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Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy”. Cooper D, Denneulin T, Barnes J-P, Hartmann J-M, Hutin L, Le Royer C, Béché, A, Rouvière J-L, Applied Physics Letters 112, 124505 (2012). http://doi.org/10.1063/1.4767925
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Improved strain precision with high spatial resolution using nanobeam precession electron diffraction”. Rouvière J-L, Béché, A, Martin Y, Denneulin T, Cooper D, Applied physics letters 103, 241913 (2013). http://doi.org/10.1063/1.4829154
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Thermal characterization of polycrystalline diamond thin film heat spreaders grown on GaN HEMTs”. Zhou Y, Ramaneti R, Anaya J, Korneychuk S, Derluyn J, Sun H, Pomeroy J, Verbeeck J, Haenen K, Kuball M, Applied physics letters 111, 041901 (2017). http://doi.org/10.1063/1.4995407
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Spectroscopic coincidence experiments in transmission electron microscopy”. Jannis D, Müller-Caspary K, Béché, A, Oelsner A, Verbeeck J, Applied physics letters 114, 143101 (2019). http://doi.org/10.1063/1.5092945
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Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping”. Guzzinati G, Ghielens W, Mahr C, Béché, A, Rosenauer A, Calders T, Verbeeck J, Applied physics letters 114, 243501 (2019). http://doi.org/10.1063/1.5096245
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Metal-insulator transition of SrVO 3 ultrathin films embedded in SrVO 3 / SrTiO 3 superlattices”. Wang J, Gauquelin N, Huijben M, Verbeeck J, Rijnders G, Koster G, Applied Physics Letters 117, 133105 (2020). http://doi.org/10.1063/5.0020615
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Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science”. Gao C, Hofer C, Jannis D, Béché, A, Verbeeck J, Pennycook TJ, Applied physics letters 121, 081906 (2022). http://doi.org/10.1063/5.0101895
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Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope”. Jannis D, Müller-Caspary K, Béché, A, Verbeeck J, Applied Sciences-Basel 11, 9058 (2021). http://doi.org/10.3390/app11199058
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Photoelectric and electrical responses of several erbium silicide/silicon interfaces”. Muret P, Nguyen TTA, Frangis N, Van Tendeloo G, van Landuyt J, Applied surface science T2 –, International Symposium on Si Heterostructures –, From Physics to Devices, SEP 11-14, 1995, IRAKLION, GREECE 102, 173 (1996). http://doi.org/10.1016/0169-4332(96)00042-6
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Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry”. Vanhellemont J, Maes HE, Schaekers M, Armigliato A, Cerva H, Cullis A, de Sande J, Dinges H, Hallais J, Nayar V, Pickering C, Stehlé, JL, Van Landuyt J, Walker C, Werner H, Salieri P;, Applied surface science T2 –, SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE 63, 45 (1993). http://doi.org/10.1016/0169-4332(93)90062-G
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Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate”. Frangis N, Van Tendeloo G, van Landuyt J, Muret P, Nguyen TTA, Applied surface science 102, 163 (1996). http://doi.org/10.1016/0169-4332(96)00040-2
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High crystalline quality erbium silicide films on (100) silicon grown in high vacuum”. Kaltsas G, Travlos A, Nassiopoulos AG, Frangis N, van Landuyt J, Applied surface science 102, 151 (1996). http://doi.org/10.1016/0169-4332(96)00036-0
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The microstructure and interfaces of intermediate layers in sapphire bicrystals”. Vasiliev AL, Stepantsov EA, Ivanov ZG, Verbist K, Van Tendeloo G, Olsson E, Applied surface science 119, 215 (1997)
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Investigating the effect of sulphurization on volatility of compositions in Cu-poor and Sn-rich CZTS thin films”. Vishwakarma M, Agrawal K, Hadermann J, Mehta BR, Applied Surface Science 507, 145043 (2020). http://doi.org/10.1016/J.APSUSC.2019.145043
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Synthesis &ndash, properties correlation and the unexpected role of the titania support on the Grignard surface modification”. Van Dijck JG, Mampuys P, Ching HYV, Krishnan D, Baert K, Hauffman T, Verbeeck J, Van Doorslaer S, Maes BUW, Dorbec M, Buekenhoudt A, Meynen V, Applied Surface Science 527, 146851 (2020). http://doi.org/10.1016/J.APSUSC.2020.146851
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Impact of ordering on the reactivity of mixed crystals of topological insulators with anion substitution: Bi₂SeTe₂, and Sb₂SeTe₂”. Volykhov AA, Frolov AS, Neudachina VS, Vladimirova NV, Gerber E, Callaert C, Hadermann J, Khmelevsky NO, Knop-Gericke A, Sanchez-Barriga J, Yashina LV, Applied Surface Science 541, 148490 (2021). http://doi.org/10.1016/J.APSUSC.2020.148490
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Directly revealing the structure-property correlation in Na+-doped cathode materials”. Li C-F, Chen L-D, Wu L, Liu Y, Hu Z-Y, Cui W-J, Dong W-D, Liu X, Yu W-B, Li Y, Van Tendeloo G, Su B-L, Applied surface science 612, 155810 (2023). http://doi.org/10.1016/J.APSUSC.2022.155810
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Functionalization of graphitic carbon nitride systems by cobalt and cobalt-iron oxides boosts solar water oxidation performances”. Benedet M, Andrea Rizzi G, Gasparotto A, Gauquelin N, Orekhov A, Verbeeck J, Maccato C, Barreca D, Applied surface science 618, 156652 (2023). http://doi.org/10.1016/j.apsusc.2023.156652
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CFD modelling of small particle dispersion: the influence of the turbulence kinetic energy in the atmospheric boundary layer”. Gorlé, C, van Beeck J, Rambaud P, Van Tendeloo G, Atmospheric environment : an international journal 43, 673 (2009). http://doi.org/10.1016/j.atmosenv.2008.09.060
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Stack gas dispersion measurements with large scale-PIV, aspiration probes and light scattering techniques and comparison with CFD”. Nakiboglu G, Gorlé, C, Horvath I, van Beeck J, Blocken B, Atmospheric environment : an international journal 43, 3396 (2009). http://doi.org/10.1016/j.atmosenv.2009.03.047
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Quantifying inflow uncertainties in RANS simulations of urban pollutant dispersion”. García Sánchez C, Van Tendeloo G, Gorle C, Atmospheric environment : an international journal 161, 263 (2017). http://doi.org/10.1016/J.ATMOSENV.2017.04.019
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Heterometal nanoparticles from Ru-based molecular clusters covalently anchored onto functionalized carbon nanotubes and nanofibers”. Vidick D, Ke X, Devillers M, Poleunis C, Delcorte A, Moggi P, Van Tendeloo G, Hermans S, Beilstein journal of nanotechnology 6, 1287 (2015). http://doi.org/10.3762/bjnano.6.133
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Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM”. Ke X, Bittencourt C, Bals S, Van Tendeloo G, Beilstein journal of nanotechnology 4, 77 (2013). http://doi.org/10.3762/bjnano.4.9
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Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials”. Ke X, Bittencourt C, Van Tendeloo G, Beilstein journal of nanotechnology 6, 1541 (2015). http://doi.org/10.3762/bjnano.6.158
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Surface processes during purification of InP quantum dots”. Mordvinova N, Emelin P, Vinokurov A, Dorofeev S, Abakumov A, Kuznetsova T, Beilstein journal of nanotechnology 5, 1220 (2014). http://doi.org/10.3762/bjnano.5.135
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Towards atomic resolution in sodium titanate nanotubes using near-edge X-ray-absorption fine-structure spectromicroscopy combined with multichannel multiple-scattering calculations”. Bittencourt C, Krüger P, Lagos MJ, Ke X, Van Tendeloo G, Ewels C, Umek P, Guttmann P, Beilstein journal of nanotechnology 3, 789 (2012). http://doi.org/10.3762/bjnano.3.88
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X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge”. Bittencourt C, Hitchock AP, Ke X, Van Tendeloo G, Ewels CP, Guttmann P, Beilstein journal of nanotechnology 3, 345 (2012). http://doi.org/10.3762/bjnano.3.39
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The influence of surface oxides on the distribution and release of nickel from Nitinol wires”. Shabalovskaya SA, Tian H, Anderegg JW, Schryvers DU, Carroll WU, van Humbeeck J, Biomaterials 30, 468 (2009). http://doi.org/10.1016/j.biomaterials.2008.10.014
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Engineering hepatitis B virus core particles for targeting HER2 receptors in vitro and in vivo”. Suffian IFBM, Wang JT-W, Hodgins NO, Klippstein R, Garcia-Maya M, Brown P, Nishimura Y, Heidari H, Bals S, Sosabowski JK, Ogino C, Kondo A, Al-Jamal KT, Biomaterials 120, 126 (2017). http://doi.org/10.1016/J.BIOMATERIALS.2016.12.012
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A comprehensive modelling approach for the neutral atmospheric boundary layer : consistent inflow conditions, wall function and turbulence model”. Parente A, Gorlé, C, van Beeck J, Benocci C, Boundary-layer meteorology 140, 411 (2011). http://doi.org/10.1007/s10546-011-9621-5
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