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The reduction of benzylbromide at Ag-Ni deposits prepared by galvanic replacement”. Vanrenterghem B, Papaderakis A, Sotiropoulos S, Tsiplakides D, Balomenou S, Bals S, Breugelmans T, Electrochimica acta 196, 756 (2016). http://doi.org/10.1016/j.electacta.2016.02.135
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Vanrompay H (2020) Toward fast and dose efficient electron tomography. 207 p
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Experimental Evaluation of Undersampling Schemes for Electron Tomography of Nanoparticles”. Vanrompay H, Béché, A, Verbeeck J, Bals S, Particle and particle systems characterization 36, 1900096 (2019). http://doi.org/10.1002/ppsc.201900096
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3D characterization of heat-induced morphological changes of Au nanostars by fast in situ electron tomography”. Vanrompay H, Bladt E, Albrecht W, Béché, A, Zakhozheva M, Sánchez-Iglesias A, Liz-Marzán LM, Bals S, Nanoscale 10, 22792 (2018). http://doi.org/10.1039/C8NR08376B
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Real‐Time Reconstruction of Arbitrary Slices for Quantitative and In Situ 3D Characterization of Nanoparticles”. Vanrompay H, Buurlage J‐W, Pelt DM, Kumar V, Zhuo X, Liz‐Marzán LM, Bals S, Batenburg KJ, Particle &, Particle Systems Characterization 37, 2000073 (2020). http://doi.org/10.1002/ppsc.202000073
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Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges”. Vanrompay H, Skorikov A, Bladt E, Béché, A, Freitag B, Verbeeck J, Bals S, Ultramicroscopy 221, 113191 (2021). http://doi.org/10.1016/j.ultramic.2020.113191
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Comparative study of structural properties and photoluminescence in InGaN layers with a high In content”. Vantomme A, Wu MF, Hogg S, van Landuyt J, et al, Internet journal of nitride semiconductor research T2 –, Symposium on GaN and Related Alloys Held at the MRS Fall Meeting, NOV 29-DEC 03, 1999, BOSTON, MASSACHUSETTS 5, art. no.-W11.38 (2000)
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Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM”. Varambhia AM, Jones L, De Backer A, Fauske VT, Van Aert S, Ozkaya D, Nellist PD, Particle and particle systems characterization 33, 438 (2016). http://doi.org/10.1002/ppsc.201600067
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Structure of artificial grain boundaries in sapphire bicrystals with intermediate layers”. Vasiliev AL, Stepantsov EA, Ivanov ZG, Olsson E, Verbist K, Van Tendeloo G, Interface science 5, 223 (1997)
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The microstructure and interfaces of intermediate layers in sapphire bicrystals”. Vasiliev AL, Stepantsov EA, Ivanov ZG, Verbist K, Van Tendeloo G, Olsson E, Applied surface science 119, 215 (1997)
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Structural aspect of YBa2Cu3O7-x films on Sis with complex barrier layers”. Vasiliev AL, Van Tendeloo G, Amelinckx S, Boikov Y, Olsson E, Ivanov Z, Physica: C : superconductivity 244, 373 (1995). http://doi.org/10.1016/0921-4534(95)00080-1
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Microstructure of YBa2Cu3O7-x films on buffered Si for microelectronic applications”. Vasiliev AL, Van Tendeloo G, Boikov Y, Olsson E, Ivanov S, Superconductor science and technology 10, 356 (1997)
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Structural aspects of the combination of Si and YBa2Cu3O7-x”. Vasiliev AL, Van Tendeloo G, Boikov Y, Olsson E, Ivanov Z, Claeson T, Kiselev NA, Institute of physics conference series 146, 333 (1995)
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Photoconductivity of nanocrystalline SnO2 sensitized with colloidal CdSe quantum dots”. Vasiliev RB, Babynina AV, Maslova OA, Rumyantseva MN, Ryabova LI, Dobrovolsky AA, Drozdov KA, Khokhlov DR, Abakumov AM, Gaskov AM, Journal of materials chemistry C : materials for optical and electronic devices 1, 1005 (2013). http://doi.org/10.1039/c2tc00236a
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Microstructural aspects of the degradation behavior of SnO2-based anodes for aluminum electrolysis”. Vassiliev SY, Laurinavichute VK, Abakumov AM, Govorov VA, Bendovskii EB, Turner S, Filatov AY, Tarasovskii VP, Borzenko AG, Alekseeva AM, Antipov EV, Journal of the electrochemical society 157, C178 (2010). http://doi.org/10.1149/1.3327903
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Multiwalled carbon nanotubes functionalized with 7-octenyltrichlorosilane and n-octyltrichlorosilane: dispersion in Sylgard®184 silicone and Youngs modulus”. Vast L, Carpentier L, Lallemand F, Colomer J-F, Van Tendeloo G, Fonseca A, Nagy JB, Mekhalif Z, Delhalle J, Journal of materials science 44, 3476 (2009). http://doi.org/10.1007/s10853-009-3464-1
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Bandgap measurement of high refractive index materials by off-axis EELS”. Vatanparast M, Egoavil R, Reenaas TW, Verbeeck J, Holmestad R, Vullum PE, Ultramicroscopy 182, 92 (2017). http://doi.org/10.1016/J.ULTRAMIC.2017.06.019
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0 and &pi, phase Josephson coupling through an insulating barrier with magnetic impurities”. Vávra O, Gaži S, Golubović, DS, Vávra I, Dérer J, Verbeeck J, Van Tendeloo G, Moshchalkov VV, Physical review : B : condensed matter and materials physics 74, 020502 (2006). http://doi.org/10.1103/PhysRevB.74.020502
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Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (TEM)?”.Vega Ibañez F, Béché, A, Verbeeck J, Microscopy and microanalysis , Pii S1431927622012260 (2022). http://doi.org/10.1017/S1431927622012260
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Electrochemical stability of rhodium-platinum core-shell nanoparticles : an identical location scanning transmission electron microscopy study”. Vega-Paredes M, Aymerich-Armengol R, Arenas Esteban D, Marti-Sanchez S, Bals S, Scheu C, Manjon AG, ACS nano 17, 16943 (2023). http://doi.org/10.1021/ACSNANO.3C04039
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Synthesis and charactreization of the new Ln(2)FeMoO(7) (Ln = Y, Dy, Ho) compounds”. Veith GM, Lobanov MV, Emge TJ, Greenblatt M, Croft M, Stowasser F, Hadermann J, Van Tendeloo G, Journal of materials chemistry 14, 1623 (2004). http://doi.org/10.1039/b315028c
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Velazco Torrejó,n A (2021) Alternative scan strategies for high resolution STEM imaging. 131 p
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Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings”. Velazco A, Béché, A, Jannis D, Verbeeck J, Ultramicroscopy 232, 113398 (2022). http://doi.org/10.1016/j.ultramic.2021.113398
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Evaluation of different rectangular scan strategies for STEM imaging”. Velazco A, Nord M, Béché, A, Verbeeck J, Ultramicroscopy , 113021 (2020). http://doi.org/10.1016/j.ultramic.2020.113021
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Self-assembly of gas-phase synthesized magnesium nanoparticles on room temperature substrates”. Venturi F, Calizzi M, Bals S, Perkisas T, Pasquini L, Materials research express 2, 015007 (2015). http://doi.org/10.1088/2053-1591/2/1/015007
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Interpretation of “Energy-filtered electron-diffracted beam holography&rdquo, by R.A. Herring”. Verbeeck J, Ultramicroscopy 106, 461 (2006). http://doi.org/10.1016/j.ultramic.2005.12.004
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Electronic reconstruction at n-type SrTiO3/LaAlO3 interfaces”. Verbeeck J, Bals S, Lamoen D, Luysberg M, Huijben M, Rijnders G, Brinkman A, Hilgenkamp H, Blank DHA, Van Tendeloo G, Physical review : B : condensed matter and materials physics 81, 085113 (2010). http://doi.org/10.1103/PhysRevB.81.085113
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Demonstration of a 2 × 2 programmable phase plate for electrons”. Verbeeck J, Béché, A, Müller-Caspary K, Guzzinati G, Luong MA, Den Hertog M, Ultramicroscopy 190, 58 (2018). http://doi.org/10.1016/j.ultramic.2018.03.017
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A holographic method to measure the source size broadening in STEM”. Verbeeck J, Béché, A, van den Broek W, Ultramicroscopy 120, 35 (2012). http://doi.org/10.1016/j.ultramic.2012.05.007
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Deconvolution of core electron energy loss spectra”. Verbeeck J, Bertoni G, Ultramicroscopy 109, 1343 (2009). http://doi.org/10.1016/j.ultramic.2009.06.010
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