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Characterization of IASCC crack tips extracted from neutron-irradiated flux thimble tube specimens in view of a probabilistic fracture model”. Penders AG, Konstantinović, MJ, Van Renterghem W, Bosch R-W, Schryvers D, Somville F, Journal of nuclear materials 571, 154015 (2022). http://doi.org/10.1016/J.JNUCMAT.2022.154015
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Yang T (2023) Characterization of Laves phase structural evolution and regulation of its precipitation behavior in Al-Zn-Mg based alloys. ii, 106 p
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Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas”. Volkov VV, van Landuyt J, Marushkin KM, Gijbels R, Férauge C, Vasilyev MG, Shelyakin AA, Sokolovsky AA, Journal of crystal growth 173, 285 (1997)
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Wiktor C (2014) Characterization of metal-organic frameworks and other porous materials via advanced transmission electron microscopy. Antwerpen
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Characterization of MO derived nanostructured titania powders”. Ahonen PP, Kauppinen EI, Tapper U, Nenonen P, Joubert JC, Deschanvres JL, Van Tendeloo G, Electron microscopy: vol. 2 , 373 (1998)
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Characterization of nano-crystalline diamond films grown under continuous DC bias during plasma enhanced chemical vapor deposition”. Mortet V, Zhang L, Echert M, Soltani A, d' Haen J, Douheret O, Moreau M, Osswald S, Neyts E, Troadec D, Wagner P, Bogaerts A, Van Tendeloo G, Haenen K, Materials Research Society symposium proceedings (2009). http://doi.org/10.1557/PROC-1203-J05-03
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Characterization of NbC and (Nb, Ti)N nanoprecipitates in TRIP assisted multiphase steels”. Tirumalasetty GK, van Huis MA, Fang CM, Xu Q, Tichelaar FD, Hanlon DN, Sietsma J, Zandbergen HW, Acta materialia 59, 7406 (2011). http://doi.org/10.1016/j.actamat.2011.08.012
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Characterization of nickel silicides using EELS-based methods”. Verleysen E, Bender H, Richard O, Schryvers D, Vandervorst W, Journal of microscopy 240, 75 (2010). http://doi.org/10.1111/j.1365-2818.2010.03391.x
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Characterization of oxide precipitates in heavily B-doped silicon by infrared spectroscopy”. de Gryse O, Clauws P, Vanhellemont J, Lebedev OI, van Landuyt J, Simoen E, Claeys C, Journal of the electrochemical society 151, G598 (2004). http://doi.org/10.1149/1.1776592
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Characterization of silver-polymer core–shell nanoparticles using electron microscopy”. Claes N, Asapu R, Blommaerts N, Verbruggen SW, Lenaerts S, Bals S, Nanoscale 10, 9186 (2018). http://doi.org/10.1039/C7NR09517A
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Characterization of single-wall carbon nanotubes produced by CCVD method”. Colomer J-F, Benoit J-M, Stephan C, Lefrant S, Van Tendeloo G, Nagy JB, Chemical physics letters 345, 11 (2001). http://doi.org/10.1016/S0009-2614(01)00841-7
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Leroux F (2012) Characterization of soft-hard matter composite materials by advanced transmission electron microscopy. Universiteit Antwerpen, EMAT, Antwerpen
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Characterization of {111} planar defects induced in silicon by hydrogen plasma treatments”. Ghica C, Nistor LC, Bender H, Richard O, Van Tendeloo G, Ulyashin A;, Philosophical magazine 86, 5137 (2006). http://doi.org/10.1080/14786430600801443
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Charcaterization by high-resolution transmission electron microscopy”. van Landuyt J, Van Tendeloo G Stt, Den Haag, page 187 (1998).
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Charge Localization and Magnetic Correlations in the Refined Structure of U3O7”. Leinders G, Baldinozzi G, Ritter C, Saniz R, Arts I, Lamoen D, Verwerft M, Inorganic Chemistry 60, 10550 (2021). http://doi.org/10.1021/acs.inorgchem.1c01212
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Charge order, frustration relief, and spin-orbit coupling in U3O8”. Saniz R, Baldinozzi G, Arts I, Lamoen D, Leinders G, Verwerft M, Physical review materials 7, 054410 (2023). http://doi.org/10.1103/PhysRevMaterials.7.054410
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Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties”. Hervieu M, Martin C, Van Tendeloo G, Mercey B, Maignan A, Jirak Z, Raveau B s.l., page 179 (2000).
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Charge ordering-disordering in Th-doped CaMnO3”. Hervieu M, Martin C, Maignan A, Van Tendeloo G, Raveau B, European physical journal : B : condensed matter and complex systems 10, 397 (1999). http://doi.org/10.1007/s100510050869
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Charge-ordering transition in iron oxide Fe4O5 involving competing dimer and trimer formation”. Ovsyannikov SV, Bykov M, Bykova E, Kozlenko DP, Tsirlin AA, Karkin AE, Shchennikov VV, Kichanov SE, Gou H, Abakumov AM, Egoavil R, Verbeeck J, McCammon C, Dyadkin V, Chernyshov D, van Smaalen S, Dubrovinsky LS, Nature chemistry 8, 501 (2016). http://doi.org/10.1038/nchem.2478
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Charging of vitreous samples in cryogenic electron microscopy mitigated by graphene”. Zhang Y, van Schayck JP, Pedrazo-Tardajos A, Claes N, Noteborn WEM, Lu P-H, Duimel H, Dunin-Borkowski RE, Bals S, Peters PJ, Ravelli RBG, ACS nano 17, 15836 (2023). http://doi.org/10.1021/ACSNANO.3C03722
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Chemical activity of the peroxide/oxide redox couple : case study of Ba5Ru2O11 in aqueous and organic solvents”. Grimaud A, Iadecola A, Batuk D, Saubanere M, Abakumov AM, Freeland JW, Cabana J, Li H, Doublet M-L, Rousse G, Tarascon J-M, Chemistry of materials 30, 3882 (2018). http://doi.org/10.1021/ACS.CHEMMATER.8B01372
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Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy”. Hens S, van Landuyt J, Bender H, Boullart W, Vanhaelemeersch S, Materials science in semiconductor processing 4, 109 (2001). http://doi.org/10.1016/S1369-8001(00)00147-5
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Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy”. De Gryse O, Clauws P, Vanhellemont J, Lebedev O, van Landuyt J, Simoen E, Claeys C, , 183 (2002)
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Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM”. de Gryse O, Clauws P, Lebedev O, van Landuyt J, Vanhellemont J, Claeys C, Simoen E, Physica: B : condensed matter T2 –, 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY 308, 294 (2001). http://doi.org/10.1016/S0921-4526(01)00801-8
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Chemical and Structural Configuration of Pt Doped Metal Oxide Thin Films Prepared by Atomic Layer Deposition”. Ramachandran RK, Filez M, Solano E, Poelman H, Minjauw MM, Van Daele M, Feng J-Y, La Porta A, Altantzis T, Fonda E, Coati A, Garreau Y, Bals S, Marin GB, Detavernier C, Dendooven J, Chemistry of materials 31, 9673 (2019). http://doi.org/10.1021/acs.chemmater.9b03066
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Chemical cutting of perovskite nanowires into single-photon emissive low-aspect-ratio CsPbX3(X = Cl, Br, I) nanorods”. Tong Y, Fu M, Bladt E, Huang H, Richter AF, Wang K, Mueller-Buschbaum P, Bals S, Tamarat P, Lounis B, Feldmann J, Polavarapu L, Angewandte Chemie: international edition in English 57, 16094 (2018). http://doi.org/10.1002/ANIE.201810110
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Chemical insight into electroforming of resistive switching manganite heterostructures”. Borgatti F, Park C, Herpers A, Offi F, Egoavil R, Yamashita Y, Yang A, Kobata M, Kobayashi K, Verbeeck J, Panaccione G, Dittmann R;, Nanoscale 5, 3954 (2013). http://doi.org/10.1039/c3nr00106g
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Chemical solution deposition: a path towards low cost coated conductors”. Obradors X, Puig T, Pomar A, Sandiumenge F, Piñol S, Mestres N, Castaño O, Coll M, Cavallaro A, Palau A, Gázquez J, González JC, Gutiérrez J, Romá, N, Ricart S, Moretó, JM, Rossell MD, Van Tendeloo G, Superconductor science and technology 17, 1055 (2004). http://doi.org/10.1088/0953-2048/17/8/020
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Chemical stability of YBiO3 buffer layers for implementation in YBa2Cu3O7-&delta, coated conductors”. Pollefeyt G, Meledin A, Pop C, Ricart S, Hühne R, Van Tendeloo G, Van Driessche I, Acta materialia 100, 224 (2015). http://doi.org/10.1016/j.actamat.2015.08.023
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Chemical structure of nitrogen-doped graphene with single platinum atoms and atomic clusters as a platform for the PEMFC electrode”. Stambula S, Gauquelin N, Bugnet M, Gorantla S, Turner S, Sun S, Liu J, Zhang G, Sun X, Botton GA, The journal of physical chemistry: C : nanomaterials and interfaces 118, 3890 (2014). http://doi.org/10.1021/jp408979h
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