WoS full record; WoS citing articles |
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de Nolf, W.; Vanmeert, F.; Janssens, K. |
XRDUA : crystalline phase distribution maps by two-dimensional scanning and tomographic (micro) X-ray powder diffraction |
2014 |
Journal of applied crystallography |
47 |
62 |
UA library record; WoS full record; WoS citing articles |
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Arakcheeva, A.; Pattison, P.; Chapuis, G.; Rossell, M.; Filaretov, A.; Morozov, V.; Van Tendeloo, G. |
KSm(MoO4)2, an incommensurately modulated and partially disordered scheelite-like structure |
2008 |
Acta crystallographica: section B: structural science |
64 |
23 |
UA library record; WoS full record; WoS citing articles |
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Tirry, W.; Schryvers, D.; Jorissen, K.; Lamoen, D. |
Electron-diffraction structure refinement of Ni4Ti3 precipitates in Ni52Ti48 |
2006 |
Acta crystallographica: section B: structural science |
62 |
30 |
UA library record; WoS full record; WoS citing articles |
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Abakumov, A.M.; Shpanchenko, R.V.; Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S.; Antipov, E.V. |
The phase transition and crystal structures of Ba3RM2O7.5 complex oxides (R=rare-earth elements, M = Al,Ga) |
1999 |
Acta crystallographica: section A: foundations of crystallography |
55 |
7 |
UA library record; WoS full record; WoS citing articles |
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Richard, O.; Schuddinck, W.; Van Tendeloo, G.; Millange, F.; Hervieu, M.; Caignaert, C.; Raveau, B. |
Room temperature and low-temperature structure of Nd1-xCaxMnO3 (0.3*x*0.5) |
1999 |
Acta crystallographica: section A: foundations of crystallography |
55 |
24 |
UA library record; WoS full record; WoS citing articles |
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Michel, K.H.; Lamoen, D.; David, W.I.F. |
Orientational order and disorder in solid C60 : theory and diffraction experiments |
1995 |
Acta crystallographica: section A: foundations of crystallography |
51 |
14 |
UA library record; WoS full record; WoS citing articles |
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Milat, O.; Van Tendeloo, G.; Amelinckx, S.; Mehbod, M.; Deltour, R. |
The incommensurate structure of (Sr, Ca)14Cu24O41: a study by electron diffraction and high-resolution microscopy |
1992 |
Acta crystallographica |
A48 |
22 |
UA library record; WoS full record; WoS citing articles |
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Schowalter, M.; Rosenauer, A.; Titantah, J.T.; Lamoen, D. |
Temperature-dependent Debye-Waller factors for semiconductors with the wurtzite-type structure |
2009 |
Acta crystallographica: section A: foundations of crystallography |
65 |
23 |
UA library record; WoS full record; WoS citing articles |
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