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Records |
Links |
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Author |
Schryvers, D.; Seo, J.W.; Richard, O.; Vermeulen, W.; Potapov, P. |
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| |
Title |
Decomposition phenomena in Ni-Mn-Ti austenite |
Type  |
H1 Book chapter |
| |
Year |
1999 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
887-892 |
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Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT) |
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Place of Publication |
s.l. |
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Language |
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Wos |
000086479100194 |
Publication Date |
0000-00-00 |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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Additional Links |
UA library record; WoS full record; |
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Impact Factor |
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Times cited |
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Open Access |
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| |
Notes |
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Approved |
Most recent IF: NA |
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| |
Call Number |
UA @ lucian @ c:irua:48372 |
Serial |
609 |
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| Permanent link to this record |
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Author |
Lisiecki, I.; Turner, S.; Bals, S.; Pileni, M.P.; Van Tendeloo, G. |
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| |
Title |
Enhanced stability against oxidation due to 2D self-organisation of hcp cobalt nanocrystals |
Type |
H1 Book chapter |
| |
Year |
2008 |
Publication |
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Abbreviated Journal |
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| |
Volume |
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Issue |
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Pages |
273-274 |
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Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
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Series Editor |
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Series Title |
|
Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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| |
ISSN |
|
ISBN |
978-3-540-85226-1 |
Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
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| |
Call Number |
UA @ lucian @ c:irua:87610 |
Serial |
1055 |
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| Permanent link to this record |
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Author |
Schryvers, D.; Van Aert, S. |
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| |
Title |
High-resolution visualization techniques : structural aspects |
Type |
H1 Book chapter |
| |
Year |
2012 |
Publication |
|
Abbreviated Journal |
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| |
Volume |
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Issue |
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Pages |
135-149 |
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Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
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Series Editor |
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Series Title |
|
Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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| |
ISSN |
|
ISBN |
978-3-642-20942-0 |
Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
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| |
Call Number |
UA @ lucian @ c:irua:94124 |
Serial |
1464 |
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| Permanent link to this record |
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Author |
Van Tendeloo, G.; Lebedev, O.I.; Verbist, K.; Abakumov, A.M.; Shpanchenko, R.V.; Antipov, E.V.; Blank, D.H.A. |
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| |
Title |
The local structure of YBCO based materials by TEM |
Type |
H1 Book chapter |
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Year |
1999 |
Publication |
|
Abbreviated Journal |
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Volume |
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Issue |
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Pages |
11-19 |
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Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Kluwer Academic |
Place of Publication |
Dordrecht |
Editor |
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| |
Language |
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Wos |
000079308200002 |
Publication Date |
0000-00-00 |
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| |
Series Editor |
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Series Title |
|
Abbreviated Series Title |
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| |
Series Volume |
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Series Issue |
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Edition |
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| |
ISSN |
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ISBN |
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Additional Links |
UA library record; WoS full record; |
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Impact Factor |
|
Times cited |
|
Open Access |
|
|
| |
Notes |
|
Approved |
Most recent IF: NA |
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| |
Call Number |
UA @ lucian @ c:irua:29709 |
Serial |
1833 |
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| Permanent link to this record |
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| |
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Author |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
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| |
Title |
Statistical experimental design for quantitative atomic resolution transmission electron microscopy |
Type |
H1 Book chapter |
| |
Year |
2004 |
Publication |
|
Abbreviated Journal |
Adv Imag Elect Phys |
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| |
Volume |
|
Issue |
|
Pages |
1-164 |
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| |
Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Academic Press |
Place of Publication |
San Diego, Calif. |
Editor |
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| |
Language |
|
Wos |
000223226700001 |
Publication Date |
2011-01-05 |
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Series Editor |
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Series Title |
|
Abbreviated Series Title |
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| |
Series Volume |
|
Series Issue |
|
Edition |
|
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| |
ISSN |
1076-5670; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
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| |
Impact Factor |
|
Times cited |
13 |
Open Access |
|
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| |
Notes |
|
Approved |
Most recent IF: NA |
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| |
Call Number |
UA @ lucian @ c:irua:47513 |
Serial |
3156 |
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| Permanent link to this record |
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| |
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Author |
Van Aert, S. |
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| |
Title |
Statistical parameter estimation theory : a tool for quantitative electron microscopy |
Type |
H1 Book chapter |
| |
Year |
2012 |
Publication |
|
Abbreviated Journal |
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| |
Volume |
|
Issue |
|
Pages |
281-309 |
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| |
Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Wiley-VCH |
Place of Publication |
Weinheim |
Editor |
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| |
Language |
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Wos |
|
Publication Date |
0000-00-00 |
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| |
Series Editor |
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Series Title |
|
Abbreviated Series Title |
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| |
Series Volume |
|
Series Issue |
|
Edition |
|
|
| |
ISSN |
|
ISBN |
978-3-527-31706-6 |
Additional Links |
UA library record |
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Impact Factor |
|
Times cited |
|
Open Access |
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| |
Notes |
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Approved |
Most recent IF: NA |
|
| |
Call Number |
UA @ lucian @ c:irua:96693 |
Serial |
3159 |
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| Permanent link to this record |
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Author |
Van Tendeloo, G. |
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| |
Title |
TEM characterization of structural defects |
Type |
H1 Book chapter |
| |
Year |
1996 |
Publication |
|
Abbreviated Journal |
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| |
Volume |
|
Issue |
|
Pages |
473-507 |
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Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Plenum Press |
Place of Publication |
New York |
Editor |
|
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| |
Language |
|
Wos |
A1996BF84E00042 |
Publication Date |
0000-00-00 |
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| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
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| |
Series Volume |
|
Series Issue |
|
Edition |
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|
| |
ISSN |
|
ISBN |
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Additional Links |
UA library record; WoS full record; |
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| |
Impact Factor |
|
Times cited |
|
Open Access |
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|
| |
Notes |
|
Approved |
no |
|
| |
Call Number |
UA @ lucian @ c:irua:16865 |
Serial |
3477 |
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| Permanent link to this record |
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| |
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Author |
Goessens, C.; Schryvers, D.; van Landuyt, J.; Geuens, I.; Gijbels, R.; Jacob, W.; de Keyzer, R. |
|
| |
Title |
A temperature study of mixed AgBr-AgBrI tabular crystals |
Type |
H1 Book chapter |
| |
Year |
1995 |
Publication |
|
Abbreviated Journal |
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| |
Volume |
|
Issue |
|
Pages |
70-76 |
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| |
Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT); Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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| |
Abstract |
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| |
Address |
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Corporate Author |
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Thesis |
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| |
Publisher |
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Place of Publication |
Hawaii |
Editor |
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| |
Language |
|
Wos |
A1995RY19900011 |
Publication Date |
0000-00-00 |
|
| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
39 |
Series Issue |
1 |
Edition |
|
|
| |
ISSN |
|
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
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| |
Impact Factor |
|
Times cited |
3 |
Open Access |
|
|
| |
Notes |
|
Approved |
PHYSICS, APPLIED 47/145 Q2 # |
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| |
Call Number |
UA @ lucian @ c:irua:8459 |
Serial |
3501 |
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| Permanent link to this record |
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| |
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Author |
Croitoru, M.D.; Shanenko, A.A.; Peeters, F.M. |
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| |
Title |
Tuning the superconducting properties of nanomaterials |
Type |
H1 Book chapter |
| |
Year |
2009 |
Publication |
|
Abbreviated Journal |
|
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| |
Volume |
|
Issue |
|
Pages |
1-14 |
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| |
Keywords |
H1 Book chapter; Condensed Matter Theory (CMT); Electron microscopy for materials research (EMAT) |
|
| |
Abstract |
Electron continement and its effect on the superconducting-to-normal phase transition driven by a magentic field and/or a current is studied in nanowires. Our investigation is based on a self-consistent numerical solution of the Bogoliubov-de Gennes equations. We find that in a parallel magneitc field and/or in the presence of a supercurrent the transition from the superconducting to the normal phase occurs as a cascade of discontinuous jumps in the superconducting order parameter for diameters D < 10 divided by 15 nm at T = 0. The critical magentic field exhibits quantum-size oscillations with pronounced resonant enhancements as a function of the wire radius. |
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| |
Address |
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Corporate Author |
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Thesis |
|
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| |
Publisher |
Springer |
Place of Publication |
Dordrecht |
Editor |
|
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| |
Language |
|
Wos |
000274282900001 |
Publication Date |
2009-07-29 |
|
| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
|
Series Issue |
|
Edition |
|
|
| |
ISSN |
1874-6500; |
ISBN |
978-90-481-3118-1 |
Additional Links |
UA library record; WoS full record |
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| |
Impact Factor |
|
Times cited |
|
Open Access |
|
|
| |
Notes |
|
Approved |
Most recent IF: NA |
|
| |
Call Number |
UA @ lucian @ c:irua:99226 |
Serial |
3761 |
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| Permanent link to this record |
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| |
|
Author |
Lubk, A.; Vogel, K.; Wolf, D.; Krehl, J.; Röder, F.; Clark, L.; Guzzinati, G.; Verbeeck, J. |
|
| |
Title |
Fundamentals of Focal Series Inline Electron Holography |
Type |
H1 Book chapter |
| |
Year |
2016 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics / Hawkes, P.W. [edit.] |
Abbreviated Journal |
|
|
| |
Volume |
|
Issue |
|
Pages |
105-147 |
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| |
Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT) |
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Abstract |
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| |
Address |
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Corporate Author |
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Thesis |
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Publisher |
Elsevier BV |
Place of Publication |
|
Editor |
|
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| |
Language |
|
Wos |
|
Publication Date |
2016-09-24 |
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| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
|
Series Issue |
|
Edition |
|
|
| |
ISSN |
1076-5670; http://id.crossref.org/isbn/9780128048115 |
ISBN |
9780128048115 |
Additional Links |
UA library record |
|
| |
Impact Factor |
|
Times cited |
|
Open Access |
|
|
| |
Notes |
L.C., G.G., and J.V. acknowledge funding from the European Research Council under the 7th Framework Program (FP7), ERC Starting Grant no. 278510 VORTEX. A.L., K.V., J. K., D.W., and F.R. acknowledge funding from the DIP of the Deutsche Forschungsgesellschaft.; ECASJO_; |
Approved |
Most recent IF: NA |
|
| |
Call Number |
EMAT @ emat @ c:irua:140097UA @ admin @ c:irua:140097 |
Serial |
4419 |
|
| Permanent link to this record |
| |
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| |
|
Author |
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. |
|
| |
Title |
The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data |
Type |
H1 Book chapter |
| |
Year |
2008 |
Publication |
|
Abbreviated Journal |
|
|
| |
Volume |
|
Issue |
|
Pages |
97-98 |
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| |
Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
|
| |
Abstract |
|
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| |
Address |
|
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| |
Corporate Author |
|
Thesis |
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| |
Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
|
|
| |
Language |
|
Wos |
|
Publication Date |
2009-03-17 |
|
| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
|
Series Issue |
|
Edition |
|
|
| |
ISSN |
|
ISBN |
978-3-540-85154-7 |
Additional Links |
UA library record |
|
| |
Impact Factor |
|
Times cited |
|
Open Access |
|
|
| |
Notes |
|
Approved |
Most recent IF: NA |
|
| |
Call Number |
UA @ lucian @ c:irua:136865 |
Serial |
4493 |
|
| Permanent link to this record |
| |
|
| |
|
Author |
Idrissi, H.; Schryvers, D. |
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| |
Title |
Investigation of the elementary mechanisms controlling dislocation/twin boundary interactions in fcc metals and alloys : from conventional to advanced TEM characterization |
Type |
H2 Book chapter |
| |
Year |
2012 |
Publication |
|
Abbreviated Journal |
|
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| |
Volume |
|
Issue |
|
Pages |
1213-1224 |
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| |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT) |
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| |
Abstract |
|
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| |
Address |
|
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| |
Corporate Author |
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Thesis |
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| |
Publisher |
Formatex Research Center |
Place of Publication |
S.l. |
Editor |
|
|
| |
Language |
|
Wos |
|
Publication Date |
0000-00-00 |
|
| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
|
Series Issue |
|
Edition |
|
|
| |
ISSN |
|
ISBN |
978-84-939843-6-6 |
Additional Links |
UA library record |
|
| |
Impact Factor |
|
Times cited |
|
Open Access |
|
|
| |
Notes |
|
Approved |
Most recent IF: NA |
|
| |
Call Number |
UA @ lucian @ c:irua:104694 |
Serial |
1737 |
|
| Permanent link to this record |
| |
|
| |
|
Author |
Bals, S.; Stes, A.; Celis, V. |
|
| |
Title |
Klassieke toetsing in de praktijk |
Type |
H2 Book chapter |
| |
Year |
2009 |
Publication |
|
Abbreviated Journal |
|
|
| |
Volume |
|
Issue |
|
Pages |
211-225 |
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| |
Keywords |
H2 Book chapter; Educational sciences; EduBROn; Electron microscopy for materials research (EMAT) |
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| |
Abstract |
|
|
| |
Address |
|
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| |
Corporate Author |
|
Thesis |
|
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| |
Publisher |
LannooCampus |
Place of Publication |
Leuven |
Editor |
|
|
| |
Language |
|
Wos |
|
Publication Date |
0000-00-00 |
|
| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
|
Series Issue |
|
Edition |
|
|
| |
ISSN |
|
ISBN |
978 90 209 8819 2 |
Additional Links |
UA library record |
|
| |
Impact Factor |
|
Times cited |
|
Open Access |
|
|
| |
Notes |
|
Approved |
Most recent IF: NA |
|
| |
Call Number |
UA @ lucian @ c:irua:79658 |
Serial |
1762 |
|
| Permanent link to this record |
| |
|
| |
|
Author |
Van Tendeloo, G. |
|
| |
Title |
Art, science and sustainability = Kunst, wetenschap en duurzaamheid |
Type |
H2 Book chapter |
| |
Year |
2016 |
Publication |
|
Abbreviated Journal |
|
|
| |
Volume |
|
Issue |
|
Pages |
24-39 |
|
| |
Keywords |
H2 Book chapter; Art; Electron microscopy for materials research (EMAT) |
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| |
Abstract |
|
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| |
Address |
|
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| |
Corporate Author |
|
Thesis |
|
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| |
Publisher |
Vrienden van het M HKA |
Place of Publication |
Antwerpen |
Editor |
|
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| |
Language |
|
Wos |
|
Publication Date |
|
|
| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
|
Series Issue |
|
Edition |
|
|
| |
ISSN |
|
ISBN |
978-90-824885-0-0 |
Additional Links |
UA library record |
|
| |
Impact Factor |
|
Times cited |
|
Open Access |
|
|
| |
Notes |
|
Approved |
Most recent IF: NA |
|
| |
Call Number |
UA @ lucian @ c:irua:139519 |
Serial |
4369 |
|
| Permanent link to this record |
| |
|
| |
|
Author |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
|
| |
Title |
High resolution electron microscopy from imaging towards measuring |
Type |
H2 Book chapter |
| |
Year |
2001 |
Publication |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
Abbreviated Journal |
|
|
| |
Volume |
|
Issue |
|
Pages |
2081-2086 |
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| |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
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| |
Abstract |
|
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| |
Address |
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| |
Corporate Author |
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Thesis |
|
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| |
Publisher |
Ieee |
Place of Publication |
|
Editor |
|
|
| |
Language |
|
Wos |
|
Publication Date |
2002-11-13 |
|
| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
|
Series Issue |
|
Edition |
|
|
| |
ISSN |
|
ISBN |
0-7803-6646-8 |
Additional Links |
UA library record |
|
| |
Impact Factor |
|
Times cited |
|
Open Access |
|
|
| |
Notes |
|
Approved |
Most recent IF: NA |
|
| |
Call Number |
UA @ lucian @ c:irua:136870 |
Serial |
4501 |
|
| Permanent link to this record |
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| |
|
Author |
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
|
| |
Title |
Atom column detection |
Type |
H2 Book chapter |
| |
Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
|
|
| |
Volume |
|
Issue |
|
Pages |
177-214 |
|
| |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
|
| |
Abstract |
By combining statistical parameter estimation and model-order selection using a Bayesian framework, the maximum a posteriori (MAP) probability rule is proposed in this chapter as an objective and quantitative method to detect atom columns from high-resolution scanning transmission electron microscopy (HRSTEM) images. The validity and usefulness of this approach is demonstrated to both simulated and experimental annular dark-field (ADF) STEM images, but also to simultaneously acquired annular bright-field (ABF) and ADF STEM image data. |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
|
Publication Date |
2021-03-06 |
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| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
217 |
Series Issue |
|
Edition |
|
|
| |
ISSN |
|
ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
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| |
Impact Factor |
|
Times cited |
|
Open Access |
Not_Open_Access |
|
| |
Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
|
| |
Call Number |
UA @ admin @ c:irua:177531 |
Serial |
6775 |
|
| Permanent link to this record |
| |
|
| |
|
Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
|
| |
Title |
Atom counting |
Type |
H2 Book chapter |
| |
Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
|
|
| |
Volume |
|
Issue |
|
Pages |
91-144 |
|
| |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
|
| |
Abstract |
In this chapter, a statistical model-based method to count the number of atoms of monotype crystalline nanostructures from high-resolution annular dark-field (ADF) scanning transmission electron microscopy (STEM) images is discussed in detail together with a thorough study on the possibilities and inherent limitations. We show that this method can be applied to nanocrystals of arbitrary shape, size, and atom type. The validity of the atom-counting results is confirmed by means of detailed image simulations and it is shown that the high sensitivity of our method enables us to count atoms with single atom sensitivity. |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
|
Publication Date |
2021-03-06 |
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| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
217 |
Series Issue |
|
Edition |
|
|
| |
ISSN |
|
ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
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| |
Impact Factor |
|
Times cited |
|
Open Access |
Not_Open_Access |
|
| |
Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
|
| |
Call Number |
UA @ admin @ c:irua:177529 |
Serial |
6776 |
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| Permanent link to this record |
| |
|
| |
|
Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
|
| |
Title |
Efficient fitting algorithm |
Type |
H2 Book chapter |
| |
Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
|
|
| |
Volume |
|
Issue |
|
Pages |
73-90 |
|
| |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT) |
|
| |
Abstract |
An efficient model-based estimation algorithm is introduced to quantify the atomic column positions and intensities from atomic-resolution (scanning) transmission electron microscopy ((S)TEM) images. This algorithm uses the least squares estimator on image segments containing individual columns fully accounting for overlap between neighboring columns, enabling the analysis of a large field of view. To provide end-users with this well-established quantification method, a user friendly program, StatSTEM, is developed which is freely available under a GNU public license. In this chapter, this efficient algorithm is applied to three different nanostructures for which the analysis of a large field of view is required. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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| |
Language |
|
Wos |
|
Publication Date |
2021-03-06 |
|
| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
217 |
Series Issue |
|
Edition |
|
|
| |
ISSN |
|
ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
|
| |
Impact Factor |
|
Times cited |
|
Open Access |
Not_Open_Access |
|
| |
Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
|
| |
Call Number |
UA @ admin @ c:irua:177528 |
Serial |
6778 |
|
| Permanent link to this record |
| |
|
| |
|
Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
|
| |
Title |
General conclusions and future perspectives |
Type |
H2 Book chapter |
| |
Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
|
|
| |
Volume |
|
Issue |
|
Pages |
243-253 |
|
| |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
|
| |
Abstract |
This chapter provides an overview of statistical and quantitative methodologies that have pushed (scanning) transmission electron microscopy ((S)TEM) toward accurate and precise measurements of unknown structure parameters for understanding the relation between the structure of a material and its properties. Hereby, statistical parameter estimation theory has extensively been used which enabled not only measuring atomic column positions, but also quantifying the number of atoms, and detecting atomic columns as accurately and precisely as possible from experimental images. As a general conclusion, it can be stated that advanced statistical techniques are ideal tools to perform quantitative electron microscopy at the atomic scale. In the future, statistical methods will continue to be developed and novel quantification procedures will open up new possibilities for studying material structures at the atomic scale. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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| |
Language |
|
Wos |
|
Publication Date |
2021-03-06 |
|
| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
217 |
Series Issue |
|
Edition |
|
|
| |
ISSN |
|
ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
|
| |
Impact Factor |
|
Times cited |
|
Open Access |
Not_Open_Access |
|
| |
Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
|
| |
Call Number |
UA @ admin @ c:irua:177533 |
Serial |
6781 |
|
| Permanent link to this record |
| |
|
| |
|
Author |
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
|
| |
Title |
Image-quality evaluation and model selection with maximum a posteriori probability |
Type |
H2 Book chapter |
| |
Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
|
|
| |
Volume |
|
Issue |
|
Pages |
215-242 |
|
| |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
|
| |
Abstract |
The maximum a posteriori (MAP) probability rule for atom column detection can also be used as a tool to evaluate the relation between scanning transmission electron microscopy (STEM) image quality and atom detectability. In this chapter, a new image-quality measure is proposed that correlates well with atom detectability, namely the integrated contrast-to-noise ratio (ICNR). Furthermore, the working principle of the MAP probability rule is described in detail showing a close relation to the principles of model-selection methods. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
|
Editor |
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| |
Language |
|
Wos |
|
Publication Date |
2021-03-06 |
|
| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
217 |
Series Issue |
|
Edition |
|
|
| |
ISSN |
|
ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
|
| |
Impact Factor |
|
Times cited |
|
Open Access |
Not_Open_Access |
|
| |
Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
|
| |
Call Number |
UA @ admin @ c:irua:177532 |
Serial |
6782 |
|
| Permanent link to this record |
| |
|
| |
|
Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
|
| |
Title |
Introduction |
Type |
H2 Book chapter |
| |
Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
|
|
| |
Volume |
|
Issue |
|
Pages |
1-28 |
|
| |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT) |
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| |
Abstract |
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| |
Address |
|
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| |
Corporate Author |
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Thesis |
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| |
Publisher |
|
Place of Publication |
|
Editor |
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| |
Language |
|
Wos |
|
Publication Date |
2021-03-06 |
|
| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
217 |
Series Issue |
|
Edition |
|
|
| |
ISSN |
|
ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
|
| |
Impact Factor |
|
Times cited |
|
Open Access |
Not_Open_Access |
|
| |
Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
|
| |
Call Number |
UA @ admin @ c:irua:177525 |
Serial |
6784 |
|
| Permanent link to this record |
| |
|
| |
|
Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
|
| |
Title |
Optimal experiment design for nanoparticle atom counting from ADF STEM images |
Type |
H2 Book chapter |
| |
Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
|
|
| |
Volume |
|
Issue |
|
Pages |
145-175 |
|
| |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
|
| |
Abstract |
In this chapter, the principles of detection theory are used to quantify the probability of error for atom counting from high-resolution scanning transmission electron microscopy (HRSTEM) images. Binary and multiple hypothesis testing have been investigated in order to determine the limits to the precision with which the number of atoms in a projected atomic column can be estimated. The probability of error has been calculated when using STEM images, scattering cross-sections or peak intensities as a criterion to count atoms. Based on this analysis, we conclude that scattering cross-sections perform almost equally well as images and perform better than peak intensities. Furthermore, the optimal STEM detector design can be derived for atom counting using the expression of the probability of error. We show that for very thin objects the low-angle annular dark-field (LAADF) regime is optimal and that for thicker objects the optimal inner detector angle increases. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
|
Editor |
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| |
Language |
|
Wos |
|
Publication Date |
2021-03-06 |
|
| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
217 |
Series Issue |
|
Edition |
|
|
| |
ISSN |
|
ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
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| |
Impact Factor |
|
Times cited |
|
Open Access |
Not_Open_Access |
|
| |
Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
|
| |
Call Number |
UA @ admin @ c:irua:177530 |
Serial |
6785 |
|
| Permanent link to this record |
| |
|
| |
|
Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
|
| |
Title |
Statistical parameter estimation theory : principles and simulation studies |
Type |
H2 Book chapter |
| |
Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
|
|
| |
Volume |
|
Issue |
|
Pages |
29-72 |
|
| |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
|
| |
Abstract |
In this chapter, the principles of statistical parameter estimation theory for a quantitative analysis of atomic-resolution electron microscopy images are introduced. Within this framework, electron microscopy images are described by a parametric statistical model. Here, parametric models are introduced for different types of electron microscopy images: reconstructed exit waves, annular dark-field (ADF) scanning transmission electron microscopy (STEM) images, and simultaneously acquired ADF and annular bright-field (ABF) STEM images. Furthermore, the Cramér-Rao lower bound (CRLB) is introduced, i.e. a theoretical lower bound on the variance of any unbiased estimator. This CRLB is used to quantify the precision of the structure parameters of interest, such as the atomic column positions and the integrated atomic column intensities. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
|
Place of Publication |
|
Editor |
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| |
Language |
|
Wos |
|
Publication Date |
2021-03-06 |
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| |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
| |
Series Volume |
217 |
Series Issue |
|
Edition |
|
|
| |
ISSN |
|
ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
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| |
Impact Factor |
|
Times cited |
|
Open Access |
Not_Open_Access |
|
| |
Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
|
| |
Call Number |
UA @ admin @ c:irua:177527 |
Serial |
6788 |
|
| Permanent link to this record |
| |
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| |
|
Author |
Geuens, P.; Lebedev, O.I.; van Dyck, D.; Van Tendeloo, G. |
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| |
Title |
Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate |
Type |
H3 Book chapter |
| |
Year |
2000 |
Publication |
|
Abbreviated Journal |
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| |
Volume |
|
Issue |
|
Pages |
1133-1134 |
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| |
Keywords |
H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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| |
Publisher |
|
Place of Publication |
s.l. |
Editor |
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Language |
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Wos |
|
Publication Date |
0000-00-00 |
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Series Editor |
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Series Title |
|
Abbreviated Series Title |
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| |
Series Volume |
|
Series Issue |
|
Edition |
|
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| |
ISSN |
|
ISBN |
|
Additional Links |
UA library record |
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Impact Factor |
|
Times cited |
|
Open Access |
|
|
| |
Notes |
|
Approved |
Most recent IF: NA |
|
| |
Call Number |
UA @ lucian @ c:irua:54730 |
Serial |
49 |
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| Permanent link to this record |
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| |
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Author |
Fredrickx, P.; Wouters, J.; Schryvers, D. |
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| |
Title |
The application of transmission electron microscopy (TEM) in the research of inorganic colorants in stained glass windows and parchment illustrations |
Type |
H3 Book chapter |
| |
Year |
2003 |
Publication |
|
Abbreviated Journal |
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| |
Volume |
|
Issue |
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Pages |
137-143 |
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Keywords |
H3 Book chapter; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Archetype |
Place of Publication |
London |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
|
ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
|
Open Access |
|
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| |
Notes |
|
Approved |
Most recent IF: NA |
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| |
Call Number |
UA @ lucian @ c:irua:48779 |
Serial |
144 |
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| Permanent link to this record |
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Author |
van Landuyt, J.; Van Tendeloo, G. |
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| |
Title |
Charcaterization by high-resolution transmission electron microscopy |
Type |
H3 Book chapter |
| |
Year |
1998 |
Publication |
|
Abbreviated Journal |
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| |
Volume |
|
Issue |
|
Pages |
187-190 |
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Keywords |
H3 Book chapter; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Stt |
Place of Publication |
Den Haag |
Editor |
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Language |
|
Wos |
A1990DC39700012 |
Publication Date |
0000-00-00 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record; WoS full record; |
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Impact Factor |
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Times cited |
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Open Access |
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| |
Notes |
|
Approved |
Most recent IF: NA |
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| |
Call Number |
UA @ lucian @ c:irua:29685 |
Serial |
335 |
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| Permanent link to this record |
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| |
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Author |
Hervieu, M.; Martin, C.; Van Tendeloo, G.; Mercey, B.; Maignan, A.; Jirak, Z.; Raveau, B. |
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| |
Title |
Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties |
Type |
H3 Book chapter |
| |
Year |
2000 |
Publication |
|
Abbreviated Journal |
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| |
Volume |
|
Issue |
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Pages |
179-182 |
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Keywords |
H3 Book chapter; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
s.l. |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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| |
Series Volume |
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Series Issue |
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Edition |
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ISSN |
|
ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
|
Open Access |
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| |
Notes |
|
Approved |
Most recent IF: NA |
|
| |
Call Number |
UA @ lucian @ c:irua:54728 |
Serial |
336 |
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| Permanent link to this record |
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| |
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Author |
Raveau, B.; Hervieu, M.; Michel, C.; Martin, C.; Maignan, A.; Van Tendeloo, G. |
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| |
Title |
Crystal chemistry of mercury based layered cuprates and oxycarbonates |
Type |
H3 Book chapter |
| |
Year |
1995 |
Publication |
|
Abbreviated Journal |
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| |
Volume |
|
Issue |
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Pages |
132-149 |
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Keywords |
H3 Book chapter; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Narosa |
Place of Publication |
New Delhi |
Editor |
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Language |
|
Wos |
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Publication Date |
0000-00-00 |
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Series Editor |
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Series Title |
|
Abbreviated Series Title |
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| |
Series Volume |
|
Series Issue |
|
Edition |
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| |
ISSN |
|
ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
|
Open Access |
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|
| |
Notes |
|
Approved |
no |
|
| |
Call Number |
UA @ lucian @ c:irua:13313 |
Serial |
552 |
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| Permanent link to this record |
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| |
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Author |
Lebedev, O.; Van Tendeloo, G.; Marezio, M.; Licci, F.; Gilioli, E.; Gauzzi, A.; Prodi, A. |
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| |
Title |
The crystal structure of YSr2Cu3O6+x determined by HREM |
Type |
H3 Book chapter |
| |
Year |
2002 |
Publication |
|
Abbreviated Journal |
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| |
Volume |
|
Issue |
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Pages |
877-878 |
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Keywords |
H3 Book chapter; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
s.l. |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:54842 |
Serial |
572 |
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| Permanent link to this record |
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Author |
Colomer, J.-F.; Van Tendeloo, G. |
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Title |
Electron diffraction and microscopy of single-walled carbon nanotube bundles |
Type |
H3 Book chapter |
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Year |
2003 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
45-72 |
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Keywords |
H3 Book chapter; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Kluwer |
Place of Publication |
Boston, Mass. |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
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| |
Call Number |
UA @ lucian @ c:irua:54859 |
Serial |
916 |
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| Permanent link to this record |
