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  Author Title Year Publication (up) Volume Times cited Additional Links Links
Nistor, L.C.; van Landuyt, J.; Ralchenko, V.G.; Obratzova, E.D.; Korothushenko, K.G.; Smolin, A.A. Structural studies of nanocrystalline diamond thin films 1997 Materials science forum 239-241 UA library record; WoS full record;
Hens, S.; van Landuyt, J.; Bender, H.; Boullart, W.; Vanhaelemeersch, S. Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy 2001 Materials science in semiconductor processing 4 UA library record; WoS full record pdf doi
Stuer, C.; van Landuyt, J.; Bender, H.; Rooyackers, R.; Badenes, G. The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures 2001 Materials science in semiconductor processing 4 6 UA library record; WoS full record; WoS citing articles pdf doi
Schryvers, D.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S. Some examples of electron microscopy studies of microstructures and phase transitions in solids 1995 Meccanica 30 1 UA library record; WoS full record; WoS citing articles doi
Ignatova, V.A.; Lebedev, O.I.; Wätjen, U.; van Vaeck, L.; van Landuyt, J.; Gijbels, R.; Adams, F. Observation of Sb203 nanocrystals in SiO2 after Sb ion implantation 2002 Microchimica acta 139 3 UA library record; WoS full record; WoS citing articles doi
De Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers 1999 Microelectronic engineering 45 UA library record; WoS full record doi
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J. The study of partially ordered 11/20 alloys by HREM 1993 Microscopy research and technique 25 UA library record; WoS full record pdf doi
Goessens, C.; Schryvers, D.; van Landuyt, J. Transmission electron microscopy studies of (111) twinned silver halide microcrystals 1998 Microscopy research and technique 42 8 UA library record; WoS full record; WoS citing articles doi
Van Tendeloo, G.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; Amelinckx, S. Up close: Center for Electron Microscopy of Materials Science at the University of Antwerp 1994 MRS bulletin UA library record; WoS full record;
Frangis, N.; Nejim, A.; Hemment, P.L.F.; Stoemenos, J.; van Landuyt, J. Ion beam synthesis of β-SiC at 9500C and structural characterization 1996 Nuclear instruments and methods in physics research B112 UA library record
Fedina, L.; van Landuyt, J.; Vanhellemont, J.; Aseev, A.L. Observation of vacancy clustering in FZ-Si crystals during in situ electron irradiation in a high voltage electron microscope 1996 Nuclear instruments and methods in physics research B112 4 UA library record; WoS full record; WoS citing articles doi
Suvorov, A.V.; Lebedev, O.I.; Suvorova, A.A.; van Landuyt, J.; Usov, I.O. Defect characterization in high temperature implanted 6H-SiC using TEM 1997 Nuclear instruments and methods in physics research: B 127/128 17 UA library record; WoS full record; WoS citing articles doi
Frangis, N.; van Landuyt, J.; Grimaldi, M.G.; Calcagno, L. Electron microscopy and Rutherford backscattering spectrometry characterisation of 6H SiC samples implanted with He+ 1996 Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms T2 – Symposium 1 on New Trends in Ion Beam Processing of Materials, at the, E-MRS 96 Spring Meeting, June 04-07, 1996, Strasbourg, France 120 2 UA library record; WoS full record; WoS citing articles doi
Frangis, N.; Nejim, A.; Hemment, P.L.F.; Stoemenos, J.; van Landuyt, J. Ion beam synthesis of \beta-SiC at 950 degrees C and structural characterization 1996 Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms T2 – Symposium J on Correlated Effects in Atomic and Cluster Ion Bombardment and Implantation/Symposium C on Pushing the Limits of Ion Beam, Processing – Fr 112 9 UA library record; WoS full record; WoS citing articles doi
Zhang, Z.; Ma, L.N.; Liao, X.Z.; van Landuyt, J. A transmission electron-microscopy study of crystalline surface domains on al-co decagonal quasi-crystals and the \tau2-Al13CO4 approximant 1994 Philosophical magazine letters 70 4 UA library record; WoS full record; WoS citing articles doi
Bernaerts, D.; op de Beeck, M.; Amelinckx, S.; van Landuyt, J.; Van Tendeloo, G. The chirality of carbon nanotubules determined by dark-field electron microscopy 1996 Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 74 20 UA library record; WoS full record; WoS citing articles pdf doi
Bernaerts, D.; Zhang, X.B.; Zhang, X.F.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J.; Ivanov, V.; Nagy, J.B. Electron microscopy study of coiled carbon tubules 1995 Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 71 72 UA library record; WoS full record; WoS citing articles pdf doi
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. On the mechanism of {111}-defect formation in silicon studies by in situ electrin irradiation in a high resolution electron microscope 1998 Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 77 23 UA library record; WoS full record; WoS citing articles
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.; Mommaert, C.; Severne, G. Radiation defects and ordered radiation patterns in Ni and Ni4Mo: a study by electron microscopy 1993 Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 67 1 UA library record; https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:A1993; WoS full record; WoS citing articles pdf doi
Zhang, Z.; Geng, W.; van Landuyt, J.; Van Tendeloo, G. A transmission electron microscopy study of tweed-like structures in Al62Cu17.5CO17.5Si3 decagonal quasicrystals 1995 Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 71 7 UA library record; WoS full record; WoS citing articles
Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. Electron-diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals 1994 Physica status solidi: A 143 7 UA library record; WoS full record; WoS citing articles pdf doi
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. Extended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ electron irradiation in an HREM 1999 Physica status solidi: A: applied research T2 – International Conference on Extended Defects in Semiconductors (EDS 98), Sept. 06-11, 1998, Jaszowiec, Poland 171 40 UA library record; WoS full record; WoS citing articles doi
Volkov, V.V.; Luyten, W.; van Landuyt, J.; Férauge, C.; Oksenoid, K.G.; Gijbels, R.; Vasilev, M.G.; Shelyakin, A.A.; Lazarev, V.B. Electron microscopy and mass-spectrometry study of In GaAsP/InP heterostructures (p-i-n diodes) grown by liquid phase epitaxy 1993 Physica status solidi: A: applied research 140 7 UA library record; WoS full record; WoS citing articles pdf doi
Luyten, W.; Volkov, V.V.; van Landuyt, J.; Amelinckx, S.; Férauge, C.; Gijbels, R.; Vasilev, M.G.; Shelyakin, A.A.; Lazarev, V.B. Electron microscopy and mass-spectrometry study of In0.72Ga0.28As0.62P0.38 lasers grown by liquid phase epitaxy 1993 Physica status solidi: A: applied research 140 3 UA library record; WoS full record; WoS citing articles doi
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. Extended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ irradiation in an HREM 1999 Physica status solidi: A: applied research 171 40 UA library record; WoS full record; WoS citing articles
Vanhellemont, J.; Claeys, C.; van Landuyt, J. In-situ HVEM study of dislocation generation in patterned stress fields at silicon surfaces 1995 Physica status solidi: A: applied research 150 6 UA library record; WoS full record; WoS citing articles pdf doi
Chen, J.H.; van Dyck, D.; op de Beeck, M.; Broeckx, J.; van Landuyt, J. Modification of the multislice method for calculating coherent STEM images 1995 Physica status solidi: A: applied research 150 5 UA library record; WoS full record; WoS citing articles pdf doi
Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G. New erbium silicide superstructures: a study by high resolution electron microscopy 1996 Physica status solidi: A: applied research 158 6 UA library record; WoS full record; WoS citing articles
Nistor, L.; van Landuyt, J.; Ralchenko, V. Structural aspects of CVD idamond wafers grown at different hydrogen flow rates 1999 Physica status solidi: A: applied research 171 15 UA library record; WoS full record; WoS citing articles doi
Takeda, M.; Suzuki, N.; Shinohara, G.; Endo, T.; van Landuyt, J. TEM study on precipitation behavior in Cu-Co alloys 1998 Physica status solidi: A: applied research 168 18 UA library record; WoS full record; WoS citing articles doi
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