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High-resolution electron microscopy and electron energy-loss spectroscopy of giant palladium clusters”. Oleshko V, Volkov V, Gijbels R, Jacob W, Vargaftik M, Moiseev I, Van Tendeloo G, Zeitschrift für Physik : D : atoms, molecules and clusters 34, 283 (1995). http://doi.org/10.1007/BF01437574
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Phase transitions: an alternative for stress accommodation in CMR manganate films”. Lebedev OI, Van Tendeloo G, Zeitschrift für Metallkunde 95, 244 (2004). http://doi.org/10.3139/146.017943
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Crystal structure of the group of optical materials Ln2MeGe4O12 (Me = Ca, Mn)”. Tarakina NV, Zubkov VG, Leonidov II, Tyutunnik AP, Surat LL, Hadermann J, Van Tendeloo G, Zeitschrift für Kristallographie , 401 (2009). http://doi.org/10.1524/zksu.2009.0059
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Exit wave reconstruction from focal series of HRTEM images, single crystal XRD and total energy studies on SbxWO3+y (x\sim0.11)”. Klingstedt M, Sundberg M, Eriksson L, Haigh S, Kirkland A, Grüner D, de Backer A, Van Aert S, Tarasaki O, Zeitschrift für Kristallographie 227, 341 (2012). http://doi.org/10.1524/zkri.2012.1517
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Investigation of stacking disorder in Li2SnO3”. Tarakina NV, Denisova TA, Maksimova LG, Baklanova YV, Tyutyunnik AP, Berger IF, Zubkov VG, Van Tendeloo G, Zeitschrift für Kristallographie , 375 (2009). http://doi.org/10.1524/zksu.2009.0055
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Layered oxygen vacancy ordering in Nb-doped SrCo1-xFexO3-\delta perovskite”. Van Rompaey S, Dachraoui W, Turner S, Podyacheva OY, Tan H, Verbeeck J, Abakumov A, Hadermann J, Zeitschrift für Kristallographie 228, 28 (2013). http://doi.org/10.1524/zkri.2013.1556
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Ge40.0Te5.3I8: synthesis, crystal structure, and properties of a new clathrate-I compound”. Kovnir KA, Abramchuk NS, Zaikina JV, Baitinger M, Burkhardt U, Schnelle W, Olenev AV, Lebedev OI, Van Tendeloo G, Dikarev EV, Shevelkov AV, Zeitschrift für Kristallographie 221, 527 (2006). http://doi.org/10.1524/zkri.2006.221.5-7.527
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Crystal structure and magnetic properties of novel reduced V(IV)-based oxide Pb2V5O12”. Shpanchenko RV, Chyornaya VV, Abakumov AM, Antipov EV, Hadermann J, Van Tendeloo G, Kaul E, Geibel C, Sheptyakov D, Balagurov AM, Zeitschrift für anorganische und allgemeine Chemie 627, 2143 (2001). http://doi.org/10.1002/1521-3749(200109)627:9<2143::AID-ZAAC2143>3.0.CO;2-R
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Mg1-xRhB, a new boridometallide with 2D polyanion”. Alekseeva AM, Abakumov AM, Leithe-Jasper A, Schnelle W, Prots Y, Hadermann J, Van Tendeloo G, Antipov EV, Grin Y, Zeitschrift für anorganische und allgemeine Chemie 631, 1047 (2005). http://doi.org/10.1002/zaac.200400479
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EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments”. Fredrickx P, de Ryck I, Janssens K, Schryvers D, Petit J-P, Döcking H, X-ray spectrometry 33, 326 (2004). http://doi.org/10.1002/xrs.734
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The uptake and elimination of ZnO and CuO nanoparticles in Daphnia magna under chronic exposure scenarios”. Adam N, Leroux F, Knapen D, Bals S, Blust R, Water research 68, 249 (2015). http://doi.org/10.1016/j.watres.2014.10.001
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Defects in high-dose oxygen implanted silicon : a TEM study”. Deveirman A, van Landuyt J, Vanhellemont J, Maes HE, Yallup K, Vacuum: the international journal and abstracting service for vacuum science and technology T2 –, 1ST SIOMX WORKSHOP ( SEPARATION BY IMPLANTATION OF OXYGEN ) ( SWI-88 ), NOV 07-08, 1988, UNIV SURREY, GUILDFORD, ENGLAND 42, 367 (1991). http://doi.org/10.1016/0042-207X(91)90055-N
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3D imaging of nanomaterials by discrete tomography”. Batenburg KJ, Bals S, Sijbers J, Kübel C, Midgley PA, Hernandez JC, Kaiser U, Encina ER, Coronado EA, Van Tendeloo G, Ultramicroscopy 109, 730 (2009). http://doi.org/10.1016/j.ultramic.2009.01.009
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Accuracy and precision in model based EELS quantification”. Bertoni G, Verbeeck J, Ultramicroscopy 108, 782 (2008). http://doi.org/10.1016/j.ultramic.2008.01.004
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Accurate segmentation of dense nanoparticles by partially discrete electron tomography”. Roelandts T, Batenburg KJ, Biermans E, Kübel C, Bals S, Sijbers J, Ultramicroscopy 114, 96 (2012). http://doi.org/10.1016/j.ultramic.2011.12.003
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Acquisition of the EELS data cube by tomographic reconstruction”. van den Broek W, Verbeeck J, de Backer S, Scheunders P, Schryvers D, Ultramicroscopy 106, 269 (2006). http://doi.org/10.1016/j.ultramic.2005.09.001
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Advanced reconstruction algorithms for electron tomography : from comparison to combination”. Goris B, Roelandts T, Batenburg KJ, Heidari Mezerji H, Bals S, Ultramicroscopy 127, 40 (2013). http://doi.org/10.1016/j.ultramic.2012.07.003
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An alternative approach to determine attainable resolution directly from HREM images”. Wang A, Turner S, Van Aert S, van Dyck D, Ultramicroscopy 133, 50 (2013). http://doi.org/10.1016/j.ultramic.2013.05.008
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Applying an information transmission approach to extract valence electron information from reconstructed exit waves”. Xu Q, Zandbergen HW, van Dyck D, Ultramicroscopy 111, 912 (2011). http://doi.org/10.1016/j.ultramic.2011.01.032
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Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations”. de Backer A, Martinez GT, Rosenauer A, Van Aert S, Ultramicroscopy 134, 23 (2013). http://doi.org/10.1016/j.ultramic.2013.05.003
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Atomic resolution mapping of phonon excitations in STEM-EELS experiments”. Egoavil R, Gauquelin N, Martinez GT, Van Aert S, Van Tendeloo G, Verbeeck J, Ultramicroscopy 147, 1 (2014). http://doi.org/10.1016/j.ultramic.2014.04.011
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Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging”. Chen JH, van Dyck D, op de Beeck M, van Landuyt J, Ultramicroscopy 69, 219 (1997)
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Correction of non-linear thickness effects in HAADF STEM electron tomography”. van den Broek W, Rosenauer A, Goris B, Martinez GT, Bals S, Van Aert S, van Dyck D, Ultramicroscopy 116, 8 (2012). http://doi.org/10.1016/j.ultramic.2012.03.005
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Creating arrays of electron vortices”. Niermann T, Verbeeck J, Lehmann M, Ultramicroscopy 136, 165 (2014). http://doi.org/10.1016/j.ultramic.2013.10.002
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Deconvolution of core electron energy loss spectra”. Verbeeck J, Bertoni G, Ultramicroscopy 109, 1343 (2009). http://doi.org/10.1016/j.ultramic.2009.06.010
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Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography”. Kruse P, Schowalter M, Lamoen D, Rosenauer A, Gerthsen D, Ultramicroscopy 106, 105 (2006). http://doi.org/10.1016/j.ultramic.2005.06.057
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Direct space structure solution from precession electron diffraction data: resolving heavy and light scatterers in Pb13Mn9O25”. Hadermann J, Abakumov AM, Tsirlin AA, Filonenko VP, Gonnissen J, Tan H, Verbeeck J, Gemmi M, Antipov EV, Rosner H, Ultramicroscopy 110, 881 (2010). http://doi.org/10.1016/j.ultramic.2010.03.012
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Direct structure inversion from exit waves: part 1: theory and simulations”. Wang A, Chen FR, Van Aert S, van Dyck D, Ultramicroscopy 110, 527 (2010). http://doi.org/10.1016/j.ultramic.2009.11.024
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Direct structure inversion from exit waves : part 2 : a practical example”. Wang A, Chen FR, Van Aert S, van Dyck D, Ultramicroscopy 116, 77 (2012). http://doi.org/10.1016/j.ultramic.2012.03.011
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Does a monochromator improve the precision in quantitative HRTEM?”.den Dekker AJ, Van Aert S, van Dyck D, van den Bos A, Geuens P, Ultramicroscopy 89, 275 (2001). http://doi.org/10.1016/S0304-3991(01)00089-4
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