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Realization of free-standing silicene using bilayer graphene”. Neek-Amal M, Sadeghi A, Berdiyorov GR, Peeters FM, Applied physics letters 103, 261904 (2013). http://doi.org/10.1063/1.4852636
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Rearrangement of the vortex lattice due to instabilities of vortex flow”. Vodolazov DY, Peeters FM, Physical review : B : condensed matter and materials physics 76, 014521 (2007). http://doi.org/10.1103/PhysRevB.76.014521
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Recent EM investigations on nano-and micro-defect structures in SMAs”. Schryvers D, Cao S, Pourbabak, Shi H, Lu, Journal of alloys and compounds 577, S705 (2013). http://doi.org/10.1016/j.jallcom.2011.10.112
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Recent results on characterization of detonation nanodiamonds”. Vlasov II, Turner S, Van Tendeloo G, Shiryaev AA Elsevier, Amsterdam, page 291 (2012).
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Recent trends in solids mass spectrometry: GDMS and other methods”. Gijbels R, Bogaerts A, Fresenius' journal of analytical chemistry 359, 326 (1997). http://doi.org/10.1007/s002160050581
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Recent trends in solids mass spectrometry, with special emphasis on glow discharge mass spectrometry”. Gijbels R, Bogaerts A, , 71 (1996)
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Recherches microchimiques comparatives (SME et AAN) d'hydrothermes des granites de la Bulgarie du Sud”. Pentcheva EN, Swenters K, Van 't dack L, Verlinden J, Gijbels R, Doklady Bolgarskoi Akademii Nauk 37, 509 (1984)
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The reciprocal space of carbon tubes: a detailed interpretation of the electron diffraction effects”. Zhang XB, Zhang XF, Amelinckx S, Van Tendeloo G, van Landuyt J, Ultramicroscopy 54, 237 (1994). http://doi.org/10.1016/0304-3991(94)90123-6
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Reconstruction of the La0.9Sr0.1MnO3-SrTiO3 interface by quantitative high-resolution electron microscopy”. Geuens P, Lebedev OI, Van Tendeloo G, Solid state communications 116, 643 (2000). http://doi.org/10.1016/S0038-1098(00)00411-7
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Recrystallization and grain growth in a B2 iron aluminide alloy”. Samajdar I, Ratchev P, Verlinden B, Schryvers D, Intermetallics 6, 419 (1998). http://doi.org/10.1016/S0966-9795(97)00092-7
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Rectification by an imprinted phase in a Josephson junction”. Berdiyorov GR, Milošević, MV, Covaci L, Peeters FM, Physical review letters 107, 177008 (2011). http://doi.org/10.1103/PhysRevLett.107.177008
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Rectification of vortex motion in a circular ratchet channel”. Lin NS, Heitmann TW, Yu K, Plourde BLT, Misko VR, Physical review : B : condensed matter and materials physics 84, 144511 (2011). http://doi.org/10.1103/PhysRevB.84.144511
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Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam”. Montoya E, Bals S, Van Tendeloo G, Journal of microscopy 231, 359 (2008). http://doi.org/10.1111/j.1365-2818.2008.02055.x
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Reduced dimensionality in different forms of carbon”. Van Tendeloo G, Bernaerts D, Amelinckx S, Fullerenes and carbon based materials , 487 (1998)
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Reduced dimensionality in different forms of carbon”. Van Tendeloo G, Bernaerts D, Amelinckx S, Carbon 36, 487 (1998). http://doi.org/10.1016/S0008-6223(98)00050-5
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Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite”. Zelaya E, Schryvers D, Microscopy research and technique 74, 84 (2011). http://doi.org/10.1002/jemt.20877
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Reduction of composite Ag(Br,I) grains as studied by AEM and digital image analysis techniques”. Oleshko VP, Gijbels RH, Jacob WA, , 657 (1998)
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Reentrant melting of a classical two-dimensional binary cluster”. Nelissen K, Heytens L, Schweigert VA, Peeters FM, AIP conference proceedings 799, 347 (2005)
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Refinement of chemically sensitive structure factors using parallel and convergent beam electron nanodiffraction”. Müller K, Schowalter M, Rosenauer A, Jansen J, Tsuda K, Titantah JT, Lamoen D, Journal of physics : conference series 209, 012025 (2010). http://doi.org/10.1088/1742-6596/209/1/012025
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Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data”. Müller K, Schowalter M, Jansen J, Tsuda K, Titantah J, Lamoen D, Rosenauer A, Ultramicroscopy 109, 802 (2009). http://doi.org/10.1016/j.ultramic.2009.03.029
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Relation between microstructure and 2DEG properties of AlGaN/GaN structures”. van Daele B, Van Tendeloo G, Germain M, Leys M, Bougrioua Z, Moerman I, Physica status solidi: B: basic research 234, 830 (2002). http://doi.org/10.1002/1521-3951(200212)234:3<830::AID-PSSB830>3.0.CO;2-O
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Relation between structure, charge ordering and magnetotransport properties in Nd0.5Ca0.5Mn1-xCrxO3 manganites”. Schuddinck W, Van Tendeloo G, Barnabé, A, Hervieu M, Raveau B, Journal of magnetism and magnetic materials T2 –, Symposium G Material Physics Issues and Applications of Magnetic Oxides, at the E-MRS Spring Meeting, JUN 01-04, 1999, Strasbourg, France 211, 105 (2000). http://doi.org/10.1016/S0304-8853(99)00720-9
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Relative evaluation of neutron activation, X-ray fluorescence and spark source mass spectrometry for multi-element analysis of geothermal waters”. Blommaert W, Vandelannoote R, Van 't dack L, Gijbels R, van Grieken R, Journal of radioanalytical chemistry 57, 382 (1980)
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Relative sensitivity factors in glow discharge mass spectrometry: the role of charge transfer ionization”. Bogaerts A, Gijbels R, Journal of analytical atomic spectrometry 11, 841 (1996). http://doi.org/10.1039/ja9961100841
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Relative stability of negative and positive trions in model symmetric quantum wires”. Szafran B, Chwiej T, Peeters FM, Bednarek S, Adamowski J, Physical review : B : condensed matter and materials physics 71, 235305 (2005). http://doi.org/10.1103/PhysRevB.71.235305
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Relativistic virial relations for both homogeneous and spatially varying electron liquids”. Leys FE, March NH, Lamoen D, Physics And Chemistry Of Liquids 42, 423 (2004). http://doi.org/10.1080/00319100410001697873
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Relaxation phenomena at the metal-to-insulator transition in La0.8Sr0.2MnO3 single crystals”. Dominiczak M, Ruyter A, Limelette P, Monot-Laffez I, Giovannelli F, Rossell MD, Van Tendeloo G, Solid state communications 148, 340 (2008). http://doi.org/10.1016/j.ssc.2008.08.029
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Relaxor ferroelectricity and magnetoelectric coupling in ZnOCo nanocomposite thin films : beyond multiferroic composites”. Li DY, Zeng YJ, Batuk D, Pereira LMC, Ye ZZ, Fleischmann C, Menghini M, Nikitenko S, Hadermann J, Temst K, Vantomme A, Van Bael MJ, Locquet JP, Van Haesendonck C;, ACS applied materials and interfaces 6, 4737 (2014). http://doi.org/10.1021/am4053877
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Reliability of copper dual damascene influenced by pre-clean”. Tokei Z, Lanckmans F, van den Bosch G, Van Hove M, Maex K, Bender H, Hens S, van Landuyt J, Analysis Of Integrated Circuits , 118 (2002). http://doi.org/10.1109/IPFA.2002.1025629
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Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples”. Van Eyndhoven G, Batenburg KJ, van Oers C, Kurttepeli M, Bals S, Cool P, Sijbers J, (2014)
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